JPS6338091B2 - - Google Patents

Info

Publication number
JPS6338091B2
JPS6338091B2 JP18659981A JP18659981A JPS6338091B2 JP S6338091 B2 JPS6338091 B2 JP S6338091B2 JP 18659981 A JP18659981 A JP 18659981A JP 18659981 A JP18659981 A JP 18659981A JP S6338091 B2 JPS6338091 B2 JP S6338091B2
Authority
JP
Japan
Prior art keywords
refractive index
wavelength
group refractive
vacuum
interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP18659981A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5887447A (ja
Inventor
Koichi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP18659981A priority Critical patent/JPS5887447A/ja
Publication of JPS5887447A publication Critical patent/JPS5887447A/ja
Publication of JPS6338091B2 publication Critical patent/JPS6338091B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP18659981A 1981-11-20 1981-11-20 群屈折率の高精度測定法 Granted JPS5887447A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18659981A JPS5887447A (ja) 1981-11-20 1981-11-20 群屈折率の高精度測定法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18659981A JPS5887447A (ja) 1981-11-20 1981-11-20 群屈折率の高精度測定法

Publications (2)

Publication Number Publication Date
JPS5887447A JPS5887447A (ja) 1983-05-25
JPS6338091B2 true JPS6338091B2 (hu) 1988-07-28

Family

ID=16191372

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18659981A Granted JPS5887447A (ja) 1981-11-20 1981-11-20 群屈折率の高精度測定法

Country Status (1)

Country Link
JP (1) JPS5887447A (hu)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286575A (ja) * 2003-03-20 2004-10-14 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法及び装置
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2694201B2 (ja) * 1988-11-16 1997-12-24 日本電信電話株式会社 分散測定方法およびその装置
JP2017003434A (ja) * 2015-06-10 2017-01-05 キヤノン株式会社 屈折率の計測方法、計測装置、光学素子の製造方法
CN108318420A (zh) * 2017-12-22 2018-07-24 北京航天计量测试技术研究所 一种用于高精度气体折射率测量的光路结构

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286575A (ja) * 2003-03-20 2004-10-14 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法及び装置
JP2007114206A (ja) * 2006-11-30 2007-05-10 National Institute Of Advanced Industrial & Technology 光学材料の群屈折率精密計測方法

Also Published As

Publication number Publication date
JPS5887447A (ja) 1983-05-25

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