JPS59125455A - テストデ−タの作成方法 - Google Patents

テストデ−タの作成方法

Info

Publication number
JPS59125455A
JPS59125455A JP57232240A JP23224082A JPS59125455A JP S59125455 A JPS59125455 A JP S59125455A JP 57232240 A JP57232240 A JP 57232240A JP 23224082 A JP23224082 A JP 23224082A JP S59125455 A JPS59125455 A JP S59125455A
Authority
JP
Japan
Prior art keywords
test
data
test data
program
input data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57232240A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6331811B2 (enrdf_load_stackoverflow
Inventor
Tatsumi Hayashi
林　辰己
Mikio Tsuchimochi
土持　幹雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57232240A priority Critical patent/JPS59125455A/ja
Publication of JPS59125455A publication Critical patent/JPS59125455A/ja
Publication of JPS6331811B2 publication Critical patent/JPS6331811B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57232240A 1982-12-30 1982-12-30 テストデ−タの作成方法 Granted JPS59125455A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57232240A JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57232240A JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Publications (2)

Publication Number Publication Date
JPS59125455A true JPS59125455A (ja) 1984-07-19
JPS6331811B2 JPS6331811B2 (enrdf_load_stackoverflow) 1988-06-27

Family

ID=16936162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57232240A Granted JPS59125455A (ja) 1982-12-30 1982-12-30 テストデ−タの作成方法

Country Status (1)

Country Link
JP (1) JPS59125455A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS626339A (ja) * 1985-07-03 1987-01-13 Matsushita Electric Ind Co Ltd テストパタ−ン発生装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55108054A (en) * 1979-02-10 1980-08-19 Nec Corp Test system for synchronizing type digital circuit
JPS57113156A (en) * 1980-12-29 1982-07-14 Fujitsu Ltd Generating method for diagnostic expected value

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55108054A (en) * 1979-02-10 1980-08-19 Nec Corp Test system for synchronizing type digital circuit
JPS57113156A (en) * 1980-12-29 1982-07-14 Fujitsu Ltd Generating method for diagnostic expected value

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS626339A (ja) * 1985-07-03 1987-01-13 Matsushita Electric Ind Co Ltd テストパタ−ン発生装置

Also Published As

Publication number Publication date
JPS6331811B2 (enrdf_load_stackoverflow) 1988-06-27

Similar Documents

Publication Publication Date Title
US6496922B1 (en) Method and apparatus for multiplatform stateless instruction set architecture (ISA) using ISA tags on-the-fly instruction translation
JP5182815B2 (ja) プログラム・コード変換において例外を正確に処理するための方法、並びにその装置及びコンピュータ・プログラム
US7032212B2 (en) Method and system for generating test matrices for software programs
US7380235B1 (en) Application program interface call replay tool
Xue et al. MPIWiz: Subgroup reproducible replay of MPI applications
CN114144764A (zh) 使用影子栈的栈跟踪
CN117195568B (zh) 一种基于离散事件的仿真引擎性能分析方法及装置
CN107479866B (zh) 基于重构技术实现开放终端应用数据与功能的方法
CN111258875A (zh) 界面测试方法及系统、电子设备、存储介质
CN109408035B (zh) 一种业务系统的流程配置方法、存储介质和服务器
CN114416547A (zh) 基于测试用例的测试方法
CN114237714A (zh) 命令包生成方法、装置、电子设备和存储介质
CN110244939A (zh) 一种基于OpenCL的RS码编解码方法
US7216337B2 (en) Automatic determination of invalid call sequences in software components
CN110609786A (zh) 软件测试方法、装置、计算机设备和存储介质
JPS59125455A (ja) テストデ−タの作成方法
JP2817786B2 (ja) シミュレーション装置及びシミュレーション方法
US20080216099A1 (en) System for Generating Optimized Computer Data Field Conversion Routines
CN116150020A (zh) 一种测试用例的转换方法及装置
CN114003390A (zh) 一种确定异常线程的方法、装置、计算机设备及存储介质
CN112418930A (zh) 一种测试方法、系统及计算机设备
CN110825809A (zh) 一种用于药物反应信息的存储方法及设备
CN119740527A (zh) 自动化验证SOC sha单元的方法及装置
CN115688647A (zh) 扫描按键电路测试方法及装置
CN120045245A (zh) 一种日期控件封装方法、系统、可读存储介质及设备