JPS63186152A - 自動調整オシロスコープ - Google Patents

自動調整オシロスコープ

Info

Publication number
JPS63186152A
JPS63186152A JP62321174A JP32117487A JPS63186152A JP S63186152 A JPS63186152 A JP S63186152A JP 62321174 A JP62321174 A JP 62321174A JP 32117487 A JP32117487 A JP 32117487A JP S63186152 A JPS63186152 A JP S63186152A
Authority
JP
Japan
Prior art keywords
trigger
waveform
signal
main
gain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62321174A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0543993B2 (enExample
Inventor
ロナルド・ピー・オデンハイマー
キム・ハスティングス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS63186152A publication Critical patent/JPS63186152A/ja
Publication of JPH0543993B2 publication Critical patent/JPH0543993B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Control Of Amplification And Gain Control (AREA)
  • Steroid Compounds (AREA)
  • Glass Compositions (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
JP62321174A 1986-12-19 1987-12-18 自動調整オシロスコープ Granted JPS63186152A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US944,302 1986-12-19
US06/944,302 US4743844A (en) 1986-12-19 1986-12-19 Self-adjusting oscilloscope

Publications (2)

Publication Number Publication Date
JPS63186152A true JPS63186152A (ja) 1988-08-01
JPH0543993B2 JPH0543993B2 (enExample) 1993-07-05

Family

ID=25481154

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62321174A Granted JPS63186152A (ja) 1986-12-19 1987-12-18 自動調整オシロスコープ

Country Status (3)

Country Link
US (1) US4743844A (enExample)
EP (1) EP0272126A3 (enExample)
JP (1) JPS63186152A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0348772U (enExample) * 1989-09-20 1991-05-10
JP2004251903A (ja) * 2003-02-18 2004-09-09 Tektronix Japan Ltd 利得及びオフセットの自動設定方法
JP2008122285A (ja) * 2006-11-14 2008-05-29 Yokogawa Electric Corp 波形表示装置
JP2011059106A (ja) * 2009-09-04 2011-03-24 Tektronix Inc 試験測定機器及び方法
JP2012073041A (ja) * 2010-09-27 2012-04-12 Hioki Ee Corp 波形記録装置における動作条件の設定方法および波形記録装置
JP2015513727A (ja) * 2012-02-16 2015-05-14 マイクロソフト コーポレーション 記憶媒体及び処理方法

