JPS6322400B2 - - Google Patents

Info

Publication number
JPS6322400B2
JPS6322400B2 JP15129183A JP15129183A JPS6322400B2 JP S6322400 B2 JPS6322400 B2 JP S6322400B2 JP 15129183 A JP15129183 A JP 15129183A JP 15129183 A JP15129183 A JP 15129183A JP S6322400 B2 JPS6322400 B2 JP S6322400B2
Authority
JP
Japan
Prior art keywords
current
voltage
memory cell
test
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15129183A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5952500A (ja
Inventor
Toshitaka Fukushima
Kazumi Koyama
Koji Ueno
Tamio Myamura
Juichi Kawabata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58151291A priority Critical patent/JPS5952500A/ja
Publication of JPS5952500A publication Critical patent/JPS5952500A/ja
Publication of JPS6322400B2 publication Critical patent/JPS6322400B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
JP58151291A 1983-08-19 1983-08-19 半導体記憶装置 Granted JPS5952500A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58151291A JPS5952500A (ja) 1983-08-19 1983-08-19 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58151291A JPS5952500A (ja) 1983-08-19 1983-08-19 半導体記憶装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP53146299A Division JPS59919B2 (ja) 1978-11-25 1978-11-27 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS5952500A JPS5952500A (ja) 1984-03-27
JPS6322400B2 true JPS6322400B2 (enrdf_load_stackoverflow) 1988-05-11

Family

ID=15515467

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58151291A Granted JPS5952500A (ja) 1983-08-19 1983-08-19 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS5952500A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4088143B2 (ja) * 2002-11-28 2008-05-21 シャープ株式会社 不揮発性半導体記憶装置及び行線短絡不良検出方法

Also Published As

Publication number Publication date
JPS5952500A (ja) 1984-03-27

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