WO2023070652A1 - 一种继电器接触压降测试夹具 - Google Patents

一种继电器接触压降测试夹具 Download PDF

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Publication number
WO2023070652A1
WO2023070652A1 PCT/CN2021/127865 CN2021127865W WO2023070652A1 WO 2023070652 A1 WO2023070652 A1 WO 2023070652A1 CN 2021127865 W CN2021127865 W CN 2021127865W WO 2023070652 A1 WO2023070652 A1 WO 2023070652A1
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Prior art keywords
test
buffer
voltage drop
relay contact
contact voltage
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PCT/CN2021/127865
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English (en)
French (fr)
Inventor
饶云飞
苗建峰
彭贵斌
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湖南三易精工科技有限公司
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Priority to PCT/CN2021/127865 priority Critical patent/WO2023070652A1/zh
Publication of WO2023070652A1 publication Critical patent/WO2023070652A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers

Definitions

  • the invention relates to the technical field of voltage drop testing equipment, in particular to a relay contact voltage drop testing fixture.
  • Solid State Relay (SOLIDSTATERELAYS, hereinafter abbreviated as "SSR") is a new type of non-contact switching device composed of solid-state electronic components, which utilizes the switching characteristics of electronic components (such as switching transistors, triacs, etc. , It can achieve the purpose of connecting and disconnecting the circuit without contact and spark, so it is also called “contactless switch”.
  • Solid state relay is a four-terminal active device, two of which are input control terminals, and the other two are output controlled terminals. It has both amplifying and driving functions and isolating functions. It is very suitable for driving high-power switching actuators , Compared with the electromagnetic relay, the reliability is higher, and it has no contact, long life, fast speed, and little interference to the outside world, and has been widely used.
  • the moving block and the housing are connected by a reset device.
  • Two input conductive columns are installed on the left moving block. One end extends into the placement slot, and two output conductive posts are installed on the moving block on the right, one end of the output conductive post extends into the placement slot, and the side of the moving block away from the placement slot and the end of the rotating rod are rotationally connected by a rotating pin .
  • the present application also aims to provide a technical solution for rapid voltage drop testing of solid state relays.
  • the technical problem to be solved in the present invention is to overcome the defects of the prior art and provide a relay contact voltage drop test fixture.
  • the present invention provides the following technical solutions:
  • the invention provides a relay contact pressure drop test fixture, which includes a test base, a bracket is arranged on the test base, a mounting plate is fixedly connected to the upper end of the bracket, a cylinder is vertically arranged on the mounting plate, and the cylinder
  • the upper drive is connected with a buffer assembly
  • the buffer assembly is connected with a test board
  • a plurality of test columns are installed on the test board
  • a plurality of clamping arms are hinged on the test base along its center line.
  • the drive assembly drives the multiple clamping arms to swing toward the inner side of the test base, so that the clamping arms clamp the relay placed on the test base.
  • the buffer assembly includes a buffer column vertically fixed on the test board, and a buffer seat is drivingly connected to the cylinder, and a buffer seat is provided on the buffer seat for buffering.
  • the slots are inserted into the slots, and a buffer spring is arranged in the slots, and the buffer springs elastically abut against the buffer posts and drive the buffer posts to move downward.
  • one end of the buffer column inserted into the slot is provided with a positioning pin
  • the buffer seat is provided with a hole for the positioning pin to be inserted and can slide freely up and down. waist hole.
  • the drive assembly includes a floating plate, the test base is provided with an installation space for the floating plate to be installed, and the floating plate is vertically provided with a plurality of push rods , the upper end of the ejector rod protrudes above the test base, a plurality of hinge rods are hinged on the floating plate, a swing arm is provided on the clamping arm, and the lower end of the swing arm is hinged to the upper end of the hinge rod.
  • the surface of the clamp arm is coated with a rubber layer.
  • a guide column is vertically provided in the installation space, and a through hole for the guide column to pass through is opened on the floating plate, and a reset device is set on the guide column.
  • the spring, the two ends of the return spring in the elastic force direction respectively elastically resist the floating plate and the inner bottom wall of the installation space.