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081592A (en) * 1987-08-05 1992-01-14 Tektronix, Inc. Test system for acquiring, calculating and displaying representations of data sequences
US5029116A (en) * 1987-12-17 1991-07-02 Hitachi Automobile Appliances Sales Company, Ltd. Oscilloscope operation supporting device
US5440676A (en) * 1988-01-29 1995-08-08 Tektronix, Inc. Raster scan waveform display rasterizer with pixel intensity gradation
US5028914A (en) * 1988-06-23 1991-07-02 Motorola, Inc. Method and apparatus for waveform digitization
JPH0245767A (ja) * 1988-06-30 1990-02-15 Tektronix Inc デジタル・オシロスコープの自動調整方法
NL8802345A (nl) * 1988-09-22 1990-04-17 Philips Nv Beeldweergeefinrichting geschikt voor weergave van een oscilloscopische afbeelding op een weergeefscherm voor weergave van een lijn- en rastergewijze opgebouwd beeld.
US5214784A (en) * 1988-11-28 1993-05-25 Tektronix, Inc. Sequence of events detector for serial digital data which selectively outputs match signal in the series which defines detected sequence
US5027058A (en) * 1990-02-26 1991-06-25 Tektronix, Inc. Multi-standard video option for oscilloscope
US5184062A (en) * 1990-05-11 1993-02-02 Nicolet Instrument Corporation Dynamically calibrated trigger for oscilloscopes
US5004975A (en) * 1990-06-28 1991-04-02 Tektronix, Inc. Adjustable electronic graticules for measuring waveform distortions
US5295080A (en) * 1990-08-06 1994-03-15 Tektronix, Inc. Method of operating a buffer memory to provide a trigger pattern by storing a trigger code in preselected areas of the buffer memory
NL9001842A (nl) * 1990-08-20 1992-03-16 Philips Nv Meetinstrument en tijdbasisschakeling geschikt voor toepassing in een dergelijk meetinstrument.
US5138252A (en) * 1990-11-09 1992-08-11 Hewlett-Packard Company Automatic scaling for display of modulation domain measurements
US5155431A (en) * 1991-02-06 1992-10-13 Hewlett-Packard Company Very fast autoscale topology for digitizing oscilloscopes
NL9100409A (nl) * 1991-03-07 1992-10-01 Philips Nv Meetinstrument voor het meten van weer te geven grootheden en pulsverwerkingsinrichting geschikt voor toepassing in een dergelijk meetinstrument.
GB2259574B (en) * 1991-09-12 1995-08-30 Heme Int Ltd Measuring devices
US5375067A (en) * 1992-12-11 1994-12-20 Nicolet Instrument Corporation Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope
US5397981A (en) * 1994-02-28 1995-03-14 Fluke Corporation Digital storage oscilloscope with automatic time base
US5495168A (en) * 1994-09-12 1996-02-27 Fluke Corporation Method of signal analysis employing histograms to establish stable, scaled displays in oscilloscopes
US6263290B1 (en) 1995-02-22 2001-07-17 Michael K. Williams Process and machine for signal waveform analysis
US5929838A (en) * 1996-04-17 1999-07-27 Hewlett-Packard Company Acquisition manager and method for alternating digital oscilloscope operation between fast update rate and long record length
US5999163A (en) * 1996-11-01 1999-12-07 Tektronix, Inc. Digital oscilloscope with high live time recording of signal anomalies and method
US5978742A (en) * 1997-04-04 1999-11-02 Tektronix, Inc. Method and apparatus for digital sampling of electrical waveforms
DE19733388A1 (de) * 1997-08-01 1999-02-04 Siemens Ag Verfahren zur Einstellung einer Triggerschwelle, Anordnung zur Durchführung des Verfahrens sowie digitales Speicheroszilloskop mit einer derartigen Anordnung
US6219029B1 (en) * 1998-04-03 2001-04-17 Tektronix, Inc. Emphasizing infrequent events in a digital oscilloscope having variable intensity rasterizer and variable intensity or color display
US6232764B1 (en) * 1998-06-12 2001-05-15 Tektronix, Inc. Accessory with internal adjustments controlled by host
US6384825B2 (en) * 1998-06-25 2002-05-07 Tektronix, Inc. Method of controlling a sparse vector rasterizer
US6275257B1 (en) * 1998-10-16 2001-08-14 Tektronix, Inc. Holdoff by TV fields
US6301547B2 (en) * 1998-11-02 2001-10-09 Agilent Technologies Inc. Method and apparatus for automatically acquiring a waveform measurement
US6571185B1 (en) 1999-04-20 2003-05-27 Tektronix, Inc. Continually responsive and anticipating automatic setup function for a digital oscilloscope
US6571186B1 (en) * 1999-09-14 2003-05-27 Textronix, Inc. Method of waveform time stamping for minimizing digitization artifacts in time interval distribution measurements
US6615148B2 (en) * 2000-05-17 2003-09-02 Tektronix, Inc. Streaming distributed test and measurement instrument
US6870359B1 (en) * 2001-12-14 2005-03-22 Le Croy Corporation Self-calibrating electrical test probe
US7180314B1 (en) 2001-12-14 2007-02-20 Lecroy Corporation Self-calibrating electrical test probe calibratable while connected to an electrical component under test
JP4064129B2 (ja) * 2002-03-14 2008-03-19 リーダー電子株式会社 波形表示における波形表示位置調整装置
JP4103134B2 (ja) * 2003-02-27 2008-06-18 横河電機株式会社 波形表示装置および波形表示方法
DE102006052745A1 (de) * 2006-08-14 2008-02-21 Rohde & Schwarz Gmbh & Co. Kg Oszilloskop-Tastkopf
US8958575B2 (en) * 2007-06-29 2015-02-17 Qualcomm Incorporated Amplifier with configurable DC-coupled or AC-coupled output
WO2009026435A1 (en) * 2007-08-23 2009-02-26 Amherst Systems Associates, Inc. Waveform anomoly detection and notification systems and methods
US8190392B2 (en) * 2008-05-08 2012-05-29 Lecroy Corporation Method and apparatus for multiple trigger path triggering
US20090281758A1 (en) * 2008-05-08 2009-11-12 Lecroy Corporation Method and Apparatus for Triggering a Test and Measurement Instrument
US8386208B2 (en) * 2008-05-08 2013-02-26 Teledyne Lecroy, Inc. Method and apparatus for trigger scanning
US9699446B2 (en) * 2010-04-05 2017-07-04 Tektronix, Inc. Test and measurement device, system, and method for providing synchronized measurement views
US9157943B2 (en) * 2010-08-13 2015-10-13 Tektronix, Inc. Multi-channel frequency domain test and measurement instrument
CN103176011B (zh) * 2011-12-22 2016-09-07 北京普源精电科技有限公司 一种双触发电平的配置方法及示波器
EP2651034B1 (en) * 2012-04-12 2014-08-06 Siemens Aktiengesellschaft Method for determining a trigger level
CN103913620A (zh) * 2013-01-05 2014-07-09 鸿富锦精密工业（深圳）有限公司 电脑电源的电压测试装置及方法
CN103116053B (zh) * 2013-01-31 2015-11-04 福建利利普光电科技有限公司 一种用于测量数字存储示波器的自动量程测量方法
US10261111B1 (en) * 2016-08-12 2019-04-16 Keysight Technologies, Inc. Oscilloscope with digital search triggering
EP3404427B1 (en) * 2017-05-18 2024-11-13 Rohde & Schwarz GmbH & Co. KG Electrical test and measurement device, measurement extension device as well as test and measurement system
CN113219363B (zh) * 2021-03-25 2022-06-10 合肥联宝信息技术有限公司 一种电源噪声测试方法、装置及存储介质

