JPS6390175U - - Google Patents

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Publication number
JPS6390175U
JPS6390175U JP18602286U JP18602286U JPS6390175U JP S6390175 U JPS6390175 U JP S6390175U JP 18602286 U JP18602286 U JP 18602286U JP 18602286 U JP18602286 U JP 18602286U JP S6390175 U JPS6390175 U JP S6390175U
Authority
JP
Japan
Prior art keywords
electronic circuit
quality
difference
reference value
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18602286U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18602286U priority Critical patent/JPS6390175U/ja
Publication of JPS6390175U publication Critical patent/JPS6390175U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Description

補正 昭62.5.9 図面の簡単な説明を次のように補正する。Correction May 9, 1982 The brief description of the drawing has been amended as follows.

【図面の簡単な説明】 第1図はこの考案の一実施例を示すブロツク図
、第2図は電子回路の試験装置の従来例を示すブ
ロツク図である。 図において、10は被測定端子部、26はIC
モジユール部、27は信号差検出部、28は良否
判定部である。なお、図中、同一符号は同一また
は相当部分を示す。
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing an embodiment of this invention, and FIG. 2 is a block diagram showing a conventional example of an electronic circuit testing device. In the figure, 10 is the terminal to be measured, 26 is the IC
In the module section, 27 is a signal difference detection section, and 28 is a quality determination section. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 所定の基準値設定が可能な電子回路と、これか
らの基準値と試験される電子回路からの出力値と
の差を検出する差検出手段と、検出された差に基
づき試験される電子回路の良否を判定する良否判
定手段とを備えたことを特徴とする電子回路の試
験装置。
An electronic circuit capable of setting a predetermined reference value, a difference detection means for detecting a difference between a future reference value and an output value from the electronic circuit to be tested, and the quality of the electronic circuit to be tested based on the detected difference. 1. A test device for an electronic circuit, comprising: a quality determination means for determining quality.
JP18602286U 1986-12-01 1986-12-01 Pending JPS6390175U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18602286U JPS6390175U (en) 1986-12-01 1986-12-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18602286U JPS6390175U (en) 1986-12-01 1986-12-01

Publications (1)

Publication Number Publication Date
JPS6390175U true JPS6390175U (en) 1988-06-11

Family

ID=31135199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18602286U Pending JPS6390175U (en) 1986-12-01 1986-12-01

Country Status (1)

Country Link
JP (1) JPS6390175U (en)

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