JPS6328323B2 - - Google Patents

Info

Publication number
JPS6328323B2
JPS6328323B2 JP55186258A JP18625880A JPS6328323B2 JP S6328323 B2 JPS6328323 B2 JP S6328323B2 JP 55186258 A JP55186258 A JP 55186258A JP 18625880 A JP18625880 A JP 18625880A JP S6328323 B2 JPS6328323 B2 JP S6328323B2
Authority
JP
Japan
Prior art keywords
added
semiconductor
amount
batio
tisi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55186258A
Other languages
Japanese (ja)
Other versions
JPS57109301A (en
Inventor
Hirokatsu Mukai
Jun Niwa
Naoto Miwa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denso Corp
Original Assignee
NipponDenso Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NipponDenso Co Ltd filed Critical NipponDenso Co Ltd
Priority to JP55186258A priority Critical patent/JPS57109301A/en
Publication of JPS57109301A publication Critical patent/JPS57109301A/en
Publication of JPS6328323B2 publication Critical patent/JPS6328323B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明は、正特性磁器半導体、特にBaTiO3
半導体の製造方法に関するものであり、この磁器
半導体の用途は抵抗、電流制御装置、発熱体等で
ある。 従来周知のBaTiO3系正特性磁器半導体の製造
法としては、BaTiO3に半導体化添加剤として希
土類元素又はそれに類する元素を加え、さらに半
導体化促進剤としてSiO2、TiO2、Al2O3等の酸
化物の内1種又は2種以上を微量添加して焼結す
ることによつて正の抵抗温度係数を有する
BaTiO3系磁器半導体が得られる。 従来のBaTiO3系磁器半導体の製法では、半導
体化促進剤としてSiO2、Al2O3、TiO2等の酸化
物を添加している。ところが、BaTiO3系磁器半
導体の焼成の際に、この促進剤の酸化物と
BaTiO3を構成するBa、Ti元素の一部が反応し
て他の化合物(例えばBa2TiSi2O8)ができる。
このため、BaTiO3のBa、Tiの比率が変化し、
磁器半導体の比抵抗を増加させてしまう欠点があ
る。また、Ba2TiSi2O8等の化合物の生成量は、
製造条件によつて異なるため、化合物の量によつ
て磁器の比抵抗が変動する欠点がある。 本発明は上記の点に鑑み、BaTiO3系の正特性
磁器半導体を作る材料に、半導体化促進剤とし
て、上記Ba2TiSi2O8等のバリウム・チタチニウ
ム・シリケート系化合物またはBaSiO3等のバリ
ウム・シリケート系化合物を0.5乃至8.0重量%添
加して焼成することにより、得られる正特性磁器
半導体の比抵抗のばらつきを小さくでき、また比
抵抗そのものも低くできる製造方法を提供するこ
とを目的とするものである。 以下本発明を具体的実施例により詳細に説明す
る。 実施例 1 BaCO32モル、TiO21モル、SiO22モルの割合で
混合し、これに蒸留水を加えて20時間湿式混合す
る。乾燥後、800℃〜1200℃で焼成し、
Ba2TiSi2O8を得る。 次に、BaCO31モル、TiO21モル、Y2O30.2モ
ル%の割合で混合し、これに1.27モル%の割合で
PbTiO3を混合する。この混合物にポリビニルア
ルコールを0.3〜1重量%添加するとともに、そ
の混合物に対して1.6倍程度の蒸留水を加え、更
に上記Ba2TiSi2O8を適当量添加する。これらを
湿式粉砕し、そのスラリーをスプレードライヤで
乾燥造粒しプレス成形する。この成形品を1200℃
〜1400℃で1〜2時間焼成し、正特性磁器半導体
を得る。 上記半導体は直径25mm、厚さ3mmの円板状であ
る。この半導体の両面に無電解メツキ法によりオ
ーミツクなNi電極を形成し、更にこのNi電極の
上にAgペーストを塗布して550℃〜800℃でAgを
焼付ける。 次に、上記Ba2TiSi2O8の添加量によつて半導
体の比抵抗、抵抗値ばらつきがどのように変化す
るかを測定し、その結果を表1に示す。
The present invention relates to a method for manufacturing a positive characteristic ceramic semiconductor, particularly a BaTiO 3 -based semiconductor, and uses of this ceramic semiconductor include resistors, current control devices, heating elements, and the like. The conventionally well-known method for producing BaTiO 3 -based positive characteristic ceramic semiconductors involves adding rare earth elements or similar elements to BaTiO 3 as a semiconductor additive, and further adding SiO 2 , TiO 2 , Al 2 O 3 , etc. as a semiconductor catalyst. It has a positive temperature coefficient of resistance by adding a small amount of one or more of the oxides and sintering it.