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5855764A (ja) * 1981-09-08 1983-04-02 グラマン・エアロスペ−ス・コ−ポレイシヨン プログラマブル信号解析器
JPS58140473U (ja) * 1982-03-16 1983-09-21 アンリツ株式会社 陰極線管の管面目盛感度設定装置
JPS5923391A (ja) * 1982-07-29 1984-02-06 富士通株式会社 プラズマデイスプレイパネルの駆動回路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3204144A (en) * 1963-02-05 1965-08-31 California Instr Corp Oscilloscope control circuitry
US3873918A (en) * 1971-11-04 1975-03-25 Coulter Electronics Particle analyzing apparatus including a system for visually displaying a particle size distribution curve on a 100 percent scale irrespective of the quantity of particles sampled by the apparatus
US4096397A (en) * 1977-03-29 1978-06-20 Honeywell Inc. Oscillographic apparatus
CH633889A5 (de) * 1978-11-24 1982-12-31 Bbc Brown Boveri & Cie Digitalvoltmeter mit elektrooptischer anzeige der wellenform.

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5855764A (ja) * 1981-09-08 1983-04-02 グラマン・エアロスペ−ス・コ−ポレイシヨン プログラマブル信号解析器
JPS58140473U (ja) * 1982-03-16 1983-09-21 アンリツ株式会社 陰極線管の管面目盛感度設定装置
JPS5923391A (ja) * 1982-07-29 1984-02-06 富士通株式会社 プラズマデイスプレイパネルの駆動回路

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0348772U (enExample) * 1989-09-20 1991-05-10
JP2004251903A (ja) * 2003-02-18 2004-09-09 Tektronix Japan Ltd 利得及びオフセットの自動設定方法
JP2008122285A (ja) * 2006-11-14 2008-05-29 Yokogawa Electric Corp 波形表示装置
JP2011059106A (ja) * 2009-09-04 2011-03-24 Tektronix Inc 試験測定機器及び方法
JP2012073041A (ja) * 2010-09-27 2012-04-12 Hioki Ee Corp 波形記録装置における動作条件の設定方法および波形記録装置
JP2015513727A (ja) * 2012-02-16 2015-05-14 マイクロソフト コーポレーション 記憶媒体及び処理方法
US9552557B2 (en) 2012-02-16 2017-01-24 Microsoft Technology Licensing, Llc Visual representation of chart scaling

Also Published As

Publication number Publication date
EP0272126A2 (en) 1988-06-22
US4743844A (en) 1988-05-10
JPH0543993B2 (enExample) 1993-07-05
EP0272126A3 (en) 1989-11-29

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