JPS63193842U - - Google Patents
Info
- Publication number
- JPS63193842U JPS63193842U JP8441287U JP8441287U JPS63193842U JP S63193842 U JPS63193842 U JP S63193842U JP 8441287 U JP8441287 U JP 8441287U JP 8441287 U JP8441287 U JP 8441287U JP S63193842 U JPS63193842 U JP S63193842U
- Authority
- JP
- Japan
- Prior art keywords
- light
- sample
- light beam
- sample stage
- branching device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8441287U JPS63193842U (enExample) | 1987-05-30 | 1987-05-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8441287U JPS63193842U (enExample) | 1987-05-30 | 1987-05-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63193842U true JPS63193842U (enExample) | 1988-12-14 |
Family
ID=30938888
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8441287U Pending JPS63193842U (enExample) | 1987-05-30 | 1987-05-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63193842U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20130005227A (ko) * | 2011-07-05 | 2013-01-15 | 가부시기가이샤 디스코 | 사파이어 기판의 가공 방법 |
-
1987
- 1987-05-30 JP JP8441287U patent/JPS63193842U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20130005227A (ko) * | 2011-07-05 | 2013-01-15 | 가부시기가이샤 디스코 | 사파이어 기판의 가공 방법 |
| KR101876578B1 (ko) * | 2011-07-05 | 2018-07-09 | 가부시기가이샤 디스코 | 사파이어 기판의 가공 방법 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0888170A (ja) | 標的の位置及び傾斜の制御装置 | |
| NO173033C (no) | Optikk for maaling av krummingsvariasjon | |
| JPH07182666A (ja) | 光ピックアップシステム | |
| JPS63126812U (enExample) | ||
| JPH049525Y2 (enExample) | ||
| JPS63106034U (enExample) | ||
| JPS6134117U (ja) | 距離検出装置における投光光学系 | |
| JPH0271211U (enExample) | ||
| JPS60102606U (ja) | 光点位置測定装置 | |
| JPS6138506A (ja) | 干渉計測機におけるフオ−カシングポイント判別方法 | |
| JPH02106853U (enExample) | ||
| JPS6164228A (ja) | 眼科機器用位置合わせ装置 | |
| JPS61132530U (enExample) | ||
| JPH02140628U (enExample) | ||
| JPH01104507U (enExample) | ||
| JPH02117719U (enExample) | ||
| JPH0465962B2 (enExample) | ||
| JPH01157423U (enExample) | ||
| JPS626988U (enExample) | ||
| JPH0634364A (ja) | 表面変位計 | |
| JPS6035243U (ja) | 半導体レ−ザの非点隔差測定装置 | |
| JPS62113419U (enExample) | ||
| JPS58109055U (ja) | 面板欠陥検査装置 | |
| JPH0236813U (enExample) | ||
| JPS63188507U (enExample) |