  • a sliding sleeve is embedded on the floating plate, and the sliding sleeve is fitted on the guide column and can slide freely up and down.
  • the beneficial effect of the present invention is that the test board is driven downward by the cylinder to make the test column contact with the contacts on the relay, thereby replacing the current test method by wiring, and improving the efficiency of the test operation.
  • Efficiency in addition, through the downward movement of the test board, and the swing of the clamping arm driven by the drive component, so that multiple clamping arms clamp the relay together, so that the relay will not move by itself during the detection operation, which improves the accuracy of the test.
  • the test plate moves to realize the swing of the clamping arm, which is convenient to operate, and does not need to set additional driving elements, which reduces energy consumption.
  • the buffer spring is set to generate an upward elastic resistance force on the floating plate, so that in the natural state, or When the cylinder rod of the cylinder is shortened, the floating plate can move upwards, and then the clamping arm is automatically released, so that the worker can place the relay between multiple clamping arms, and after the test is completed, it is convenient for the worker to take out the relay .
  • Fig. 1 is a schematic diagram of the assembly structure of the present invention
  • Fig. 2 is the enlarged schematic view of the local structure at A place in Fig. 1;
  • FIG. 3 is an enlarged schematic diagram of the local structure at B in FIG. 1 .
  • a relay contact pressure drop test fixture includes a test base 15, a support 1 is provided on the test base 15, a mounting plate 3 is fixedly connected to the upper end of the support 1, and a cylinder is vertically provided on the mounting plate 3 2.
  • a buffer assembly is driven and connected to the cylinder 2, and a test board 6 is connected to the buffer assembly.
  • a plurality of test columns 5 are installed on the test board 6, and four clamping arms 9 are hinged on the test base 15 along its center line.
  • the drive assembly drives the four clamping arms 9 to swing toward the inner side of the test base 15, so that the clamping arms 9 clamp the relay 7 placed on the test base 15, and the relay 7 is placed on the test base 15.
  • the cylinder rod of the cylinder 2 is extended, and drives the test board 6 to move downward until the contact between the test column 5 and the relay 7
  • the drive assembly drives the four clamping arms 9 to swing in the direction of the relay 7 along the hinges with the test strip base 15, so that the clamping arms 9 clamp together
  • the relay 7 is tight so that the relay 7 will not move by itself during the detection process, which ensures the accuracy of the test process.
  • the test board 6 is buffered by the buffer component, so that the test column 5 is in contact with the contact of the relay 7. , will not produce a large force, avoiding a large extrusion force on the contact and causing damage to the contact.
  • the buffer assembly includes a buffer column 17 vertically fixed on the test board 6, and the buffer seat 4 is driven and connected to the cylinder 2, and the buffer seat 4 is provided with a slot 19 for the insertion of the buffer column 17.
  • a buffer spring 16 is arranged in the groove 19, and the buffer spring 16 elastically pushes against the buffer column 17 and drives the buffer column 17 to move downward. At this time, the buffer spring 16 elastically resists the buffer column 17, so that the buffer column 17 can have an elastic buffer, so as to prevent the test column 5 from causing a large extrusion force on the contact.
  • one end of the buffer column 17 inserted into the slot 19 is provided with a positioning pin 18, and the buffer seat 4 is provided with a waist-shaped hole 20 for inserting the positioning pin 18 and can slide freely up and down.
  • the pin 18 slides and is limited in the waist-shaped hole 20, so that the up and down movement of the buffer column 17 is limited, and the test column 5 can be prevented from rotating by itself.
  • the drive assembly includes a floating plate 13, and the test base 15 is provided with an installation space 12 for the installation of the floating plate 13.
  • the floating plate 13 is vertically provided with a plurality of push rods 8, and the upper ends of the push rods 8 protrude to the test base.
  • four hinge rods 11 are hinged on the floating plate 13, and the clamping arm 9 is provided with a swing arm 10, and the lower end of the swing arm 10 is hinged with the upper end of the hinge rod 11.
