JPS6439567A - Semiconductor integrated circuit measuring instrument - Google Patents
Semiconductor integrated circuit measuring instrumentInfo
- Publication number
- JPS6439567A JPS6439567A JP62197486A JP19748687A JPS6439567A JP S6439567 A JPS6439567 A JP S6439567A JP 62197486 A JP62197486 A JP 62197486A JP 19748687 A JP19748687 A JP 19748687A JP S6439567 A JPS6439567 A JP S6439567A
- Authority
- JP
- Japan
- Prior art keywords
- board
- connector
- head
- measured
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To test the analog part of an analog-digital hybrid LSI efficiently by altering a part of the path of a signal line from a test head to a board where the LSI to be measured is mounted. CONSTITUTION:This instrument consists of the test head 1 of a VLSI function tester, a load board 2 where a substrate connecting connector 6 is fitted, and the board 3 where the LSI 5 to be measured is mounted, and the head 1 and board 3 are connected by the signal line 4 on the board 2. Then the board 2 is formed by selecting a test pin which is seldom used in consideration of flexibility and wiring it to the connector 6. Further, signal lines branching from all signal lines connected from the head 1 to the board 3 are also wired to the connector 6. This board 2 is used to form an external circuit according to the function of an analog part to be measured and it is inserted into the connector 6 to measure various analog circuits.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62197486A JPH0795087B2 (en) | 1987-08-06 | 1987-08-06 | Semiconductor integrated circuit measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62197486A JPH0795087B2 (en) | 1987-08-06 | 1987-08-06 | Semiconductor integrated circuit measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6439567A true JPS6439567A (en) | 1989-02-09 |
JPH0795087B2 JPH0795087B2 (en) | 1995-10-11 |
Family
ID=16375271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62197486A Expired - Fee Related JPH0795087B2 (en) | 1987-08-06 | 1987-08-06 | Semiconductor integrated circuit measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0795087B2 (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58106768U (en) * | 1982-01-14 | 1983-07-20 | 日本電気株式会社 | Fixture |
-
1987
- 1987-08-06 JP JP62197486A patent/JPH0795087B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58106768U (en) * | 1982-01-14 | 1983-07-20 | 日本電気株式会社 | Fixture |
Also Published As
Publication number | Publication date |
---|---|
JPH0795087B2 (en) | 1995-10-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |