JPS63193554A - Gaas semiconductor integrated circuit - Google Patents
Gaas semiconductor integrated circuitInfo
- Publication number
- JPS63193554A JPS63193554A JP2660787A JP2660787A JPS63193554A JP S63193554 A JPS63193554 A JP S63193554A JP 2660787 A JP2660787 A JP 2660787A JP 2660787 A JP2660787 A JP 2660787A JP S63193554 A JPS63193554 A JP S63193554A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- bypass capacitor
- wirings
- wiring
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 9
- 239000003990 capacitor Substances 0.000 claims abstract description 18
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 8
- 230000004888 barrier function Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はGaAs半導体集積回路に関し、特にバイパス
コンデンサを必要とするGaAs半導体集積回路に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a GaAs semiconductor integrated circuit, and particularly to a GaAs semiconductor integrated circuit that requires a bypass capacitor.
従来、この種のGaAs半導体集積回路は、バイパスコ
ンデンサを必要とする場合、第3図に示すように、層を
なす直流電源配線4及び5にそれぞれ接続される導体層
を両電極とする独自のスペースを用いた平行平板型のバ
イパスコンデンサ8を形成して用いるか、又はショット
キー障壁型ダイオードに逆バイアスをかけることにより
コンデンサとして利用していた。Conventionally, when this type of GaAs semiconductor integrated circuit requires a bypass capacitor, as shown in FIG. A bypass capacitor 8 of a parallel plate type using a space is formed and used, or a Schottky barrier diode is used as a capacitor by applying a reverse bias.
上述した従来のGaAs半導体集積回路は、バイパスコ
ンデンサ形成のための独自のスペースが必要となってい
る7例えば、第3図において、2pFの要領を形成する
のに誘電体に5i02を厚さ300nm用いた場合、1
4000μm2のスペースが必要となり集積回路のチッ
プサイズが大きくなるという欠点がある。The conventional GaAs semiconductor integrated circuit described above requires its own space for forming a bypass capacitor. If so, 1
There is a drawback that a space of 4000 μm 2 is required, which increases the chip size of the integrated circuit.
又、ショットキー障壁型ダイオードを利用したコンデン
サの場合は、活性層濃度にもよるが、通常使用される濃
度(2X 10’ 7/crs3)の場合、約1600
μm2のスペースが必要となり、バイパスコンデンサに
比べ1/8以下のスペースですむが逆耐圧による印加電
圧の制限があるという欠点がある。In addition, in the case of a capacitor using a Schottky barrier diode, it depends on the concentration of the active layer, but in the case of the normally used concentration (2X 10'7/crs3), it is about 1600
Although it requires a space of μm2, which is less than 1/8 of the space required for a bypass capacitor, it has the disadvantage that the applied voltage is limited by the reverse withstand voltage.
本発明のG a A s半導体集積回路は、少なくとも
2層の直流電源配線の層間に誘電体をはさんで重ね合せ
、対向する2枚の前記直流電源配線の重なり合う領域を
それぞれの電極とする平行平板型のバイパスコンデンサ
を形成している。In the GaAs semiconductor integrated circuit of the present invention, at least two layers of DC power supply wiring are stacked with a dielectric material interposed between the layers, and the overlapping regions of the two opposing DC power supply wirings are used as respective electrodes. Forms a flat plate bypass capacitor.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の第1の実施例の平面図である。FIG. 1 is a plan view of a first embodiment of the invention.
第1図に示すように、直流電源配線1と、1部が直流電
源配線1と重なるように設けられた直流電源配線2とか
ら成る2層の配線の層間に誘電体層を形成している。As shown in FIG. 1, a dielectric layer is formed between two layers of wiring consisting of a DC power supply wiring 1 and a DC power supply wiring 2 provided so that a portion thereof overlaps with the DC power supply wiring 1. .
このように構成することにより、両配線の重なり部分が
直流電源配線1及び2を両電極とする平行平板型のバイ
パスコンデンサ6となる。With this configuration, the overlapping portion of both wirings becomes a parallel plate type bypass capacitor 6 in which the DC power supply wirings 1 and 2 serve as both electrodes.
第2図は本発明の第2の実施例の平面図である。FIG. 2 is a plan view of a second embodiment of the invention.
第2図に示すように、第2の実施例は上述した第1の実
施例に更に直流電源配線3を設けて3層としそれぞれの
配線層間に誘電体層を形成し、直流電源配線1と2及び
直流電源配線2と3のそれぞれの重なり部分にバイパス
コンデンサ6及び7を形成している。As shown in FIG. 2, in the second embodiment, a DC power supply wiring 3 is further added to the first embodiment described above to form three layers, with a dielectric layer formed between each wiring layer, and the DC power supply wiring 1 and Bypass capacitors 6 and 7 are formed at the overlapping portions of DC power supply wirings 2 and 3, respectively.
以上説明したように、本発明のGaAs半導体集積回路
は、配線の一部をバイパスコンデンサとして使用するこ
とにより、あえて、バイパスコンデンサ形成のための別
のスペースを確保する必要がなくなるので、集積回路の
素子サイズと小さくできるという効果がある。As explained above, in the GaAs semiconductor integrated circuit of the present invention, by using a part of the wiring as a bypass capacitor, there is no need to intentionally secure a separate space for forming the bypass capacitor. This has the effect of reducing the element size.
第1図及び第2図はそれぞれ本発明の第1及び第2の実
施例の平面図、第3図は従来のGaAs半導体集積回路
の一例の平面図である。
1〜5・・・直流電源配線、6〜8・・・バイパスコン
デンサ。
半 I 国
芽 2 凹1 and 2 are plan views of first and second embodiments of the present invention, respectively, and FIG. 3 is a plan view of an example of a conventional GaAs semiconductor integrated circuit. 1-5...DC power supply wiring, 6-8...Bypass capacitor. Half I Kunime 2 Concave
Claims (1)
で重ね合せ、対向する2枚の前記直流電源配線の重なり
合う領域をそれぞれの電極とする平行平板型のバイパス
コンデンサを形成することを特徴とするGaAs半導体
集積回路。A parallel plate type bypass capacitor is formed by stacking at least two layers of DC power wiring with a dielectric interposed between the layers, and using the overlapping regions of the two opposing DC power wiring as respective electrodes. GaAs semiconductor integrated circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2660787A JPS63193554A (en) | 1987-02-06 | 1987-02-06 | Gaas semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2660787A JPS63193554A (en) | 1987-02-06 | 1987-02-06 | Gaas semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63193554A true JPS63193554A (en) | 1988-08-10 |
Family
ID=12198189
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2660787A Pending JPS63193554A (en) | 1987-02-06 | 1987-02-06 | Gaas semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63193554A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5508881A (en) * | 1994-02-01 | 1996-04-16 | Quality Microcircuits Corporation | Capacitors and interconnect lines for use with integrated circuits |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61218155A (en) * | 1985-03-25 | 1986-09-27 | Hitachi Ltd | Semiconductor integrated circuit device |
-
1987
- 1987-02-06 JP JP2660787A patent/JPS63193554A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61218155A (en) * | 1985-03-25 | 1986-09-27 | Hitachi Ltd | Semiconductor integrated circuit device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5508881A (en) * | 1994-02-01 | 1996-04-16 | Quality Microcircuits Corporation | Capacitors and interconnect lines for use with integrated circuits |
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