JPS6339897B2 - - Google Patents
Info
- Publication number
- JPS6339897B2 JPS6339897B2 JP54033207A JP3320779A JPS6339897B2 JP S6339897 B2 JPS6339897 B2 JP S6339897B2 JP 54033207 A JP54033207 A JP 54033207A JP 3320779 A JP3320779 A JP 3320779A JP S6339897 B2 JPS6339897 B2 JP S6339897B2
- Authority
- JP
- Japan
- Prior art keywords
- mask
- positioning
- stopper
- pattern
- operating position
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3320779A JPS55126251A (en) | 1979-03-23 | 1979-03-23 | Mask positioning mechanism in transfer unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3320779A JPS55126251A (en) | 1979-03-23 | 1979-03-23 | Mask positioning mechanism in transfer unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55126251A JPS55126251A (en) | 1980-09-29 |
| JPS6339897B2 true JPS6339897B2 (enrdf_load_stackoverflow) | 1988-08-08 |
Family
ID=12380009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3320779A Granted JPS55126251A (en) | 1979-03-23 | 1979-03-23 | Mask positioning mechanism in transfer unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55126251A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59121048A (ja) * | 1982-12-27 | 1984-07-12 | Ibiden Co Ltd | プリント配線基板の製造装置 |
-
1979
- 1979-03-23 JP JP3320779A patent/JPS55126251A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55126251A (en) | 1980-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0267721A3 (en) | Determination of best focus for step and repeat projection aligners | |
| JP2860578B2 (ja) | 露光装置 | |
| JPS5851514A (ja) | ウエハ露光方法及びその装置 | |
| US4623257A (en) | Alignment marks for fine-line device fabrication | |
| JPS6339897B2 (enrdf_load_stackoverflow) | ||
| JPH03108310A (ja) | 露光装置 | |
| US3602591A (en) | Step and repeat camera | |
| JPS6156868B2 (enrdf_load_stackoverflow) | ||
| US4530604A (en) | Method of aligning a mask and a wafer for manufacturing semiconductor circuit elements | |
| JP2656204B2 (ja) | マスク交換装置 | |
| JP2647835B2 (ja) | ウェハーの露光方法 | |
| JPS63275115A (ja) | 半導体装置のパタ−ン形成方法 | |
| JP2617613B2 (ja) | 縮小投影露光装置用レチクル | |
| JPH05216209A (ja) | フォトマスク | |
| JPH0322904Y2 (enrdf_load_stackoverflow) | ||
| JPH1115138A (ja) | リソグラフィ用マスクおよびこれを用いたパタン形成方法 | |
| JPH0272611A (ja) | 露光装置 | |
| JPS6258139B2 (enrdf_load_stackoverflow) | ||
| KR940008550B1 (ko) | 얼라인먼트 마크의 정전기 손실방지장치 | |
| JPH055368B2 (enrdf_load_stackoverflow) | ||
| JPS61111528A (ja) | 露光方法 | |
| GB1589286A (en) | Alignment of a photo-mask with respect to the surface of a substrate body | |
| CA1164713A (en) | Method and apparatus for transferring patterns | |
| JPS6246522A (ja) | 高速アライメント露光方法 | |
| JPS5860743A (ja) | 転写用マスク |