  • the hinge rod 11 will pull the swing arm 10 to swing downward, and then drive the clamping arm 9 clamping relay 7.
  • the surface of the clamping arm 9 is coated with a rubber layer.
  • a rubber layer By providing the rubber layer, excessive pressing force of the clamping arm 9 on the surface of the relay 7 can be avoided, resulting in damage to the surface of the relay 7 .
  • a guide column 14 is vertically arranged in the installation space 12, and a through hole for the guide column 14 to pass freely is provided on the floating plate 13.
  • a return spring 21 is set on the guide column 14, and the two ends of the return spring 21 in the elastic direction Respectively elastically resist the floating plate 13 and the inner bottom wall of the installation space 12. During the downward movement of the floating plate 13, the return spring 21 will be compressed. When the test plate 6 moves upward, the return spring 21 will turn from a compressed state to an extended state. In the long state, the floating plate 13 is moved upwards, so that the swing arm can swing upwards, so that the clamping arm 9 is automatically released, and the structure is simple and no manual operation is required.
  • a sliding sleeve 22 is embedded on the floating plate 13.
  • the sliding sleeve 22 is set on the guide column 14 and can slide freely up and down. By setting the sliding sleeve 22 to slide on the guide column 14, the floating plate 13 is The mechanical wear of the guide post 14 is low.
  • the relay 7 is placed on the test base 15, and the relay 7 is located between the four clamping arms 9, and then the cylinder 2 is operated, the cylinder rod of the cylinder 2 is extended, and the test board 6 is driven to move downward, The test can be carried out until the contact of the test column 5 and the relay 7, and then the test can be carried out.
