JPS63315938A - State measuring instrument for material surface - Google Patents
State measuring instrument for material surfaceInfo
- Publication number
- JPS63315938A JPS63315938A JP15275487A JP15275487A JPS63315938A JP S63315938 A JPS63315938 A JP S63315938A JP 15275487 A JP15275487 A JP 15275487A JP 15275487 A JP15275487 A JP 15275487A JP S63315938 A JPS63315938 A JP S63315938A
- Authority
- JP
- Japan
- Prior art keywords
- light
- calibration
- reflected
- prism
- reflected light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title claims abstract description 9
- 238000005259 measurement Methods 0.000 claims abstract description 10
- 230000003287 optical effect Effects 0.000 claims abstract description 10
- 239000006185 dispersion Substances 0.000 claims abstract description 9
- 230000001678 irradiating effect Effects 0.000 claims abstract description 4
- 239000000126 substance Substances 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 4
- 238000000034 method Methods 0.000 description 6
- 235000003913 Coccoloba uvifera Nutrition 0.000 description 1
- 206010010071 Coma Diseases 0.000 description 1
- 244000241257 Cucumis melo Species 0.000 description 1
- 235000015510 Cucumis melo subsp melo Nutrition 0.000 description 1
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 241000087799 Koma Species 0.000 description 1
- 240000000220 Panda oleosa Species 0.000 description 1
- 235000016496 Panda oleosa Nutrition 0.000 description 1
- 240000008976 Pterocarpus marsupium Species 0.000 description 1
- FJJCIZWZNKZHII-UHFFFAOYSA-N [4,6-bis(cyanoamino)-1,3,5-triazin-2-yl]cyanamide Chemical group N#CNC1=NC(NC#N)=NC(NC#N)=N1 FJJCIZWZNKZHII-UHFFFAOYSA-N 0.000 description 1
- 210000003323 beak Anatomy 0.000 description 1
- 238000005282 brightening Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 210000000744 eyelid Anatomy 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 210000003128 head Anatomy 0.000 description 1
- 239000002932 luster Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
Abstract
Description
【発明の詳細な説明】
ぐ産業上の利用分野ン
本発明は物質表面の状態を測定する装置１に関し、史に
詳しくは、紙等の表面の平滑度及び光沢度をＥ５ｒ−の
検出ヘッドを用いてオンラインで１ｌｌ１１定：ＪＶ東
る装′！／に関ηる。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to an apparatus 1 for measuring the condition of the surface of a material. Use 1ll11 online: JV East Ruso'! / related to.
〈従来の技術゛・
紙の４１滑■を検出する方法として、例えばＪＩＳ
Ｐ８１１９にＪ、Ｑ定ｃｊれている。第６図はこの方法
による従来装置のｎ面図である。Ｚ＋ イ′：ｉきの１
「）ｊ容器１の蓋ゴａと容器１との間に測定すべさでバ
Ｓを挾んて゛、ポンプ２によって内室１ｂの空気を引く
。圧力δ１３によって容器］内の圧がある一定の匂圧に
イ（るまでの時間を測定する。紙Ｓの表面が危い場合に
（ま、紙面に治って空気が内室１ ｂに漏れるため負圧
になるまでの時間が短く、表面が滑かな場合に（よ時間
が長く掛かり、この時間差がらｆｔ（Ｓの平ｆ１度を検
知している。<Conventional technology> As a method for detecting 41 slips on paper, for example, JIS
P8119 has J and Q constant cj. FIG. 6 is an n-plane view of a conventional device using this method. Z+ i': i Kino 1
``)) A measuring valve S is placed between the lid a of the container 1 and the container 1, and the air in the inner chamber 1b is drawn by the pump 2. Measure the time it takes for the surface of the paper S to reach the pressure. In the case of kana, it takes a long time, and this time difference is used to detect the flat f1 degree of ft(S).
しかしながら、この方ン人で１．１ザンブルを０１１反
って試験装置ζｊにが０る必要があり、また測定に時間
が）１Ｆかる為、抄紙プロセス等のオンラインで−ｔａ
Ｈ史えない。However, this method requires 011 warping of the 1.1 zamble and 0 of the test equipment ζj, and it also takes time (1F) for measurement, so it is necessary to
I can't read H.
紙の平滑度をオンラインで測定づる方ｒムとして、例λ
ぽＵＳＩ）４，０１９，０６６弓によって第７図に示す
ような光学式平滑麿計が提案されている。As a method for measuring the smoothness of paper online, for example λ
An optical smoothing meter as shown in FIG. 7 has been proposed by U.S. Pat. No. 4,019,066.
このＨ′ｌ？？では光′に！４からの光を連続的に移送
されろ紙Ｓ−Ｆに照射し、反射光をコレクター５で集光
した後、受光１６ｒ検出するしので、反射光は紙Ｓの表
面の平滑度に応じて分散し、この分散の広がりを測定す
ることによって祇Ｓの平滑度を測定することが出来る。This H'l? ? Now onto the light! The light from 4 is continuously transferred and irradiated onto the filter paper S-F, and after the reflected light is collected by the collector 5, it is detected by the light receiving unit 16r, so that the reflected light is dispersed according to the smoothness of the surface of the paper S. However, by measuring the spread of this dispersion, it is possible to measure the smoothness of the S.
紙の表面状態を表わす仙のパラメータとして光沢度があ
る。光沢度をｉ！Ｉｌｌ定する従来装置として例えば狛
【；ｉ１雪（６１−２０３３４７号で示されるような装
置がある。この装置で番ユ、紙の表面の法線にえ１し所
定角度で集光した光を照則し、紙表面からの正反射光を
検出し、この正反射光の値（ビーク光１ｔ１）から光沢
度を測定するものである。Glossiness is a parameter that expresses the surface condition of paper. The gloss level is i! For example, there is a device as shown in Koma [; i1 Yuki (No. 61-203347) as a conventional device for determining Ill.This device collects light focused at a predetermined angle to the normal to the surface of the paper. For reference, the specularly reflected light from the paper surface is detected, and the glossiness is measured from the value of this specularly reflected light (beak light 1t1).
〈発明が解決しようとする問題点〉
前記ゝＶ滑度計と光沢度９１とを別々に設置した場合、
多くのスペースが要り、また価格の点でもｊ１策でない
。更に、これらセンサは光源或は受光素子の特性ドリフ
トによって測定誤差が発生する為、校正を（ｊう必要が
あるが、従来方式では、前記紙の位置に校正用の基準サ
ンプルを置いて校正 （！行う方式であった為、測定中
では校正を行うことが出来なかっに０
本発明の解決しようとする技１（目的課題は、平滑度と
光沢度とを一つのセンサで検出できるようにづると共に
、測定中であっても校正が間中に行えるようにすること
にある。<Problems to be solved by the invention> When the above-mentioned V slipmeter and glossiness 91 are installed separately,
It requires a lot of space and is not the best option in terms of price. Furthermore, since measurement errors occur in these sensors due to drift in the characteristics of the light source or the light receiving element, it is necessary to perform calibration. Technique 1 to be solved by the present invention (the objective problem is to develop a method to detect smoothness and glossiness with one sensor). In addition, the purpose is to enable calibration to be performed even during measurement.
