JPS63225178A - 両面回路基板検査装置 - Google Patents
両面回路基板検査装置Info
- Publication number
- JPS63225178A JPS63225178A JP62060780A JP6078087A JPS63225178A JP S63225178 A JPS63225178 A JP S63225178A JP 62060780 A JP62060780 A JP 62060780A JP 6078087 A JP6078087 A JP 6078087A JP S63225178 A JPS63225178 A JP S63225178A
- Authority
- JP
- Japan
- Prior art keywords
- board
- pin board
- pin
- pins
- connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims abstract description 143
- 238000007689 inspection Methods 0.000 claims abstract description 23
- 238000012360 testing method Methods 0.000 claims description 31
- 230000000630 rising effect Effects 0.000 abstract description 5
- 238000005452 bending Methods 0.000 description 10
- 230000035939 shock Effects 0.000 description 7
- 239000006096 absorbing agent Substances 0.000 description 6
- 239000004020 conductor Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 235000014676 Phragmites communis Nutrition 0.000 description 5
- 230000003028 elevating effect Effects 0.000 description 5
- 238000005476 soldering Methods 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62060780A JPS63225178A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62060780A JPS63225178A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63225178A true JPS63225178A (ja) | 1988-09-20 |
| JPH0468591B2 JPH0468591B2 (enrdf_load_stackoverflow) | 1992-11-02 |
Family
ID=13152145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62060780A Granted JPS63225178A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63225178A (enrdf_load_stackoverflow) |
-
1987
- 1987-03-16 JP JP62060780A patent/JPS63225178A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0468591B2 (enrdf_load_stackoverflow) | 1992-11-02 |
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