JPS638432B2 - - Google Patents
Info
- Publication number
- JPS638432B2 JPS638432B2 JP53149377A JP14937778A JPS638432B2 JP S638432 B2 JPS638432 B2 JP S638432B2 JP 53149377 A JP53149377 A JP 53149377A JP 14937778 A JP14937778 A JP 14937778A JP S638432 B2 JPS638432 B2 JP S638432B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- patterns
- circuit pattern
- pattern
- short
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000009413 insulation Methods 0.000 claims description 34
- 238000012360 testing method Methods 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 19
- 239000000523 sample Substances 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 9
- 239000003086 colorant Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 230000007547 defect Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000002457 bidirectional effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14937778A JPS5575659A (en) | 1978-12-01 | 1978-12-01 | Insulation inspection method for circuit board and its unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14937778A JPS5575659A (en) | 1978-12-01 | 1978-12-01 | Insulation inspection method for circuit board and its unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5575659A JPS5575659A (en) | 1980-06-07 |
| JPS638432B2 true JPS638432B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-02-23 |
Family
ID=15473795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14937778A Granted JPS5575659A (en) | 1978-12-01 | 1978-12-01 | Insulation inspection method for circuit board and its unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5575659A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4678989B2 (ja) * | 2001-06-05 | 2011-04-27 | 日置電機株式会社 | 短絡検査対象設定方法、回路基板検査方法および回路基板検査装置 |
| JP4810058B2 (ja) * | 2003-09-24 | 2011-11-09 | トヨタ自動車株式会社 | 多極端子のショート検出方法及びショート検出システム |
-
1978
- 1978-12-01 JP JP14937778A patent/JPS5575659A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5575659A (en) | 1980-06-07 |