JPS6365882B2 - - Google Patents

Info

Publication number
JPS6365882B2
JPS6365882B2 JP57162408A JP16240882A JPS6365882B2 JP S6365882 B2 JPS6365882 B2 JP S6365882B2 JP 57162408 A JP57162408 A JP 57162408A JP 16240882 A JP16240882 A JP 16240882A JP S6365882 B2 JPS6365882 B2 JP S6365882B2
Authority
JP
Japan
Prior art keywords
beams
prism
axicon
phase
wavefront
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57162408A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5890110A (ja
Inventor
Hoisuraa Geruharuto
Ieeritsushu Uaruteru
Makoshu Gyuntaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS5890110A publication Critical patent/JPS5890110A/ja
Publication of JPS6365882B2 publication Critical patent/JPS6365882B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP57162408A 1981-11-25 1982-09-20 干渉装置 Granted JPS5890110A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP81109873A EP0079981B1 (de) 1981-11-25 1981-11-25 Phasen-Symmetrisierung optischer Wellenflächen
EP81109873.0 1981-11-25

Publications (2)

Publication Number Publication Date
JPS5890110A JPS5890110A (ja) 1983-05-28
JPS6365882B2 true JPS6365882B2 (US07576130-20090818-C00114.png) 1988-12-19

Family

ID=8188030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57162408A Granted JPS5890110A (ja) 1981-11-25 1982-09-20 干渉装置

Country Status (4)

Country Link
US (1) US4541720A (US07576130-20090818-C00114.png)
EP (1) EP0079981B1 (US07576130-20090818-C00114.png)
JP (1) JPS5890110A (US07576130-20090818-C00114.png)
DE (1) DE3174649D1 (US07576130-20090818-C00114.png)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2712691B1 (fr) * 1993-11-19 1995-12-22 Bernard Fondeur Dispositif de mesure par interférométrie laser.
US5604592A (en) * 1994-09-19 1997-02-18 Textron Defense Systems, Division Of Avco Corporation Laser ultrasonics-based material analysis system and method using matched filter processing
US5923426A (en) * 1997-07-24 1999-07-13 Mirage Development, Ltd. Bi-lateral shearing interferometer
KR100397166B1 (ko) * 2001-06-18 2003-09-13 손광현 재귀반사체
US9223227B2 (en) 2011-02-11 2015-12-29 Asml Netherlands B.V. Inspection apparatus and method, lithographic apparatus, lithographic processing cell and device manufacturing method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2627609A1 (de) * 1976-06-19 1977-12-29 Ibm Deutschland Interferometrisches verfahren
DE2636498C2 (de) * 1976-08-13 1979-02-01 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren zur interferometrischen Oberflächenmessiing
DE3020022A1 (de) * 1980-05-24 1981-12-03 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und einrichtung zur pruefung optischer abbildungssysteme

Also Published As

Publication number Publication date
JPS5890110A (ja) 1983-05-28
EP0079981A1 (de) 1983-06-01
DE3174649D1 (en) 1986-06-19
US4541720A (en) 1985-09-17
EP0079981B1 (de) 1986-05-14

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