JPS63193554A - Gaas semiconductor integrated circuit - Google Patents

Gaas semiconductor integrated circuit

Info

Publication number
JPS63193554A
JPS63193554A JP2660787A JP2660787A JPS63193554A JP S63193554 A JPS63193554 A JP S63193554A JP 2660787 A JP2660787 A JP 2660787A JP 2660787 A JP2660787 A JP 2660787A JP S63193554 A JPS63193554 A JP S63193554A
Authority
JP
Japan
Prior art keywords
integrated circuit
bypass capacitor
wirings
wiring
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2660787A
Other languages
Japanese (ja)
Inventor
Kenji Fujita
健二 藤田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2660787A priority Critical patent/JPS63193554A/en
Publication of JPS63193554A publication Critical patent/JPS63193554A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0688Integrated circuits having a three-dimensional layout

Abstract

PURPOSE:To reduce the size of the element of an integrated circuit, by using part of wirings as a bypass capacitor, thereby omitting another space for forming the bypass capacitor. CONSTITUTION:A dielectric layer is formed between double-layer wiring layers, which comprise a DC power source wiring 1 and a DC wiring power source wiring 2 that is provided so as to overlap with the DC power source wiring 1. In this way, the overlapped parts of both wirings become a parallel plate type bypass capacitor 6, with the DC power source wirings 1 and 2 being both electrodes. Furthermore, three DC power-source wiring layers are provided, and dielectric layers are formed between the wiring layers. Thus bypass capacitors can be formed at the overlapped parts of the wirings.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はGaAs半導体集積回路に関し、特にバイパス
コンデンサを必要とするGaAs半導体集積回路に関す
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a GaAs semiconductor integrated circuit, and particularly to a GaAs semiconductor integrated circuit that requires a bypass capacitor.

〔従来の技術〕[Conventional technology]

従来、この種のGaAs半導体集積回路は、バイパスコ
ンデンサを必要とする場合、第3図に示すように、層を
なす直流電源配線4及び5にそれぞれ接続される導体層
を両電極とする独自のスペースを用いた平行平板型のバ
イパスコンデンサ8を形成して用いるか、又はショット
キー障壁型ダイオードに逆バイアスをかけることにより
コンデンサとして利用していた。
Conventionally, when this type of GaAs semiconductor integrated circuit requires a bypass capacitor, as shown in FIG. A bypass capacitor 8 of a parallel plate type using a space is formed and used, or a Schottky barrier diode is used as a capacitor by applying a reverse bias.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来のGaAs半導体集積回路は、バイパスコ
ンデンサ形成のための独自のスペースが必要となってい
る7例えば、第3図において、2pFの要領を形成する
のに誘電体に5i02を厚さ300nm用いた場合、1
4000μm2のスペースが必要となり集積回路のチッ
プサイズが大きくなるという欠点がある。
The conventional GaAs semiconductor integrated circuit described above requires its own space for forming a bypass capacitor. If so, 1
There is a drawback that a space of 4000 μm 2 is required, which increases the chip size of the integrated circuit.

又、ショットキー障壁型ダイオードを利用したコンデン
サの場合は、活性層濃度にもよるが、通常使用される濃
度(2X 10’ 7/crs3)の場合、約1600
μm2のスペースが必要となり、バイパスコンデンサに
比べ1/8以下のスペースですむが逆耐圧による印加電
圧の制限があるという欠点がある。
In addition, in the case of a capacitor using a Schottky barrier diode, it depends on the concentration of the active layer, but in the case of the normally used concentration (2X 10'7/crs3), it is about 1600
Although it requires a space of μm2, which is less than 1/8 of the space required for a bypass capacitor, it has the disadvantage that the applied voltage is limited by the reverse withstand voltage.

〔問題点を解決するための手段〕[Means for solving problems]

本発明のG a A s半導体集積回路は、少なくとも
2層の直流電源配線の層間に誘電体をはさんで重ね合せ
、対向する2枚の前記直流電源配線の重なり合う領域を
それぞれの電極とする平行平板型のバイパスコンデンサ
を形成している。
In the GaAs semiconductor integrated circuit of the present invention, at least two layers of DC power supply wiring are stacked with a dielectric material interposed between the layers, and the overlapping regions of the two opposing DC power supply wirings are used as respective electrodes. Forms a flat plate bypass capacitor.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例の平面図である。FIG. 1 is a plan view of a first embodiment of the invention.