A BaTiO 3 based ceramic semiconductor is obtained. In conventional methods for producing BaTiO 3 -based ceramic semiconductors, oxides such as SiO 2 , Al 2 O 3 and TiO 2 are added as semiconductor accelerators. However, when firing BaTiO 3 -based ceramic semiconductors, this accelerator oxide and
Some of the Ba and Ti elements that make up BaTiO 3 react to form other compounds (for example, Ba 2 TiSi 2 O 8 ).
Therefore, the ratio of Ba and Ti in BaTiO 3 changes,
It has the disadvantage of increasing the specific resistance of the ceramic semiconductor. In addition, the amount of compounds such as Ba 2 TiSi 2 O 8 produced is
Since it depends on the manufacturing conditions, there is a drawback that the resistivity of the porcelain varies depending on the amount of the compound. In view of the above points, the present invention incorporates a barium-titatinium-silicate-based compound such as the above-mentioned Ba 2 TiSi 2 O 8 or barium such as BaSiO 3 into a material for making a BaTiO 3 -based positive characteristic ceramic semiconductor as a semiconductor accelerator.・The purpose is to provide a manufacturing method that can reduce the variation in resistivity of the obtained positive characteristic ceramic semiconductor by adding 0.5 to 8.0% by weight of a silicate compound and firing it, and can also lower the resistivity itself. It is something. The present invention will be explained in detail below using specific examples. Example 1 2 moles of BaCO 3 , 1 mole of TiO 2 , and 2 moles of SiO 2 are mixed together, distilled water is added thereto, and wet mixing is carried out for 20 hours. After drying, it is fired at 800℃~1200℃,
Obtain Ba 2 TiSi 2 O 8 . Next, 1 mol of BaCO 3 , 1 mol of TiO 2 , and 0.2 mol % of Y 2 O 3 were mixed, and to this was added 1.27 mol % of
Mix PbTiO3 . 0.3 to 1% by weight of polyvinyl alcohol is added to this mixture, and about 1.6 times as much distilled water is added to the mixture, and an appropriate amount of the above Ba 2 TiSi 2 O 8 is added. These are wet-pulverized, and the resulting slurry is dried and granulated using a spray dryer and press-molded. This molded product is heated to 1200℃.
A positive characteristic ceramic semiconductor is obtained by firing at ~1400°C for 1 to 2 hours. The semiconductor has a disk shape with a diameter of 25 mm and a thickness of 3 mm. Ohmic Ni electrodes are formed on both sides of this semiconductor by electroless plating, and then Ag paste is applied onto the Ni electrodes and the Ag is baked at 550°C to 800°C. Next, it was measured how the specific resistance and resistance value variation of the semiconductor changed depending on the amount of Ba 2 TiSi 2 O 8 added, and the results are shown in Table 1.

