JPS6335418Y2 - - Google Patents
Info
- Publication number
- JPS6335418Y2 JPS6335418Y2 JP413081U JP413081U JPS6335418Y2 JP S6335418 Y2 JPS6335418 Y2 JP S6335418Y2 JP 413081 U JP413081 U JP 413081U JP 413081 U JP413081 U JP 413081U JP S6335418 Y2 JPS6335418 Y2 JP S6335418Y2
- Authority
- JP
- Japan
- Prior art keywords
- diode
- voltage
- constant current
- constant
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 10
- 239000004065 semiconductor Substances 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 claims description 7
- 238000010586 diagram Methods 0.000 description 5
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP413081U JPS6335418Y2 (en:Method) | 1981-01-17 | 1981-01-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP413081U JPS6335418Y2 (en:Method) | 1981-01-17 | 1981-01-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57118364U JPS57118364U (en:Method) | 1982-07-22 |
| JPS6335418Y2 true JPS6335418Y2 (en:Method) | 1988-09-20 |
Family
ID=29802565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP413081U Expired JPS6335418Y2 (en:Method) | 1981-01-17 | 1981-01-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6335418Y2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5976565B2 (ja) * | 2013-02-14 | 2016-08-23 | 新電元工業株式会社 | 電子部品検査装置 |
-
1981
- 1981-01-17 JP JP413081U patent/JPS6335418Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57118364U (en:Method) | 1982-07-22 |
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