第1図に示すように、直流電源配線1と、1部が直流電
源配線1と重なるように設けられた直流電源配線2とか
ら成る2層の配線の層間に誘電体層を形成している。
As shown in FIG. 1, a dielectric layer is formed between two layers of wiring consisting of a DC power supply wiring 1 and a DC power supply wiring 2 provided so that a portion thereof overlaps with the DC power supply wiring 1. .

このように構成することにより、両配線の重なり部分が
直流電源配線1及び2を両電極とする平行平板型のバイ
パスコンデンサ6となる。
With this configuration, the overlapping portion of both wirings becomes a parallel plate type bypass capacitor 6 in which the DC power supply wirings 1 and 2 serve as both electrodes.

第2図は本発明の第2の実施例の平面図である。FIG. 2 is a plan view of a second embodiment of the invention.

第2図に示すように、第2の実施例は上述した第1の実
施例に更に直流電源配線3を設けて3層としそれぞれの
配線層間に誘電体層を形成し、直流電源配線1と2及び
直流電源配線2と3のそれぞれの重なり部分にバイパス
コンデンサ6及び7を形成している。
As shown in FIG. 2, in the second embodiment, a DC power supply wiring 3 is further added to the first embodiment described above to form three layers, with a dielectric layer formed between each wiring layer, and the DC power supply wiring 1 and Bypass capacitors 6 and 7 are formed at the overlapping portions of DC power supply wirings 2 and 3, respectively.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明のGaAs半導体集積回路
は、配線の一部をバイパスコンデンサとして使用するこ
とにより、あえて、バイパスコンデンサ形成のための別
のスペースを確保する必要がなくなるので、集積回路の
素子サイズと小さくできるという効果がある。
As explained above, in the GaAs semiconductor integrated circuit of the present invention, by using a part of the wiring as a bypass capacitor, there is no need to intentionally secure a separate space for forming the bypass capacitor. This has the effect of reducing the element size.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図はそれぞれ本発明の第1及び第2の実
施例の平面図、第3図は従来のGaAs半導体集積回路
の一例の平面図である。 1〜5・・・直流電源配線、6〜8・・・バイパスコン
デンサ。 半 I 国 芽 2 凹
1 and 2 are plan views of first and second embodiments of the present invention, respectively, and FIG. 3 is a plan view of an example of a conventional GaAs semiconductor integrated circuit. 1-5...DC power supply wiring, 6-8...Bypass capacitor. Half I Kunime 2 Concave

Claims (1)

【特許請求の範囲】[Claims] 少なくとも2層の直流電源配線の層間に誘電体をはさん
で重ね合せ、対向する2枚の前記直流電源配線の重なり
合う領域をそれぞれの電極とする平行平板型のバイパス
コンデンサを形成することを特徴とするGaAs半導体
集積回路。
A parallel plate type bypass capacitor is formed by stacking at least two layers of DC power wiring with a dielectric interposed between the layers, and using the overlapping regions of the two opposing DC power wiring as respective electrodes. GaAs semiconductor integrated circuit.
JP2660787A 1987-02-06 1987-02-06 Gaas semiconductor integrated circuit Pending JPS63193554A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2660787A JPS63193554A (en) 1987-02-06 1987-02-06 Gaas semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2660787A JPS63193554A (en) 1987-02-06 1987-02-06 Gaas semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS63193554A true JPS63193554A (en) 1988-08-10

Family

ID=12198189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2660787A Pending JPS63193554A (en) 1987-02-06 1987-02-06 Gaas semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS63193554A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5508881A (en) * 1994-02-01 1996-04-16 Quality Microcircuits Corporation Capacitors and interconnect lines for use with integrated circuits

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61218155A (en) * 1985-03-25 1986-09-27 Hitachi Ltd Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61218155A (en) * 1985-03-25 1986-09-27 Hitachi Ltd Semiconductor integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5508881A (en) * 1994-02-01 1996-04-16 Quality Microcircuits Corporation Capacitors and interconnect lines for use with integrated circuits

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