【表】 なお、表1には従来のごとく半導体化促進剤と
してSiO2を添加した場合の例も示す。 表1から明らかなごとく、Ba2TiSi2O8の添加
量が0.5〜8.0%の範囲では比抵抗が小さくまた抵
抗値のばらつきが低いことがわかる。0.5%の添
加量を下回ると半導化の促進が行なわれにくく、
そのために比抵抗が大きく、抵抗値のばらつきも
高くなるのである。一方、8%を上回ると焼成比
重が小さくなり、また比抵抗が急激に上昇してし
まう。 ところで、従来のごとくSiO2を添加したもの
では同一比抵抗の場合、例えばNo.8とNo.3の各試
料を比較した場合、抵抗値のばらつきが
Ba2TiSi2O8を添加した方が小さくなつている。
またBa2TiSi2O8の方が添加量に対する比抵抗の
変化が小さく、安定である。 実施例 2 半導体化促進材としてBaTiSi2O7を用いた点が
実施例1と異なるのみで、他は実施例1と同一の
材料、方法でBaTi3系正特性磁器半導体を作成し
た。このBaTiSi2O7の添加量に対する比抵抗なら
びに抵抗値のばらつきの測定結果を表3に示す。
[Table] Table 1 also shows an example in which SiO 2 is added as a semiconductor accelerator as in the conventional case. As is clear from Table 1, when the amount of Ba 2 TiSi 2 O 8 added is in the range of 0.5 to 8.0%, the specific resistance is small and the variation in resistance value is low. If the amount added is less than 0.5%, it is difficult to promote semiconducting.
For this reason, the specific resistance is large and the variation in resistance values is also high. On the other hand, if it exceeds 8%, the firing specific gravity will decrease and the specific resistance will increase rapidly. By the way, in the case of conventional SiO 2 -added products with the same specific resistance, for example, when comparing samples No. 8 and No. 3, there is a variation in the resistance value.
It is smaller when Ba 2 TiSi 2 O 8 is added.
In addition, Ba 2 TiSi 2 O 8 has a smaller change in resistivity with respect to the amount added and is more stable. Example 2 A BaTi 3 -based positive characteristic ceramic semiconductor was produced using the same materials and methods as in Example 1, except that BaTiSi 2 O 7 was used as the semiconductor accelerator. Table 3 shows the measurement results of specific resistance and variation in resistance value with respect to the amount of BaTiSi 2 O 7 added.

