JPS6439567A - Semiconductor integrated circuit measuring instrument - Google Patents

Semiconductor integrated circuit measuring instrument

Info

Publication number
JPS6439567A
JPS6439567A JP62197486A JP19748687A JPS6439567A JP S6439567 A JPS6439567 A JP S6439567A JP 62197486 A JP62197486 A JP 62197486A JP 19748687 A JP19748687 A JP 19748687A JP S6439567 A JPS6439567 A JP S6439567A
Authority
JP
Japan
Prior art keywords
board
connector
head
measured
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62197486A
Other languages
Japanese (ja)
Other versions
JPH0795087B2 (en
Inventor
Toshio Isono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62197486A priority Critical patent/JPH0795087B2/en
Publication of JPS6439567A publication Critical patent/JPS6439567A/en
Publication of JPH0795087B2 publication Critical patent/JPH0795087B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To test the analog part of an analog-digital hybrid LSI efficiently by altering a part of the path of a signal line from a test head to a board where the LSI to be measured is mounted. CONSTITUTION:This instrument consists of the test head 1 of a VLSI function tester, a load board 2 where a substrate connecting connector 6 is fitted, and the board 3 where the LSI 5 to be measured is mounted, and the head 1 and board 3 are connected by the signal line 4 on the board 2. Then the board 2 is formed by selecting a test pin which is seldom used in consideration of flexibility and wiring it to the connector 6. Further, signal lines branching from all signal lines connected from the head 1 to the board 3 are also wired to the connector 6. This board 2 is used to form an external circuit according to the function of an analog part to be measured and it is inserted into the connector 6 to measure various analog circuits.
JP62197486A 1987-08-06 1987-08-06 Semiconductor integrated circuit measuring device Expired - Fee Related JPH0795087B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62197486A JPH0795087B2 (en) 1987-08-06 1987-08-06 Semiconductor integrated circuit measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62197486A JPH0795087B2 (en) 1987-08-06 1987-08-06 Semiconductor integrated circuit measuring device

Publications (2)

Publication Number Publication Date
JPS6439567A true JPS6439567A (en) 1989-02-09
JPH0795087B2 JPH0795087B2 (en) 1995-10-11

Family

ID=16375271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62197486A Expired - Fee Related JPH0795087B2 (en) 1987-08-06 1987-08-06 Semiconductor integrated circuit measuring device

Country Status (1)

Country Link
JP (1) JPH0795087B2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106768U (en) * 1982-01-14 1983-07-20 日本電気株式会社 Fixture

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106768U (en) * 1982-01-14 1983-07-20 日本電気株式会社 Fixture

Also Published As

Publication number Publication date
JPH0795087B2 (en) 1995-10-11

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees