JPS63315938A - 物質表面の状態測定装置 - Google Patents

物質表面の状態測定装置

Info

Publication number
JPS63315938A
JPS63315938A JP15275487A JP15275487A JPS63315938A JP S63315938 A JPS63315938 A JP S63315938A JP 15275487 A JP15275487 A JP 15275487A JP 15275487 A JP15275487 A JP 15275487A JP S63315938 A JPS63315938 A JP S63315938A
Authority
JP
Japan
Prior art keywords
light
calibration
reflected light
reflected
optical path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15275487A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0535984B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Seiichiro Kiyobe
清部　政一郎
Hideo Takada
秀夫 高田
Shigeo Takahashi
高橋　重男
Hirotoshi Ishikawa
石川　宏俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JAPAN SENSOR CORP KK
Yokogawa Electric Corp
Original Assignee
JAPAN SENSOR CORP KK
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JAPAN SENSOR CORP KK, Yokogawa Electric Corp filed Critical JAPAN SENSOR CORP KK
Priority to JP15275487A priority Critical patent/JPS63315938A/ja
Publication of JPS63315938A publication Critical patent/JPS63315938A/ja
Publication of JPH0535984B2 publication Critical patent/JPH0535984B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP15275487A 1987-06-19 1987-06-19 物質表面の状態測定装置 Granted JPS63315938A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15275487A JPS63315938A (ja) 1987-06-19 1987-06-19 物質表面の状態測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15275487A JPS63315938A (ja) 1987-06-19 1987-06-19 物質表面の状態測定装置

Publications (2)

Publication Number Publication Date
JPS63315938A true JPS63315938A (ja) 1988-12-23
JPH0535984B2 JPH0535984B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-05-27

Family

ID=15547436

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15275487A Granted JPS63315938A (ja) 1987-06-19 1987-06-19 物質表面の状態測定装置

Country Status (1)

Country Link
JP (1) JPS63315938A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170925A (ja) * 2004-12-20 2006-06-29 Dainippon Printing Co Ltd 光沢度測定方法および装置
EP2023126A1 (en) * 2007-07-27 2009-02-11 Voith Patent GmbH Gloss sensor for a paper machine
JP2014178446A (ja) * 2013-03-14 2014-09-25 Ricoh Co Ltd 光学センサ、定着装置および画像形成装置、ならびに光学センサの配置方法
EP3859309A1 (en) * 2020-01-31 2021-08-04 Delta Electronics, Inc. Optical calibration tool

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006170925A (ja) * 2004-12-20 2006-06-29 Dainippon Printing Co Ltd 光沢度測定方法および装置
EP2023126A1 (en) * 2007-07-27 2009-02-11 Voith Patent GmbH Gloss sensor for a paper machine
JP2014178446A (ja) * 2013-03-14 2014-09-25 Ricoh Co Ltd 光学センサ、定着装置および画像形成装置、ならびに光学センサの配置方法
EP3859309A1 (en) * 2020-01-31 2021-08-04 Delta Electronics, Inc. Optical calibration tool
US11815445B2 (en) 2020-01-31 2023-11-14 Delta Electronics, Inc. Optical calibration tool
US12174109B2 (en) 2020-01-31 2024-12-24 Delta Electronics, Inc. Optical calibration tool

Also Published As

Publication number Publication date
JPH0535984B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-05-27

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