ぐ問題点を解決するだめの手段）
本発明の偶成は、物質表面の法線にス・１し所定角度で
集光した光を照）１する光熱用手段と、前記物質表面で
反射された正反射方向の反０＝１光を受光する受光手段
と、前記物質表面より一定間ｒＰＩ雛れて、１）η記光
量用手段から前記受光手段に至る光路に出入し、前記光
熱用手段からの光を境界面で反則さｌ！前記受光手段へ
直１ａ与える校正用プリズムとを具備し、測定時、前記
校正用プリズムを１１４記光路りから外し、前記物質表
面からの正反射光を前記受素子で検出し、この反射光の
ビーク光量から光沢度１８号を１９で、この反射光の分
散の大きさから平滑度１３月を（りるようにし、校正時
、前記校正用プリズムを前記光路上に挿入して校正を行
うようにしたことにある。The combination of the present invention includes a photothermal means for emitting light focused at a predetermined angle to the normal to the surface of a material, and a means for emitting light reflected from the surface of the material. a light-receiving means for receiving the opposite 0=1 light in the specular reflection direction; The light of is reflected at the boundary surface l! and a calibration prism that directly applies 1a to the light receiving means, and during measurement, the calibration prism is removed from the optical path 114, the specularly reflected light from the material surface is detected by the receiving element, and the reflected light is detected by the receiving element. The gloss level is set to 18 based on the amount of beam light, and the smoothness is set to 19 based on the amount of dispersion of this reflected light. During calibration, the calibration prism is inserted on the optical path. It's because I did it.
ぐ作用〉
１１４記の技術手段は次のように作用する。即ら、平滑
度信弓は前記正反射光の分散具合に対応し、光沢度信号
は正反射光のビーク光量に対応しており、前記受光手段
に例えば２次元の受光面を有する受光手段を用いれば、
反射光の分散の大きさが測定出来、また、これら受光手
段の各素子の検出ｂ： Ｆ’３を記憶さけて比較）るこ
とによってビーク光量を測定することが出来、これらか
ら前記’Ｆ ？ｆ１度倍月及び光沢ｊη悟８が求まる。Operation> The technical means described in No. 114 operates as follows. That is, the smoothness signal corresponds to the degree of dispersion of the specularly reflected light, and the glossiness signal corresponds to the peak light amount of the specularly reflected light. If you use
The magnitude of the dispersion of the reflected light can be measured, and by detecting each element of these light receiving means (b: comparing without storing F'3), the amount of peak light can be measured, and from these, the amount of the 'F'? f1 degree double moon and luster jηgo8 are found.
また、校正は前記校正用プリズムを前配光路上に挿入ザ
るだけで良く、校正用の基準リーンプルは要らず、測定
中であってし簡１１１に（交工が行える。In addition, calibration can be carried out by simply inserting the calibration prism onto the front light distribution path, and there is no need for a reference lean pull for calibration, which can be easily performed during measurement.
く実、懺例〉
以下図面に従い本発明の詳細な説明する。第１図は本発
明実施例装置の断面図で、第２図の本発明実施例装置の
側面図にａ）ける△−Δ′而での切断面を表わす。図中
、７は紙Ｓの法線に対し所定角度で集光した光を照射す
る光熱用手段、８は第３図で拡大して示したような断面
を有する校正用プリズムで、ガイドレール９上を移動す
る台車１０により、崩（Ｓより一定間隔離れ、１ｆｌり
下げられている。１１は台車１０を矢印Ａ、力方向勅か
し、校正用プリズム８を光熱用手段７から後出の受光手
段に至る光路Ｐに出入させる為のモータである。台車１
０を矢印△、方向に肋かり手段として、例えば第４図に
示すような、台車１０１．：長孔１０ａを設けて、この
孔に［−タ１１の偏心軸１’ｌａを係合させたカム＋ａ
構が用いられる。Examples> The present invention will be described in detail below with reference to the drawings. FIG. 1 is a cross-sectional view of an apparatus according to an embodiment of the present invention, showing a cross-sectional view taken along the line Δ-Δ' in a) of the side view of the apparatus according to an embodiment of the present invention in FIG. In the figure, 7 is a photothermal means for irradiating light focused at a predetermined angle with respect to the normal line of the paper S, 8 is a calibration prism having a cross section as shown enlarged in FIG. 3, and a guide rail 9 It is lowered by 1 fl at a fixed distance from the collapsing (S) by the trolley 10 moving above. 11 moves the trolley 10 in the direction of force by arrow A, and moves the calibration prism 8 away from the light and heat means 7 as described below. This is a motor for moving the light into and out of the optical path P leading to the light receiving means.Dolly 1
0 in the direction of arrow △, for example, as shown in FIG. 4, a trolley 101. : A long hole 10a is provided, and the eccentric shaft 1'la of the -ta 11 is engaged with the cam+a.
structure is used.