【表】 表3から明らかなごとく、BaTiSi2O7の添加量
は0.5〜8.0重量%が好ましいことがわかる。 実施例 3 半導体化促進剤としてBaSi2O5を用いた点が実
施例1と異なるのみで、他は実施例1と同一の材
料、方法でBaTiO3系正特性磁器半導体を作成し
た。このBaSi2O5の添加量に対する比抵抗ならび
に抵抗値のばらつきの測定結果を表4に示す。
[Table] As is clear from Table 3, the amount of BaTiSi 2 O 7 added is preferably 0.5 to 8.0% by weight. Example 3 A BaTiO 3 -based positive characteristic ceramic semiconductor was produced using the same materials and method as in Example 1, except that BaSi 2 O 5 was used as a semiconductor accelerator. Table 4 shows the measurement results of specific resistance and variation in resistance value with respect to the amount of BaSi 2 O 5 added.

【表】 表4から明らかなごとく、BaSi2O5の添加量は
0.5〜8.0重量%が好ましいことがわかる。 本発明において、Ba3SiO5、BaSi4O9
BaSi3O8、Ba3SiO5、BaSi2O5、Ba2SiO4
BaSiO3のバリウム・シリケート系化合物及び
BaTiSi3O9のバリウム・チタニウム・シリケート
系化合物も半導体化促進剤として用いることがで
きる。 また、上記実施例では正特性磁器半導体の、抵
抗値が急激に増加する点(通称Tc点)を制御す
るためにPbTiO3を加えているが、その代りに
SrTiO3、BaSnO3、BaZrO3を加えてもよいこと
は公知であり、また半導体化添加剤としてY2O3
を添加しているが、Sb、Nb、Ce等の酸化物でも
よいことも公知である(Nb、Sb、Ta、Bi、<
La、Ce、Pr、Nd、Sm、Gd、Ho>→が稀土類
元素)。従つて、これらは必要に応じて適宜選択
すればよい。 以上要するに、本発明によれば、チタン酸バリ
ウム系の正特性磁器半導体を製造するに際し、そ
の材料に半導体化促進剤として、バリウム・チタ
ニウム・シリケート系化合物またはバリウム・シ
リケート系化合物を0.5〜8.0重量%添加し焼成す
るから、従来のごとく例えばSiO2を用いる場合
に比べて正特性磁器半導体の比抵抗のばらつきを
小さくでき、また比抵抗も低くすることが可能で
あるという効果がある。
[Table] As is clear from Table 4, the amount of BaSi 2 O 5 added is
It can be seen that 0.5 to 8.0% by weight is preferable. In the present invention, Ba 3 SiO 5 , BaSi 4 O 9 ,
BaSi3O8 , Ba3SiO5 , BaSi2O5 , Ba2SiO4 ,
Barium silicate compounds such as BaSiO 3 and
Barium-titanium-silicate compounds such as BaTiSi 3 O 9 can also be used as semiconductor accelerators. In addition, in the above example, PbTiO 3 is added to control the point at which the resistance value of the PTC ceramic semiconductor suddenly increases (commonly known as the Tc point), but PbTiO 3 is added instead.
It is known that SrTiO 3 , BaSnO 3 , BaZrO 3 may be added, and Y 2 O 3 may be added as a semiconductor additive.
Although it is known that oxides such as Sb, Nb, and Ce may be added (Nb, Sb, Ta, Bi, <
La, Ce, Pr, Nd, Sm, Gd, Ho>→ are rare earth elements). Therefore, these may be selected as appropriate. In summary, according to the present invention, when manufacturing a barium titanate-based positive characteristic ceramic semiconductor, 0.5 to 8.0 weight of a barium-titanium-silicate-based compound or a barium-silicate-based compound is added to the material as a semiconductor accelerator. % is added and fired, it is possible to reduce the variation in the resistivity of the PTC ceramic semiconductor and to lower the resistivity compared to the conventional case where SiO 2 is used, for example.

Claims (1)

【特許請求の範囲】[Claims] 1 チタン酸バリウム系の正特性磁器半導体を製
造するに際し、その材料に半導体化促進剤とし
て、Ba2TiSi2O8、BaTiSi2O7、およびBaSi2O5
群から選択した一種を0.5乃至8.0重量%添加し、
焼成することを特徴とする正特性磁器半導体の製
造方法。
1. When manufacturing a barium titanate - based positive characteristic ceramic semiconductor, 0.5 to 0.5 to Added 8.0% by weight,
A method for producing a positive characteristic ceramic semiconductor, which comprises firing.
JP55186258A 1980-12-26 1980-12-26 Method of producing positive temperature coefficient porcelain semiconductor Granted JPS57109301A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55186258A JPS57109301A (en) 1980-12-26 1980-12-26 Method of producing positive temperature coefficient porcelain semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186258A JPS57109301A (en) 1980-12-26 1980-12-26 Method of producing positive temperature coefficient porcelain semiconductor

Publications (2)

Publication Number Publication Date
JPS57109301A JPS57109301A (en) 1982-07-07
JPS6328323B2 true JPS6328323B2 (en) 1988-06-08

Family

ID=16185120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186258A Granted JPS57109301A (en) 1980-12-26 1980-12-26 Method of producing positive temperature coefficient porcelain semiconductor

Country Status (1)

Country Link
JP (1) JPS57109301A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4058140B2 (en) * 1997-09-05 2008-03-05 Tdk株式会社 Barium titanate semiconductor porcelain
JP4080576B2 (en) * 1997-09-05 2008-04-23 Tdk株式会社 Method for manufacturing positive characteristic semiconductor porcelain

Also Published As

Publication number Publication date
JPS57109301A (en) 1982-07-07

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