  • the floating plate 13 will compress the return spring 21 during the downward movement process, and when the test plate 6 moves upward, the return spring 21 will change from the compressed state to the stretched state, and then make the The floating plate 13 moves upwards, so that the swing arm can swing upwards, so that the clamping arm 9 is automatically released.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

一种继电器接触压降测试夹具，包括测试底座（15）、支架（1）、安装板（3）、气缸（2）、缓冲组件、测试板（6），测试板（6）上安装有多个测试柱（5），测试底座（15）上沿其中心线阵列铰接有多个夹紧臂（9），测试板（6）朝下移动时，由驱动组件驱动多个夹紧臂（9）朝测试底座（15）内侧方向摆动，进而使夹紧臂（9）夹紧放置在测试底座（15）上的继电器（7）。

Description

一种继电器接触压降测试夹具 技术领域
本发明涉及压降测试设备技术领域，具体为一种继电器接触压降测试夹具。
背景技术
固态继电器(SOLIDSTATERELAYS,以下简写成“SSR”),是一种全部由固态电子元件组成的新型无触点开关器件,它利用电子元件(如开关三极管、双向可控硅等半导体器件)的开关特性,可达到无触点无火花地接通和断开电路的目的,因此又被称为“无触点开关”。固态继电器是一种四端有源器件,其中两个端子为输入控制端,另外两端为输出受控端，它既有放大驱动作用,又有隔离作用,很适合驱动大功率开关式执行机构,较之电磁继电器可靠性更高,且无触点、寿命长、速度快,对外界的干扰也小,已被得到广泛应用。
固态继电器在供货出厂前需要测试重要指标：接触电压降，传统的测试过程是通过使用四根线分别接线输入“+”“-”极，输出“+”“-”极，测试结束后再卸载，继续装载下一只产品，如此循环往复，每只产品测试耗时较长，严重的影响了产品的供货周期，间接的提高了产品的成本。经检索，中国专利公开号CN209446635U公开了一种继电器接触压降测试夹具，包括壳体，所述壳体的上表面开设有放置槽，放置槽的左右两端均开设有导向滑槽，两个导向滑槽均与外部连通，两个导向滑槽分别与两个移动块滑动连接，移动块和壳体通过复位装置连接，左侧的移动块上安装有两个输入导电柱，输入导电柱的一端延伸至放置槽内，右侧的移动块上安装有两个输出导电柱，输出导电柱的一端延伸至放置槽内，移动块远离放置槽的侧面和转动杆的一端通过转动销轴转动连接。
本申请也旨在提供一种用于对固态继电器进行快速压降测试的技术方案。
为解决上述问题，因此我们提出一种继电器接触压降测试夹具。
发明内容
本发明要解决的技术问题是克服现有技术的缺陷，提供一种继电器接触压降测试夹具，为了解决上述技术问题，本发明提供了如下的技术方案：
本发明提供了一种继电器接触压降测试夹具，包括测试底座，所述测试底座上设有一支架，所述支架上端固接有安装板，所述安装板上竖直设有气缸，所述气缸上驱动连接有缓冲组件，所述缓冲组件上连接有测试板，所述测试板上安装有多个测试柱，所述测试底座上沿其中心线阵列铰接有多个夹紧臂，所述测试板朝下移动时，由驱动组件驱动多个所述夹紧臂朝测试底座内侧方向摆动，进而使所述夹紧臂夹紧放置在测试底座上的继电器。
如上所述的一种继电器接触压降测试夹具中，所述缓冲组件包括竖直固接在测试板上的缓冲柱，所述气缸上驱动连接有缓冲座，所述缓冲座上开设有供缓冲柱插合的插槽，所述插槽内设有缓冲弹簧，所述缓冲弹簧弹性抵顶缓冲柱且驱动缓冲柱朝下移动。
如上所述的一种继电器接触压降测试夹具中，所述缓冲柱穿入插槽内的一端穿设有定位销，所述缓冲座上开设有供定位销插合的、且能上下自由滑动的腰形孔。
如上所述的一种继电器接触压降测试夹具中，所述驱动组件包括浮动板，所述测试底座上设有供浮动板安装的安装空间，所述浮动板上竖直设有多个顶杆，所述顶杆上端突出至测试底座上方，所述浮动板上铰接有多个铰链杆，所述夹紧臂上设有摆动臂，所述摆动臂下端与铰链杆上端铰接。
