JPS63753A - Test system for memory error checking and correcting circuit - Google Patents
Test system for memory error checking and correcting circuitInfo
- Publication number
- JPS63753A JPS63753A JP61144321A JP14432186A JPS63753A JP S63753 A JPS63753 A JP S63753A JP 61144321 A JP61144321 A JP 61144321A JP 14432186 A JP14432186 A JP 14432186A JP S63753 A JPS63753 A JP S63753A
- Authority
- JP
- Japan
- Prior art keywords
- data
- memory
- check bit
- circuit
- ecc circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000000875 corresponding Effects 0.000 abstract 1
- 230000002401 inhibitory effect Effects 0.000 abstract 1
Abstract
PURPOSE: To conduct a test for normality of a memory error checking/correcting ECC circuit by inhibiting the writing of a check bit received from the ECC circuit to write data to a memory when a register is set for test of the normality of the ECC circuit and writing data in a memory and then reading out said data and comparing the check bit corresponding to other data stored in the memory to compare them with each other.
CONSTITUTION: Write data is added to an ECC circuit 102 to produce a check bit of this data and then the write data and the check bit are written in a memory 101. Then a register 103 is set under a test mode and data different from that written previously is given to the circuit 102. Thus the data of the memory 101 is rewritten by said data and this rewritten data is read out of the memory 101. At the same time, the previous check bit is read out of the memory 101. Then these read out data and check bit are compared with each other. If abnormality is detected said comparison, the normality of the circuit 102 is decided.
COPYRIGHT: (C)1988,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61144321A JPS63753A (en) | 1986-06-20 | 1986-06-20 | Test system for memory error checking and correcting circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61144321A JPS63753A (en) | 1986-06-20 | 1986-06-20 | Test system for memory error checking and correcting circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63753A true JPS63753A (en) | 1988-01-05 |
Family
ID=15359375
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61144321A Pending JPS63753A (en) | 1986-06-20 | 1986-06-20 | Test system for memory error checking and correcting circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63753A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011227646A (en) * | 2010-04-19 | 2011-11-10 | Mitsubishi Electric Corp | Computer diagnosis device and diagnosis method |
| CN106528359A (en) * | 2016-11-29 | 2017-03-22 | 北京时代民芯科技有限公司 | Observability method for external memory check bits |
-
1986
- 1986-06-20 JP JP61144321A patent/JPS63753A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011227646A (en) * | 2010-04-19 | 2011-11-10 | Mitsubishi Electric Corp | Computer diagnosis device and diagnosis method |
| CN106528359A (en) * | 2016-11-29 | 2017-03-22 | 北京时代民芯科技有限公司 | Observability method for external memory check bits |
| CN106528359B (en) * | 2016-11-29 | 2019-07-23 | 北京时代民芯科技有限公司 | A kind of observability method of external memory check bit |
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