JPS57113156A - Generating method for diagnostic expected value - Google Patents

Generating method for diagnostic expected value

Info

Publication number
JPS57113156A
JPS57113156A JP55189057A JP18905780A JPS57113156A JP S57113156 A JPS57113156 A JP S57113156A JP 55189057 A JP55189057 A JP 55189057A JP 18905780 A JP18905780 A JP 18905780A JP S57113156 A JPS57113156 A JP S57113156A
Authority
JP
Japan
Prior art keywords
diagnostic
expected
program
value generating
accordance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55189057A
Other languages
Japanese (ja)
Other versions
JPS6120899B2 (en
Inventor
Yukio Kobayashi
Michio Makita
Kenji Takano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55189057A priority Critical patent/JPS57113156A/en
Publication of JPS57113156A publication Critical patent/JPS57113156A/en
Publication of JPS6120899B2 publication Critical patent/JPS6120899B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To develop a diagnostic program efficiently and economically, by enabling extraction and editing simultaneously when expected values to be incorporated in a regular diagnostic program are collected. CONSTITUTION:A diagnostic processor 31 reads an expected-value generating program from a magentic tape 32-a to a stoage device 33. In accordance with an indication from a console 34, the diagnostic processor 31 collects, extracts and edits the expected-value generating program. During the collection, a normal device 35 takes a diagnostic test from the expected-value generating program and logs the result in the program in the storage device. Expected-value data is extracted and edited in accordance with control data from a card reader 36 to be recorded on a magnetic tape 32-b.
JP55189057A 1980-12-29 1980-12-29 Generating method for diagnostic expected value Granted JPS57113156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55189057A JPS57113156A (en) 1980-12-29 1980-12-29 Generating method for diagnostic expected value

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55189057A JPS57113156A (en) 1980-12-29 1980-12-29 Generating method for diagnostic expected value

Publications (2)

Publication Number Publication Date
JPS57113156A true JPS57113156A (en) 1982-07-14
JPS6120899B2 JPS6120899B2 (en) 1986-05-24

Family

ID=16234561

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55189057A Granted JPS57113156A (en) 1980-12-29 1980-12-29 Generating method for diagnostic expected value

Country Status (1)

Country Link
JP (1) JPS57113156A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59125455A (en) * 1982-12-30 1984-07-19 Fujitsu Ltd Generating method of test data
US5871235A (en) * 1996-05-06 1999-02-16 Trw Occupant Restraint Systems Gmbh Linear actuator for a vechicle occupant restraint system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59125455A (en) * 1982-12-30 1984-07-19 Fujitsu Ltd Generating method of test data
JPS6331811B2 (en) * 1982-12-30 1988-06-27 Fujitsu Ltd
US5871235A (en) * 1996-05-06 1999-02-16 Trw Occupant Restraint Systems Gmbh Linear actuator for a vechicle occupant restraint system

Also Published As

Publication number Publication date
JPS6120899B2 (en) 1986-05-24

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