JPS63201571A - 配線試験方式 - Google Patents

配線試験方式

Info

Publication number
JPS63201571A
JPS63201571A JP62033438A JP3343887A JPS63201571A JP S63201571 A JPS63201571 A JP S63201571A JP 62033438 A JP62033438 A JP 62033438A JP 3343887 A JP3343887 A JP 3343887A JP S63201571 A JPS63201571 A JP S63201571A
Authority
JP
Japan
Prior art keywords
continuity
wiring
test
failure
measurement points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62033438A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0520700B2 (enExample
Inventor
Takeo Ogawa
小川 武男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62033438A priority Critical patent/JPS63201571A/ja
Publication of JPS63201571A publication Critical patent/JPS63201571A/ja
Publication of JPH0520700B2 publication Critical patent/JPH0520700B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP62033438A 1987-02-18 1987-02-18 配線試験方式 Granted JPS63201571A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62033438A JPS63201571A (ja) 1987-02-18 1987-02-18 配線試験方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62033438A JPS63201571A (ja) 1987-02-18 1987-02-18 配線試験方式

Publications (2)

Publication Number Publication Date
JPS63201571A true JPS63201571A (ja) 1988-08-19
JPH0520700B2 JPH0520700B2 (enExample) 1993-03-22

Family

ID=12386540

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62033438A Granted JPS63201571A (ja) 1987-02-18 1987-02-18 配線試験方式

Country Status (1)

Country Link
JP (1) JPS63201571A (enExample)

Also Published As

Publication number Publication date
JPH0520700B2 (enExample) 1993-03-22

Similar Documents

Publication Publication Date Title
EP0021562A1 (en) Method of detecting an electrical short
JP4068248B2 (ja) 基板の絶縁検査装置及びその絶縁検査方法
US4342959A (en) Method of electrical short testing and the like
JPH0520700B2 (enExample)
JPS6223827B2 (enExample)
JP2576673B2 (ja) 液晶表示素子基板のバスラインの検査方法
JPS6171691A (ja) 分割用プリント基板の分割溝配設もれ検出方法
JP2647209B2 (ja) 電気回路の試験方法
JP3361982B2 (ja) 複数の端子を有する基板等の検査装置および検査方法
JPS6122268A (ja) プリント基板検査機
JPH03211481A (ja) Lsiテスト回路
JPH04128661A (ja) 線路ディレイ試験装置
JPS638432B2 (enExample)
JPS6195256A (ja) 回路基板
KR100311010B1 (ko) 집적회로소자들의 검사방법
JPH043642A (ja) ボタン電話装置
KR100445795B1 (ko) 반도체 칩 테스트 장치
JPS6033064A (ja) パターン検査装置の自己診断方法
JPH03201450A (ja) 半導体試験装置
JPH05322955A (ja) プリント配線板の検査方法
JPH0548864B2 (enExample)
JPS636471A (ja) 論理集積回路
JPH09304485A (ja) ブリッジ検出方法及びブリッジ検出回路
JPH04105077A (ja) Lsi回路方式
JPH03295480A (ja) Icの検査行列作成方法ならびにicの検査行列作成装置