１２は紙Ｓで反）１された正反射光を受光する受光手段
で、反射光の分散の大きさを検出づべく、二組のリニア
アレイセン丈１２ａ、１２ｂが用いられ、リニアアレイ
廿ンφ１１２ａによってＸ軸方向の反射光を受光し、リ
ニアイレイわンリ１２ｔ。Reference numeral 12 denotes a light receiving means for receiving the specularly reflected light reflected by the paper S. In order to detect the magnitude of dispersion of the reflected light, two sets of linear array sensors 12a and 12b are used. The reflected light in the X-axis direction is received by φ112a, and the linear eyelid 12t is received.
によってｙ軸方向の反射光を受光する。１３はハーフミ
ラ−である。, the reflected light in the y-axis direction is received. 13 is a half mirror.
このような構成で、光照射手段７より集光した光をｔｔ
ｔ ｓの法線に対し、例えば７５°の角度で入射させる
。測定時には、校正用プリズム７を第２図の一点５Ｏ線
の位置まで移動さ「光路Ｐ上に校正用プリズム７が位置
しないようにしておく。この状態では、光照射手段７か
らの光はプリズムを通らず直接紙Ｓに照則され、ここか
らの反射光は正反射方向に配置された受光手段１２で検
出される。With such a configuration, the light collected from the light irradiation means 7 is
The light is incident at an angle of, for example, 75° with respect to the normal to t s. At the time of measurement, the calibration prism 7 is moved to the position of the point 5O line in FIG. 2 so that the calibration prism 7 is not located on the optical path P. The light is directly focused on the paper S without passing through it, and the reflected light from there is detected by the light receiving means 12 arranged in the specular reflection direction.
検出信号は第５図で示すように分散しており、リニアア
レイセンリ−を構成する各素子の検出信号から、所定レ
ベルＶｓにお参ノる分散の幅Ｗと、ピーク光量Ｖｐを求
め、幅Ｗより平滑曵信月を、ピーク光量Ｖｐより光沢瓜
信号を１＋？る。The detection signal is dispersed as shown in Fig. 5. From the detection signal of each element constituting the linear array sensor, the width W of dispersion and the peak light amount Vp that reach a predetermined level Vs are determined, and the width is determined. Smooth Shingetsu from W, glossy melon signal from peak light amount Vp 1+? Ru.
次に、校正時、校正用プリズム８を光路Ｐ−トに移動づ
る（第２図、実線の位置）。光照射手段７から校正用プ
リズム８内に入った光は第３図で示すように校正用プリ
ズム８の境界部で反射されプリズム８から直接受光手段
１２に与えられる。校正は一定時間毎、或は必要に応じ
て行われ、そのときの測定値からドリフト聞を検知し、
この信号を用いＣ測定時の、ｔｌ’ｌ定（八「５を補正
する。Next, during calibration, the calibration prism 8 is moved to the optical path P (FIG. 2, the position indicated by the solid line). The light entering the calibration prism 8 from the light irradiation means 7 is reflected at the boundary of the calibration prism 8, as shown in FIG. 3, and is applied directly from the prism 8 to the light receiving means 12. Calibration is performed at regular intervals or as needed, and the drift is detected from the measured values at that time.
This signal is used to correct the tl'l constant (8'5) during C measurement.
・ブを明の効果〉
本発明によれば、物′ｆ１表面の平；１１１！剣と光沢
ｊ復とを同一の検出ヘッドを用いて測定出来、装置を小
ハリかつ安価に構成することが出来る。・Effect of brightening the surface> According to the present invention, the flat surface of the object'f1; 111! Sword and gloss can be measured using the same detection head, and the device can be constructed with a small size and at low cost.
