JPS6331811B2 - - Google Patents

Info

Publication number
JPS6331811B2
JPS6331811B2 JP57232240A JP23224082A JPS6331811B2 JP S6331811 B2 JPS6331811 B2 JP S6331811B2 JP 57232240 A JP57232240 A JP 57232240A JP 23224082 A JP23224082 A JP 23224082A JP S6331811 B2 JPS6331811 B2 JP S6331811B2
Authority
JP
Japan
Prior art keywords
data
test
input
source format
correct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57232240A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59125455A (ja
Inventor
Tatsumi Hayashi
Mikio Tsuchimochi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57232240A priority Critical patent/JPS59125455A/ja
Publication of JPS59125455A publication Critical patent/JPS59125455A/ja
Publication of JPS6331811B2 publication Critical patent/JPS6331811B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57232240A 1982-12-30 1982-12-30 テストデ−タの作成方法 Granted JPS59125455A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57232240A JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57232240A JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Publications (2)

Publication Number Publication Date
JPS59125455A JPS59125455A (ja) 1984-07-19
JPS6331811B2 true JPS6331811B2 (enrdf_load_stackoverflow) 1988-06-27

Family

ID=16936162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57232240A Granted JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Country Status (1)

Country Link
JP (1) JPS59125455A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS626339A (ja) * 1985-07-03 1987-01-13 Matsushita Electric Ind Co Ltd テストパタ−ン発生装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55108054A (en) * 1979-02-10 1980-08-19 Nec Corp Test system for synchronizing type digital circuit
JPS57113156A (en) * 1980-12-29 1982-07-14 Fujitsu Ltd Generating method for diagnostic expected value

Also Published As

Publication number Publication date
JPS59125455A (ja) 1984-07-19

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