如上所述的一种继电器接触压降测试夹具中，所述夹紧臂表面涂覆有橡胶层。
如上所述的一种继电器接触压降测试夹具中，所述安装空间内竖直设有一导向柱，所述浮动板上开设有供导向柱自由通过的通孔，所述导向柱上套装有 复位弹簧，所述复位弹簧弹力方向两端分别弹性抵顶浮动板及安装空间内底壁。
如上所述的一种继电器接触压降测试夹具中，所述浮动板上嵌装有滑套，所述滑套套装在导向柱上且能上下自由滑动。
与现有技术相比，本发明的有益效果是：通过气缸驱动测试板朝下移动，使得测试柱能够与继电器上的触点接触，从而取代目前通过接线来测试的方式，提升了检测作业的效率，另外通过测试板朝下移动，并由驱动组件驱动夹紧臂摆动，使得多个夹紧臂共同夹紧继电器，使得检测作业时，继电器不会产生自行移动，提高测试的精度，另外通过测试板移动来实现夹紧臂的摆动，操作便捷，且无需设置额外的驱动元件，降低了能耗，另外通过设置缓冲弹簧对浮动板产生朝上的弹性抵顶力，使得自然状态下，或者说气缸的气缸杆缩短状态时，浮动板能够朝上移动，进而使夹紧臂自动松夹，以便工人将继电器放置在多个夹紧臂之间，且能在测试完毕后，便于工人取出继电器。
附图说明
附图用来提供对本发明的进一步理解，并且构成说明书的一部分，与本发明的实施例一起用于解释本发明，并不构成对本发明的限制。在附图中：
图1为本发明的总装结构示意图；
图2为图1中A处局部结构的放大示意图；
图3为图1中B处局部结构的放大示意图。
图中：1-支架，2-气缸，3-安装板，4-缓冲座，5-测试柱，6-测试板，7-继电器，8-顶杆，9-夹紧臂，10-摆动臂，11-铰链杆，12-安装空间，13-浮动板，14-导向柱，15-测试底座，16-缓冲弹簧，17-缓冲柱，18-定位销，19-插槽，20-腰形孔，21-复位弹簧，22-滑套。
具体实施方式
以下结合附图对本发明的优选实施例进行说明，应当理解，此处所描述的优选实施例仅用于说明和解释本发明，并不用于限定本发明。
实施例
如图1-3所示，一种继电器接触压降测试夹具，包括测试底座15，测试底座15上设有一支架1，支架1上端固接有安装板3，安装板3上竖直设有气缸2，气缸2上驱动连接有缓冲组件，缓冲组件上连接有测试板6，测试板6上安装有多个测试柱5，测试底座15上沿其中心线阵列铰接有四个夹紧臂9，测试板6朝下移动时，由驱动组件驱动四个夹紧臂9朝测试底座15内侧方向摆动，进而使夹紧臂9夹紧放置在测试底座15上的继电器7，将继电器7放置在测试底座15上，且继电器7位于四个夹紧臂9之间，再通过气缸2动作，气缸2的气缸杆伸长，并驱动测试板6朝下移动，直至测试柱5与继电器7的触点相抵，进而可进行测试，另外测试板6朝下移动过程中，由驱动组件带动四个夹紧臂9沿与测试带底座15的铰接处朝继电器7的方向摆动，使得夹紧臂9共同夹紧继电器7，使得继电器7在检测过程中不会产生自行移动的现象，保证了测试过程中的精度，另外通过缓冲组件对测试板6进行缓冲，使得测试柱5在接触继电器7的触点时，不会产生较大的作用力，避免对触点产生较大挤压力而导致触点损坏。
本实施例中，缓冲组件包括竖直固接在测试板6上的缓冲柱17，气缸2上驱动连接有缓冲座4，缓冲座4上开设有供缓冲柱17插合的插槽19，插槽19内设有缓冲弹簧16，缓冲弹簧16弹性抵顶缓冲柱17且驱动缓冲柱17朝下移动，当测试柱5与继电器7的触点接触时，触点对测试柱5产生反向的作用力，此时通过缓冲弹簧16对缓冲柱17产生弹性抵顶，使得缓冲柱17能够具有弹性缓冲，避免测试柱5对触点造成较大的挤压力。
本实施例中，缓冲柱17穿入插槽19内的一端穿设有定位销18，缓冲座4上开设有供定位销18插合的、且能上下自由滑动的腰形孔20，通过定位销18在腰形孔20内滑动并限位，使得缓冲柱17的上下移动具有限位，且能避免测试柱5产生自行转动。
本实施例中，驱动组件包括浮动板13，测试底座15上设有供浮动板13安装的安装空间12，浮动板13上竖直设有多个顶杆8，顶杆8上端突出至测试底 座15上方，浮动板13上铰接有四个铰链杆11，夹紧臂9上设有摆动臂10，摆动臂10下端与铰链杆11上端铰接，测试板6朝下移动时，测试板6底面将与顶杆8上端接触，并带动顶杆8朝下移动，使得浮动板13朝下移动，浮动板13朝下移动过程中，将由铰链杆11拉动摆动臂10朝下摆动，进而带动夹紧臂9夹紧继电器7。
本实施例中，夹紧臂9表面涂覆有橡胶层，通过设置橡胶层，能够避免夹紧臂9对继电器7表面挤压力过大，而导致对继电器7表面产生损伤。
