JPS6419717A - Vapor growth method for semiconductor layer containing arsenic - Google Patents

Vapor growth method for semiconductor layer containing arsenic

Info

Publication number
JPS6419717A
JPS6419717A JP17611987A JP17611987A JPS6419717A JP S6419717 A JPS6419717 A JP S6419717A JP 17611987 A JP17611987 A JP 17611987A JP 17611987 A JP17611987 A JP 17611987A JP S6419717 A JPS6419717 A JP S6419717A
Authority
JP
Japan
Prior art keywords
substrate
vapor growth
arsenic
temperature
fines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17611987A
Other languages
Japanese (ja)
Inventor
Kenji Kunihara
Kunio Matsubara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP17611987A priority Critical patent/JPS6419717A/en
Publication of JPS6419717A publication Critical patent/JPS6419717A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To decrease the defects of an epitaxial substrate resulting from the adhesion of the fines of arsenic by charging the substrate into a vapor growth furnace and holding the substrate for a fixed time at a temperature higher than a vapor growth temperature while the vapor growth furnace is supplied with a protective gas including an arsenic compound before vapor growth. CONSTITUTION:When a single-crystal substrate 1 consisting of gallium arsenide, etc., is charged into a vapor growth pipe 11, the fines 4 of arsenic adhering on the inwall of the vapor growth pipe 11 fall and adhere onto the substrate 1, and an opening flange 14 is closed by a cap 15 as they are. A gas in the vapor growth pipe 11 is replaced completely, and a supporter 2 is heated by a high-frequency coil 16 and the temperature of the substrate 1 is elevated at a specified rate. When the temperature of the substrate reaches approximately 300 deg.C, a protective gas in which arsine gas from a bomb 31 is mixed with a carrier gas is fed into the vapor growth pipe 11, and the sublimation of an arsenic section contained in the substrate 1 is prevented. The temperature of the substrate 1 is raised to 800 deg.C, and the fines of arsenic adhering on the substrate 1 are removed by sublimation.
JP17611987A 1987-07-15 1987-07-15 Vapor growth method for semiconductor layer containing arsenic Pending JPS6419717A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17611987A JPS6419717A (en) 1987-07-15 1987-07-15 Vapor growth method for semiconductor layer containing arsenic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17611987A JPS6419717A (en) 1987-07-15 1987-07-15 Vapor growth method for semiconductor layer containing arsenic

Publications (1)

Publication Number Publication Date
JPS6419717A true JPS6419717A (en) 1989-01-23

Family

ID=16008011

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17611987A Pending JPS6419717A (en) 1987-07-15 1987-07-15 Vapor growth method for semiconductor layer containing arsenic

Country Status (1)

Country Link
JP (1) JPS6419717A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007032180A1 (en) * 2005-09-12 2007-03-22 Shin-Etsu Handotai Co., Ltd. Process for producing epitaxial wafer and epitaxial wafer produced therefrom

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007032180A1 (en) * 2005-09-12 2007-03-22 Shin-Etsu Handotai Co., Ltd. Process for producing epitaxial wafer and epitaxial wafer produced therefrom
JP2007080958A (en) * 2005-09-12 2007-03-29 Shin Etsu Handotai Co Ltd Method of manufacturing epitaxial wafer and epitaxial wafer manufactured therewith

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