尚、上記本発明の実施例の説明でｔは、前記受光手段と
して二つのリニア７７レイヒンリをＸ、ｙ軸方向に並べ
て反射光の分散の大きさを測定しているが、この部分を
受光素子を２次元にｊｌＧべた受光部としても構わない
。Incidentally, in the above description of the embodiment of the present invention, t is the light receiving means in which two linear 77 beams are arranged in the X and Y axis directions to measure the dispersion of reflected light. It is also possible to use a two-dimensional jlG solid light receiving section.
第１図は本発明実施例装置の断面図、第２図は本発明実
施例装置の側面図、第３図は本発明実施例装置にお（〕
る佼止用プリズムの拡大所面図、第４図は本発明実施例
装置の部分の具体例を示す平面図、第５図は本発明実施
例装置の動作Ｊ２明図、第６図は従来装置の断面図、第
７図は他の従来装置の原理構成図である。
７・・・光量（ト）手段１．８・・・校正用プリズム、
１１・・・モータ、１２・・・受光手段、１２ａ・・・
Ｘ軸すニアアレイセンリ、１２ｂ・・・ｙ軸すニアアレ
イ廿ンザ、Ｓ・・・紙、Ｐ・・・光路
代理人 弁理上 小 沢 信 助・１
ｆ
第１図
第２図
第３図
ε
第４図
！０ ／／ ／Ｄａ
；／／
ｔ
第５図
第４図Fig. 1 is a sectional view of the apparatus according to the present invention, Fig. 2 is a side view of the apparatus according to the present invention, and Fig. 3 is a cross-sectional view of the apparatus according to the present invention.
4 is a plan view showing a specific example of the device according to the present invention, FIG. 5 is a clear view of the J2 operation of the device according to the present invention, and FIG. 6 is a conventional A sectional view of the device, FIG. 7, is a diagram showing the principle configuration of another conventional device. 7... Light amount (g) means 1.8... Calibration prism,
11...Motor, 12...Light receiving means, 12a...
X-axis near array sensor, 12b...Y-axis near array sensor, S...paper, P...light path agent On patent attorney Shinsuke Ozawa・1 f Figure 1 Figure 2 Figure 3 ε Figure 4! 0 // /Da ;// t Figure 5 Figure 4
Claims (1)
光照射手段と、前記物質表面で反射された正反射方向の
反射光を受光する受光手段と、前記物質表面より一定間
隔離れて、前記光照射手段から前記受光手段に至る光路
に出入し、前記光照射手段からの光を境界面で反射させ
前記受光手段へ直接与える校正用プリズムとを具備し、
測定時、前記校正用プリズムを前記光路上から外し、前
記物質表面からの正反射光を前記受素子で検出し、この
反射光のピーク光量から光沢度信号を得て、この反射光
の分散の大きさから平滑度信号を得るようにし、校正時
、前記校正用プリズムを前記光路上に挿入して校正を行
うようにしたことを特徴とする物質表面の状態測定装置
。a light irradiation means for irradiating light focused at a predetermined angle with respect to the normal to the surface of the material; a light receiving means for receiving the reflected light in the specular direction reflected by the surface of the material; , a calibration prism that enters and exits the optical path from the light irradiation means to the light reception means, reflects the light from the light irradiation means at a boundary surface, and directly supplies the light to the light reception means,
During measurement, the calibration prism is removed from the optical path, the specularly reflected light from the material surface is detected by the receiving element, a glossiness signal is obtained from the peak amount of this reflected light, and the dispersion of this reflected light is calculated. 1. An apparatus for measuring the condition of a surface of a substance, characterized in that a smoothness signal is obtained from the size, and during calibration, the calibration prism is inserted on the optical path.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15275487A JPS63315938A (en) | 1987-06-19 | 1987-06-19 | State measuring instrument for material surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15275487A JPS63315938A (en) | 1987-06-19 | 1987-06-19 | State measuring instrument for material surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63315938A true JPS63315938A (en) | 1988-12-23 |
| JPH0535984B2 JPH0535984B2 (en) | 1993-05-27 |
Family
ID=15547436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15275487A Granted JPS63315938A (en) | 1987-06-19 | 1987-06-19 | State measuring instrument for material surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63315938A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006170925A (en) * | 2004-12-20 | 2006-06-29 | Dainippon Printing Co Ltd | Glossiness measuring method and instrument |
