JPS6110214Y2 - - Google Patents

Description

[Detailed Description of the Invention] This invention relates to an improvement of a functional testing device for electronic circuits such as semiconductor integrated circuits.

FIG. 1 is a block diagram showing an example of a conventional functional testing apparatus for electronic circuits and an electronic circuit to be measured. In FIG. 1, 1 is an input pattern generation circuit, 2 is a timing generation circuit, 3 is an electronic circuit under test, 4 is a standard pattern generation circuit, and 5 is an output semi-constant circuit. FIG. 2 is a pattern diagram showing the input pattern of the electronic circuit under test. In FIG. 2, a and b are the input pattern and output pattern of the electronic circuit under test 3, respectively.

In order to perform a functional test of an electronic circuit using the apparatus shown in FIG.
By applying this, output pattern b is generated from the electronic circuit under test 3. This output pattern b
and the standard pattern produced by the standard pattern generation circuit 4 are applied to the output judgment circuit 5 at the same timing by the timing generation circuit 2 for comparison and judgment. If the patterns match, the electronic circuit under test 3 is good, and the patterns do not match. If so, the electronic circuit under test 3 is determined to be a defective product.

However, as mentioned above, conventional devices are generally controlled by a computer, and the standard pattern of the standard pattern generation circuit 4 must be input into the computer, which requires a lot of time and effort. It was hot. Furthermore, the computer and standard pattern generating circuit 4 require a large capacity buffer memory, and the circuit configuration becomes complicated, making the device expensive.

In view of the above points, this invention was devised to solve these problems and eliminate such drawbacks.The purpose of this invention is to make the device stable and to have a high level of operation through a simple configuration. It is an object of the present invention to provide a functional testing device for electronic circuits that can easily perform functional testing of electronic circuits in a short time without requiring any technology.

In order to achieve this purpose, this idea
an input pattern generation circuit that supplies an input pattern to the electronic circuit under test; a counter that counts the number of pulses of an output pattern according to the input pattern of the electronic circuit under test; and an output pattern of the reference electronic circuit in response to the input pattern. The standard count number setting circuit in which the standard count number setting circuit is set, and the count number of the electronic circuit under test obtained by the above counter is compared with the standard count number from the standard count number setting circuit. A count determination circuit that determines the quality of the electronic circuit;
and a timing generation circuit for timing the count number output from the counter and the standard count number output from the standard count number setting circuit and supplying the timing to the count number determination circuit. It is.

This invention will be explained below based on examples.

FIG. 3 is a block diagram showing an embodiment of the electronic circuit functional testing apparatus according to this invention and the electronic circuit to be measured. In FIG. 3, the same reference numerals as in FIG. 1 represent the same components as shown in FIG. Reference numeral 6 indicates a standard count number setting circuit in which the standard count number of the output pattern of the reference electronic circuit is set for the input pattern supplied to the electronic circuit under test 3; A counter 8 counts the number of pulses of the output pattern obtained by comparing the count number of the electronic circuit under test 3 obtained by this counter 7 with the standard count number from the standard count number setting circuit 6, and calculates the number of pulses of the electronic circuit under test 3. There is a count number judgment circuit that judges whether the count is good or bad.

The timing generation circuit 2 is configured to supply the count number of the output of the counter 7 and the standard count number of the standard count number setting circuit 6 to the count number determination circuit 8 at the same timing.

Next, the operation of the embodiment shown in FIG. 3 will be explained with reference to FIG. 2.

In order to perform a functional test of an electronic circuit using the apparatus of the embodiment, a predetermined input pattern a (see FIG. 2) is sent from the input pattern generation circuit 1 to the electronic circuit under test 3 according to the timing generated by the timing generation circuit 2. By applying the voltage, an output pattern b (see FIG. 2) is generated from the electronic circuit under test 3. The counter 7 counts the number of pulses of this output pattern b. On the other hand, the number of pulses of the output pattern from a non-defective product is calculated in advance and set in the standard count number setting circuit 6. The count number from the counter 7 and the standard count number from the standard count number setting circuit 6 are applied to the count number determination circuit 8 at the same timing by the timing generation circuit 2 for comparison and judgment. If the count numbers match, then The electronic circuit 3 to be measured is determined to be a good product, and if the standard count numbers do not match, the electronic circuit 3 to be measured is determined to be a defective product.

As explained above, according to this invention, the number of pulse counts of the output pattern of the electronic circuit under test can be compared with the number of output counts from the standard count number setting circuit without using complicated means. With a simple configuration designed to determine defective products, a simple and inexpensive standard electronic circuit functional testing device can be realized, and the device can be operated in a short time without requiring advanced technology. The practical effect is extremely large because it is possible to easily perform functional tests on electronic circuits.

[Brief explanation of the drawing]

Figure 1 is a block diagram showing an example of a conventional functional testing device for electronic circuits and the electronic circuit under test. Figure 2 is a pattern diagram showing the input/output pattern of the electronic circuit under test. Figure 3 is an electronic circuit diagram based on this invention. 1 is a block diagram showing an embodiment of a circuit function testing device and an electronic circuit to be measured. FIG. In the figure, 1 is an input pattern generation circuit, 2 is a timing generation circuit, 3 is an electronic circuit under test, 6 is a standard count number setting circuit, 7 is a counter, and 8 is a count number determination circuit. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

[Scope of utility model registration request] an input pattern generation circuit that supplies an input pattern to the electronic circuit under test; a counter that counts the number of pulses of an output pattern according to the input pattern of the electronic circuit under test; and an output pattern of a reference electronic circuit with respect to the input pattern. A standard count number setting circuit in which a standard count number is set, and the count number of the electronic circuit under test obtained by the counter is compared with the standard count number from the standard count number setting circuit, A count number judgment circuit for judging the quality of an electronic circuit, and a count number output from the counter and a standard count number output from the standard count number setting circuit can be supplied to the count number judgment circuit at the same timing. 1. A functional testing device for an electronic circuit, comprising: a timing generation circuit that performs a timing generation circuit;