本实施例中，安装空间12内竖直设有一导向柱14，浮动板13上开设有供导向柱14自由通过的通孔，导向柱14上套装有复位弹簧21，复位弹簧21弹力方向两端分别弹性抵顶浮动板13及安装空间12内底壁，浮动板13朝下移动过程中，将对复位弹簧21产生压缩，当测试板6朝上移动时，复位弹簧21将由压缩状态转为伸长状态，进而使浮动板13朝上移动，使得摆动臂能够朝上摆动，使得夹紧臂9自动松夹，结构简单且无需人工操作。
本实施例中，浮动板13上嵌装有滑套22，滑套22套装在导向柱14上且能上下自由滑动，通过设置滑套22在导向柱14上滑动，进而使浮动板13所受导向柱14的机械磨损较小。
具体实施时：将继电器7放置在测试底座15上，且继电器7位于四个夹紧臂9之间，再通过气缸2动作，气缸2的气缸杆伸长，并驱动测试板6朝下移动，直至测试柱5与继电器7的触点相抵，进而可进行测试，另外测试板6朝下移动时，测试板6底面将与顶杆8上端接触，并带动顶杆8朝下移动，使得浮动板13朝下移动，浮动板13朝下移动过程中，将由铰链杆11拉动摆动臂10朝下摆动，进而带动夹紧臂9夹紧继电器7，使得继电器7在检测过程中不会产生自行移动的现象，保证了测试过程中的精度，浮动板13朝下移动过程中，将对复位弹簧21产生压缩，当测试板6朝上移动时，复位弹簧21将由压缩状态转为伸长状态，进而使浮动板13朝上移动，使得摆动臂能够朝上摆动，使得夹紧臂9自动松夹。
最后应说明的是：以上所述仅为本发明的优选实施例而已，并不用于限制本发明，尽管参照前述实施例对本发明进行了详细的说明，对于本领域的技术人员来说，其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换。凡在本发明的精神和原则之内，所作的任何修改、等同替换、改进等，均应包含在本发明的保护范围之内。

Claims (7)

  1. 一种继电器接触压降测试夹具，包括测试底座(15)，其特征在于，所述测试底座(15)上设有一支架(1)，所述支架(1)上端固接有安装板(3)，所述安装板(3)上竖直设有气缸(2)，所述气缸(2)上驱动连接有缓冲组件，所述缓冲组件上连接有测试板(6)，所述测试板(6)上安装有多个测试柱(5)，所述测试底座(15)上沿其中心线阵列铰接有多个夹紧臂(9)，所述测试板(6)朝下移动时，由驱动组件驱动多个所述夹紧臂(9)朝测试底座(15)内侧方向摆动，进而使所述夹紧臂(9)夹紧放置在测试底座(15)上的继电器(7)。
  2. 如权利要求1所述的一种继电器接触压降测试夹具，其特征在于，所述缓冲组件包括竖直固接在测试板(6)上的缓冲柱(17)，所述气缸(2)上驱动连接有缓冲座(4)，所述缓冲座(4)上开设有供缓冲柱(17)插合的插槽(19)，所述插槽(19)内设有缓冲弹簧(16)，所述缓冲弹簧(16)弹性抵顶缓冲柱(17)且驱动缓冲柱(17)朝下移动。
  3. 如权利要求2所述的一种继电器接触压降测试夹具，其特征在于，所述缓冲柱(17)穿入插槽(19)内的一端穿设有定位销(18)，所述缓冲座(4)上开设有供定位销(18)插合的、且能上下自由滑动的腰形孔(20)。
  4. 如权利要求1所述的一种继电器接触压降测试夹具，其特征在于，所述驱动组件包括浮动板(13)，所述测试底座(15)上设有供浮动板(13)安装的安装空间(12)，所述浮动板(13)上竖直设有多个顶杆(8)，所述顶杆(8)上端突出至测试底座(15)上方，所述浮动板(13)上铰接有多个铰链杆(11)，所述夹紧臂(9)上设有摆动臂(10)，所述摆动臂(10)下端与铰链杆(11)上端铰接。
  5. 如权利要求4所述的一种继电器接触压降测试夹具，其特征在于，所述夹紧臂(9)表面涂覆有橡胶层。
  6. 如权利要求4所述的一种继电器接触压降测试夹具，其特征在于，所述安装空间(12)内竖直设有一导向柱(14)，所述浮动板(13)上开设有供导向柱(14)自由通过的通孔，所述导向柱(14)上套装有复位弹簧(21)，所述复位弹簧(21)弹力方向两端分别弹性抵顶浮动板(13)及安装空间(12)内底壁。
  7. 如权利要求6所述的一种继电器接触压降测试夹具，其特征在于，所述浮动板(13)上嵌装有滑套(22)，所述滑套(22)套装在导向柱(14)上且能上下自由滑动。
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