JPS6415641A - Apparatus for inspecting inside of tube - Google Patents

Apparatus for inspecting inside of tube

Info

Publication number
JPS6415641A
JPS6415641A JP17148587A JP17148587A JPS6415641A JP S6415641 A JPS6415641 A JP S6415641A JP 17148587 A JP17148587 A JP 17148587A JP 17148587 A JP17148587 A JP 17148587A JP S6415641 A JPS6415641 A JP S6415641A
Authority
JP
Japan
Prior art keywords
central position
histogram
computing circuit
computed
peak
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17148587A
Other languages
Japanese (ja)
Inventor
Shinichi Nagai
Yoshiaki Taniguchi
Kazuo Takashima
Keiichi Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SEKIYU SANGYO KATSUSEIKA CENTER
Mitsubishi Electric Corp
Tonen General Sekiyu KK
Japan Petroleum Energy Center JPEC
Original Assignee
SEKIYU SANGYO KATSUSEIKA CENTER
Petroleum Energy Center PEC
Mitsubishi Electric Corp
Toa Nenryo Kogyyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SEKIYU SANGYO KATSUSEIKA CENTER, Petroleum Energy Center PEC, Mitsubishi Electric Corp, Toa Nenryo Kogyyo KK filed Critical SEKIYU SANGYO KATSUSEIKA CENTER
Priority to JP17148587A priority Critical patent/JPS6415641A/en
Publication of JPS6415641A publication Critical patent/JPS6415641A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enhance working efficiency and measuring accuracy, by obtaining the candidate point for a central position out of the locus of an irregular circle, and recognizing the locus of the reflected optical image, which is obtained from a distance having the maximum value in the histogram of the candidate point. CONSTITUTION:A detecting head 1 projects light on the entire inner surface of a tube to be inspected P at the same time. The reflected light from the inner surface is projected on a two-dimensional light receiving part 27 through a lens 26. The output from the two-dimensional light receiving part 27 is scanned on a scanning line with a peak-position detecting circuit 30, and the peak of an image is detected. Then the possible point of a central position is computed in a central-position computing circuit 31, and the histogram is computed in a histogram computing circuit 32. A maximum-value-position computing circuit 33 computes the position to be the maximum value based on said histogram. This point is made to be the central position of an optical image in one direction. The scanning is performed on a scanning line in the difference direction by the similar way, and the central position is obtained. Thus the two-dimensional central position in the optical image is obtained. Then, the distance between the peak position and the central position is computed in a distance computing circuit 34, and the inner shape of the tube to be inspected P is evaluated.
JP17148587A 1987-07-09 1987-07-09 Apparatus for inspecting inside of tube Pending JPS6415641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17148587A JPS6415641A (en) 1987-07-09 1987-07-09 Apparatus for inspecting inside of tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17148587A JPS6415641A (en) 1987-07-09 1987-07-09 Apparatus for inspecting inside of tube

Publications (1)

Publication Number Publication Date
JPS6415641A true JPS6415641A (en) 1989-01-19

Family

ID=15923975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17148587A Pending JPS6415641A (en) 1987-07-09 1987-07-09 Apparatus for inspecting inside of tube

Country Status (1)

Country Link
JP (1) JPS6415641A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0436644A (en) * 1990-05-31 1992-02-06 Daihatsu Motor Co Ltd Inspecting method for defect in internal wall surface of cylinder
US7636204B1 (en) 2007-10-30 2009-12-22 LumenFlow Corp. 360 degree view imaging system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0436644A (en) * 1990-05-31 1992-02-06 Daihatsu Motor Co Ltd Inspecting method for defect in internal wall surface of cylinder
US7636204B1 (en) 2007-10-30 2009-12-22 LumenFlow Corp. 360 degree view imaging system

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