JPS642890B2 - - Google Patents

Info

Publication number
JPS642890B2
JPS642890B2 JP17302282A JP17302282A JPS642890B2 JP S642890 B2 JPS642890 B2 JP S642890B2 JP 17302282 A JP17302282 A JP 17302282A JP 17302282 A JP17302282 A JP 17302282A JP S642890 B2 JPS642890 B2 JP S642890B2
Authority
JP
Japan
Prior art keywords
sample
analysis
spark
sparks
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17302282A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5961759A (ja
Inventor
Isao Fukui
Naoki Imamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP17302282A priority Critical patent/JPS5961759A/ja
Publication of JPS5961759A publication Critical patent/JPS5961759A/ja
Publication of JPS642890B2 publication Critical patent/JPS642890B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP17302282A 1982-09-30 1982-09-30 発光分光分析装置 Granted JPS5961759A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17302282A JPS5961759A (ja) 1982-09-30 1982-09-30 発光分光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17302282A JPS5961759A (ja) 1982-09-30 1982-09-30 発光分光分析装置

Publications (2)

Publication Number Publication Date
JPS5961759A JPS5961759A (ja) 1984-04-09
JPS642890B2 true JPS642890B2 (enrdf_load_stackoverflow) 1989-01-19

Family

ID=15952751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17302282A Granted JPS5961759A (ja) 1982-09-30 1982-09-30 発光分光分析装置

Country Status (1)

Country Link
JP (1) JPS5961759A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2722852B2 (ja) * 1991-04-08 1998-03-09 住友金属工業株式会社 発光分光分析方法及び発光分光分析装置
US7187444B2 (en) 2001-11-12 2007-03-06 Fuji Photo Film Co., Ltd. Measuring method and apparatus using attenuation in total internal reflection
KR101027278B1 (ko) * 2008-12-23 2011-04-06 주식회사 포스코 연속 스파크형 슬라브 단면 개재물의 맵 획득시스템 및 획득방법
KR101027260B1 (ko) * 2008-12-23 2011-04-06 주식회사 포스코 불연속 스파크형 슬라브 단면 개재물의 맵 획득시스템 및 획득방법

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5347034B2 (enrdf_load_stackoverflow) * 1973-09-07 1978-12-18

Also Published As

Publication number Publication date
JPS5961759A (ja) 1984-04-09

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