JPS6371534U - - Google Patents

Info

Publication number
JPS6371534U
JPS6371534U JP16508186U JP16508186U JPS6371534U JP S6371534 U JPS6371534 U JP S6371534U JP 16508186 U JP16508186 U JP 16508186U JP 16508186 U JP16508186 U JP 16508186U JP S6371534 U JPS6371534 U JP S6371534U
Authority
JP
Japan
Prior art keywords
lead frame
inspection
shape
inspection device
inspection line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16508186U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0334908Y2 (cg-RX-API-DMAC10.html
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986165081U priority Critical patent/JPH0334908Y2/ja
Priority to US07/082,097 priority patent/US4851902A/en
Priority to GB8722303A priority patent/GB2197948B/en
Publication of JPS6371534U publication Critical patent/JPS6371534U/ja
Application granted granted Critical
Publication of JPH0334908Y2 publication Critical patent/JPH0334908Y2/ja
Priority to SG313/93A priority patent/SG31393G/en
Expired legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP1986165081U 1986-10-29 1986-10-29 Expired JPH0334908Y2 (cg-RX-API-DMAC10.html)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (cg-RX-API-DMAC10.html) 1986-10-29 1986-10-29
US07/082,097 US4851902A (en) 1986-10-29 1987-08-05 Auatomatic inspection system for IC lead frames and visual inspection method thereof
GB8722303A GB2197948B (en) 1986-10-29 1987-09-22 Automatic inspection system for and electro-optic methods of inspection of ic lead frames
SG313/93A SG31393G (en) 1986-10-29 1993-03-22 Automatic inspection system for an electro-optic methods of inspection of ic lead frames

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (cg-RX-API-DMAC10.html) 1986-10-29 1986-10-29

Publications (2)

Publication Number Publication Date
JPS6371534U true JPS6371534U (cg-RX-API-DMAC10.html) 1988-05-13
JPH0334908Y2 JPH0334908Y2 (cg-RX-API-DMAC10.html) 1991-07-24

Family

ID=31094793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986165081U Expired JPH0334908Y2 (cg-RX-API-DMAC10.html) 1986-10-29 1986-10-29

Country Status (1)

Country Link
JP (1) JPH0334908Y2 (cg-RX-API-DMAC10.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367108A (ja) * 1989-08-07 1991-03-22 Fujitsu Ltd 半導体装置の製造方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (cg-RX-API-DMAC10.html) * 1974-09-06 1976-03-19 Susumu Ito
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS562276U (cg-RX-API-DMAC10.html) * 1979-06-19 1981-01-10
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (cg-RX-API-DMAC10.html) * 1974-09-06 1976-03-19 Susumu Ito
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS562276U (cg-RX-API-DMAC10.html) * 1979-06-19 1981-01-10
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0367108A (ja) * 1989-08-07 1991-03-22 Fujitsu Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
JPH0334908Y2 (cg-RX-API-DMAC10.html) 1991-07-24

Similar Documents

Publication Publication Date Title
FR2619926B1 (fr) Procede et appareil de diagnostic de defauts sur une carte de circuit
KR900013316A (ko) 기판 검사 장치 및 방법
BE846884A (fr) Perfectionnements aux connecteurs electriques sertissables et procede de fabrication de connecteurs perfectionnes,
DE3166405D1 (en) Method and apparatus for forming electrical contact with an analysis slide
JPS6371534U (cg-RX-API-DMAC10.html)
JPH1196981A (ja) 電池の外観検査法および検査装置
JPS63193539A (ja) Ｉｃリ−ドフレ−ムの外観検査方法
JPS5386294A (en) Inspecting method and apparatus for defect in insulation vessels
JPS6363705U (cg-RX-API-DMAC10.html)
FR2553914B1 (fr) Procede d'inspection de bornes connectees par sertissage
FR2542467B1 (fr) Procede de diagnostic des defauts d'appareils electriques
JPS6242531Y2 (cg-RX-API-DMAC10.html)
JPS6122279Y2 (cg-RX-API-DMAC10.html)
CN119901755A (zh) 极耳检测系统和方法
JPH0333064Y2 (cg-RX-API-DMAC10.html)
JPS543590A (en) Photoelectric inspecting apparatus
JPH01307650A (ja) はんだ付け検査方法およびその装置
JPH07326367A (ja) 積層型スパイラル構造の巻きずれ良否判別方法および良否判別装置
JPH03152408A (ja) Ｉｃパッケージのリード検査装置
JPH08130002A (ja) 電池端子の位置ずれ検査法および検査装置
JPS63159757U (cg-RX-API-DMAC10.html)
JPS62141279U (cg-RX-API-DMAC10.html)
JPS6086430A (ja) 電線の端末処理状態検査装置
JPH0534105Y2 (cg-RX-API-DMAC10.html)
JPS6138472A (ja) プリント基板検査装置