| EP2023126A1 (en) * | 2007-07-27 | 2009-02-11 | Voith Patent GmbH | Gloss sensor for a paper machine |
| JP2014178446A (en) * | 2013-03-14 | 2014-09-25 | Ricoh Co Ltd | Optical sensor, fixing apparatus, image forming apparatus, and optical sensor arrangement method |
| EP3859309A1 (en) * | 2020-01-31 | 2021-08-04 | Delta Electronics, Inc. | Optical calibration tool |
-
1987
- 1987-06-19 JP JP15275487A patent/JPS63315938A/en active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006170925A (en) * | 2004-12-20 | 2006-06-29 | Dainippon Printing Co Ltd | Glossiness measuring method and instrument |
| JP4549838B2 (en) * | 2004-12-20 | 2010-09-22 | 大日本印刷株式会社 | Glossiness measuring method and apparatus |
| EP2023126A1 (en) * | 2007-07-27 | 2009-02-11 | Voith Patent GmbH | Gloss sensor for a paper machine |
| JP2014178446A (en) * | 2013-03-14 | 2014-09-25 | Ricoh Co Ltd | Optical sensor, fixing apparatus, image forming apparatus, and optical sensor arrangement method |
| EP3859309A1 (en) * | 2020-01-31 | 2021-08-04 | Delta Electronics, Inc. | Optical calibration tool |
| US11815445B2 (en) | 2020-01-31 | 2023-11-14 | Delta Electronics, Inc. | Optical calibration tool |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0535984B2 (en) | 1993-05-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4382098B2 (en) | Analysis method and analyzer | |
| US5080484A (en) | Method of measuring the contact angle of wetting liquid on a solid surface | |
| CA1269525A (en) | Procedure and means for measuring the thickness of a film-like or sheet-like web | |
| US6987832B2 (en) | Calibration and alignment of X-ray reflectometric systems | |
| KR101287644B1 (en) | Method and apparatus for inspecting a container sidewall contour | |
| JP3953520B2 (en) | Method and apparatus for optical alignment of a measuring head in the XY plane | |
| JPH03267745A (en) | Surface property detecting method | |
| US6549286B2 (en) | Method and measuring arrangement for measuring paper surface | |
| US6504617B2 (en) | Method and measuring arrangement for measuring paper surface | |
| US4800286A (en) | Measurement of variation in flute profile height | |
| US6038027A (en) | Method for measuring material thickness profiles | |
| CN101379366A (en) | Optical translation of triangulation position measurement | |
| JPS63315938A (en) | State measuring instrument for material surface | |
| EP1624280A2 (en) | Optical triangulation device and method of measuring a variable of a web using the device | |
| Lenferink et al. | An improved optical method for surface plasmon resonance experiments | |
| JP3570488B2 (en) | Measurement method of alloying degree of galvanized steel sheet using laser beam | |
| JPS59211830A (en) | Apparatus for measuring dampening water of printer | |
| WO2010076310A1 (en) | A detector system for identifying substances in a sample | |
| WO2003008947A1 (en) | Gloss sensor having dirt buildup compensation apparatus and method | |
| US10598692B2 (en) | Device for the volumetric analysis of an organic or inorganic sample | |
| JPH03170810A (en) | Noncontact analyzer for measuring glossiness and smoothness | |
| US7701582B2 (en) | Method and device for carrying out surface plasmon resonance measurement | |
| FI114119B (en) | Method and apparatus for measuring optical quality of paper surface using laser optical sensor | |
| JPH03251708A (en) | Shape measuring apparatus for parabolic antenna surface | |
| JP2523156B2 (en) | Refraction angle measuring method and refractive index distribution measuring device |