JPS6371534U - - Google Patents

Info

Publication number
JPS6371534U
JPS6371534U JP16508186U JP16508186U JPS6371534U JP S6371534 U JPS6371534 U JP S6371534U JP 16508186 U JP16508186 U JP 16508186U JP 16508186 U JP16508186 U JP 16508186U JP S6371534 U JPS6371534 U JP S6371534U
Authority
JP
Japan
Prior art keywords
lead frame
inspection
shape
inspection device
inspection line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16508186U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0334908Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986165081U priority Critical patent/JPH0334908Y2/ja
Priority to US07/082,097 priority patent/US4851902A/en
Priority to GB8722303A priority patent/GB2197948B/en
Publication of JPS6371534U publication Critical patent/JPS6371534U/ja
Application granted granted Critical
Publication of JPH0334908Y2 publication Critical patent/JPH0334908Y2/ja
Priority to SG313/93A priority patent/SG31393G/en
Expired legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP1986165081U 1986-10-29 1986-10-29 Expired JPH0334908Y2 (enrdf_load_stackoverflow)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (enrdf_load_stackoverflow) 1986-10-29 1986-10-29
US07/082,097 US4851902A (en) 1986-10-29 1987-08-05 Auatomatic inspection system for IC lead frames and visual inspection method thereof
GB8722303A GB2197948B (en) 1986-10-29 1987-09-22 Automatic inspection system for and electro-optic methods of inspection of ic lead frames
SG313/93A SG31393G (en) 1986-10-29 1993-03-22 Automatic inspection system for an electro-optic methods of inspection of ic lead frames

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (enrdf_load_stackoverflow) 1986-10-29 1986-10-29

Publications (2)

Publication Number Publication Date
JPS6371534U true JPS6371534U (enrdf_load_stackoverflow) 1988-05-13
JPH0334908Y2 JPH0334908Y2 (enrdf_load_stackoverflow) 1991-07-24

Family

ID=31094793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986165081U Expired JPH0334908Y2 (enrdf_load_stackoverflow) 1986-10-29 1986-10-29

Country Status (1)

Country Link
JP (1) JPH0334908Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367108A (ja) * 1989-08-07 1991-03-22 Fujitsu Ltd 半導体装置の製造方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (enrdf_load_stackoverflow) * 1974-09-06 1976-03-19 Susumu Ito
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS562276U (enrdf_load_stackoverflow) * 1979-06-19 1981-01-10
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (enrdf_load_stackoverflow) * 1974-09-06 1976-03-19 Susumu Ito
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS562276U (enrdf_load_stackoverflow) * 1979-06-19 1981-01-10
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367108A (ja) * 1989-08-07 1991-03-22 Fujitsu Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
JPH0334908Y2 (enrdf_load_stackoverflow) 1991-07-24

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