JPS63168958A - 質量分析装置用イオン源 - Google Patents

質量分析装置用イオン源

Info

Publication number
JPS63168958A
JPS63168958A JP61311811A JP31181186A JPS63168958A JP S63168958 A JPS63168958 A JP S63168958A JP 61311811 A JP61311811 A JP 61311811A JP 31181186 A JP31181186 A JP 31181186A JP S63168958 A JPS63168958 A JP S63168958A
Authority
JP
Japan
Prior art keywords
primary particle
shield
porous member
particle beam
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61311811A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0429181B2 (en:Method
Inventor
Tsutomu Kobayashi
勉 小林
Kiichiro Otsuka
大塚　紀一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP61311811A priority Critical patent/JPS63168958A/ja
Priority to US07/136,141 priority patent/US4818863A/en
Priority to GB8729867A priority patent/GB2202671B/en
Publication of JPS63168958A publication Critical patent/JPS63168958A/ja
Publication of JPH0429181B2 publication Critical patent/JPH0429181B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP61311811A 1986-12-27 1986-12-27 質量分析装置用イオン源 Granted JPS63168958A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP61311811A JPS63168958A (ja) 1986-12-27 1986-12-27 質量分析装置用イオン源
US07/136,141 US4818863A (en) 1986-12-27 1987-12-21 Ion source for use in a mass spectrometer
GB8729867A GB2202671B (en) 1986-12-27 1987-12-22 An ion source for use in a mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61311811A JPS63168958A (ja) 1986-12-27 1986-12-27 質量分析装置用イオン源

Publications (2)

Publication Number Publication Date
JPS63168958A true JPS63168958A (ja) 1988-07-12
JPH0429181B2 JPH0429181B2 (en:Method) 1992-05-18

Family

ID=18021703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61311811A Granted JPS63168958A (ja) 1986-12-27 1986-12-27 質量分析装置用イオン源

Country Status (1)

Country Link
JP (1) JPS63168958A (en:Method)

Also Published As

Publication number Publication date
JPH0429181B2 (en:Method) 1992-05-18

Similar Documents

Publication Publication Date Title
US5663560A (en) Method and apparatus for mass analysis of solution sample
DE112012005173B4 (de) Massenspektrometervakuumschnittstellen-Verfahren und -Vorrichtung
US4296322A (en) Method for analyzing organic substances
JP2020506524A (ja) フーリエ変換質量分析計
CA3047693C (en) Inorganic and organic mass spectrometry systems and methods of using them
EP3857589A1 (de) Massenspektrometer und verfahren zur massenspektrometrischen analyse eines gases
JPH07130325A (ja) 質量分析装置
US5055678A (en) Metal surfaces for sample analyzing and ionizing apparatus
JP3300602B2 (ja) 大気圧イオン化イオントラップ質量分析方法及び装置
RU2117939C1 (ru) Спектрометр ионной подвижности
EP0771019A1 (en) Method and apparatus for mass analysis of solution sample
JPS63168958A (ja) 質量分析装置用イオン源
JPH0830695B2 (ja) 液体クロマトグラフ・質量分析装置
JPS63168957A (ja) 質量分析装置用イオン源
JPS6235255A (ja) 液体クロマトグラフ質量分析装置
JPS63266756A (ja) 質量分析装置用イオン源
US4818863A (en) Ion source for use in a mass spectrometer
JPS6322405B2 (en:Method)
JP2904460B2 (ja) 粒子線照射装置の帯電抑制装置
Kim et al. Nuclear Inst. and Methods in Physics Research, B
JP3055159B2 (ja) 中性粒子質量分析装置
JPH03187147A (ja) 質量分析装置用イオン源
JPH0432148A (ja) 質量分析装置用イオン源
JPH10112280A (ja) イオン源
JPH044353Y2 (en:Method)