JPS6441809A - Smoothness measuring apparatus - Google Patents

Smoothness measuring apparatus

Info

Publication number
JPS6441809A
JPS6441809A JP19750887A JP19750887A JPS6441809A JP S6441809 A JPS6441809 A JP S6441809A JP 19750887 A JP19750887 A JP 19750887A JP 19750887 A JP19750887 A JP 19750887A JP S6441809 A JPS6441809 A JP S6441809A
Authority
JP
Japan
Prior art keywords
light
measured
reflected
light source
becomes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19750887A
Other languages
Japanese (ja)
Other versions
JPH0715377B2 (en
Inventor
Morihiro Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyota Central R&D Labs Inc
Original Assignee
Toyota Central R&D Labs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyota Central R&D Labs Inc filed Critical Toyota Central R&D Labs Inc
Priority to JP19750887A priority Critical patent/JPH0715377B2/en
Publication of JPS6441809A publication Critical patent/JPS6441809A/en
Publication of JPH0715377B2 publication Critical patent/JPH0715377B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To judge the smoothness of a surface to be measured, by accurately separating and measuring the sizes of two kinds of irregular patterns, which are located on the surface to be measured and have the different wavelengths. CONSTITUTION:A plane-wave light beam having a beam diameter 2e from a light supplying means 18 is condensed through a lens 16 and becomes a spherical wave beam. The light beam is inputted into a light path converting means 20 and split into two beams. The light is projected on a surface to be measured 12. The split reflected beam becomes a light source 10b and the beam is reflected with a mirror 24. The beam is further reflected by a beam splitter 26 and projected toward the surface to be measured 12. Meanwhile, the transmitted beam becomes a light source 10a and the beam is transmitted through the beam splitter 26. The beam is projected on the surface to be measured 12. The light beam from the light source 10a is used for measuring irregularities for a wavelength ds. The light beam from the light source 10b is used for measuring irregularities for a wavelength dl. The reflected light beams having the Fresnel diffraction patterns of said irregularities from the surface to be measured are detected with optoelectronic transducer means 28a and 28b. The results are inputted into an operating circuit 30. The sizes of the irregularity patterns having the two kinds of the waveforms, which are located on the surface to be measured 12, are separated and operated in the operating circuit.
JP19750887A 1987-08-07 1987-08-07 Smoothness measuring device Expired - Lifetime JPH0715377B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19750887A JPH0715377B2 (en) 1987-08-07 1987-08-07 Smoothness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19750887A JPH0715377B2 (en) 1987-08-07 1987-08-07 Smoothness measuring device

Publications (2)

Publication Number Publication Date
JPS6441809A true JPS6441809A (en) 1989-02-14
JPH0715377B2 JPH0715377B2 (en) 1995-02-22

Family

ID=16375639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19750887A Expired - Lifetime JPH0715377B2 (en) 1987-08-07 1987-08-07 Smoothness measuring device

Country Status (1)

Country Link
JP (1) JPH0715377B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109781037A (en) * 2019-03-05 2019-05-21 华南农业大学 A kind of high-precision laser sensor and laser control system with distance measurement function
CN113175875A (en) * 2021-06-02 2021-07-27 厦门大学 Device and method for measuring abrasion of cutting edge of male die based on linear laser extrusion molding

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109781037A (en) * 2019-03-05 2019-05-21 华南农业大学 A kind of high-precision laser sensor and laser control system with distance measurement function
CN113175875A (en) * 2021-06-02 2021-07-27 厦门大学 Device and method for measuring abrasion of cutting edge of male die based on linear laser extrusion molding
CN113175875B (en) * 2021-06-02 2023-01-24 厦门大学 Device and method for measuring abrasion of cutting edge of male die based on linear laser extrusion molding

Also Published As

Publication number Publication date
JPH0715377B2 (en) 1995-02-22

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