JPS63143830A - ヘイズ欠陥検出方法 - Google Patents

ヘイズ欠陥検出方法

Info

Publication number
JPS63143830A
JPS63143830A JP29222686A JP29222686A JPS63143830A JP S63143830 A JPS63143830 A JP S63143830A JP 29222686 A JP29222686 A JP 29222686A JP 29222686 A JP29222686 A JP 29222686A JP S63143830 A JPS63143830 A JP S63143830A
Authority
JP
Japan
Prior art keywords
haze
light
defects
face plate
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29222686A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0317378B2 (enExample
Inventor
Izuo Hourai
泉雄 蓬莱
Kei Nara
圭 奈良
Masashi Honda
本田　正志
Hiroshi Tsuzuki
都築　広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP29222686A priority Critical patent/JPS63143830A/ja
Publication of JPS63143830A publication Critical patent/JPS63143830A/ja
Publication of JPH0317378B2 publication Critical patent/JPH0317378B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP29222686A 1986-12-08 1986-12-08 ヘイズ欠陥検出方法 Granted JPS63143830A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29222686A JPS63143830A (ja) 1986-12-08 1986-12-08 ヘイズ欠陥検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29222686A JPS63143830A (ja) 1986-12-08 1986-12-08 ヘイズ欠陥検出方法

Publications (2)

Publication Number Publication Date
JPS63143830A true JPS63143830A (ja) 1988-06-16
JPH0317378B2 JPH0317378B2 (enExample) 1991-03-07

Family

ID=17779127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29222686A Granted JPS63143830A (ja) 1986-12-08 1986-12-08 ヘイズ欠陥検出方法

Country Status (1)

Country Link
JP (1) JPS63143830A (enExample)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0274051A (ja) * 1988-09-09 1990-03-14 Fujitsu Ltd 半導体ウエハ表面のヘイズ評価法
JPH05203580A (ja) * 1991-09-04 1993-08-10 Internatl Business Mach Corp <Ibm> 検査システム装置
KR100719941B1 (ko) * 2004-12-22 2007-05-18 주식회사 피케이엘 포토마스크 표면의 헤이즈 측정장치 및 그 측정방법
KR100793085B1 (ko) 2006-12-18 2008-01-10 코닉시스템 주식회사 포토 마스크의 헤이즈 발생장치
WO2008075840A1 (en) * 2006-12-18 2008-06-26 Kornic Systems Co., Ltd. Device for generating haze on a photomask
KR100854705B1 (ko) 2005-12-14 2008-08-27 나노전광 주식회사 백색광 주사 간섭계를 이용한 포토마스크 표면의 헤이즈검출장치 및 그 검출방법
JP2009133778A (ja) * 2007-11-30 2009-06-18 Hitachi High-Technologies Corp 検査装置及び検査方法
WO2010097971A1 (ja) * 2009-02-27 2010-09-02 三菱重工業株式会社 薄膜の検査装置及び検査方法
US7791721B2 (en) 2006-07-31 2010-09-07 Hitachi High-Technologies Corporation Surface inspection with variable digital filtering
JP2010210568A (ja) * 2009-03-12 2010-09-24 Hitachi High-Technologies Corp 欠陥検査装置及び欠陥検査方法
JP2013156276A (ja) * 2013-05-08 2013-08-15 Hitachi High-Technologies Corp 試料の状態を評価するための装置及び方法
US8958076B2 (en) 2010-12-27 2015-02-17 Hitachi High-Technologies Corporation Surface shape measuring apparatus

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0274051A (ja) * 1988-09-09 1990-03-14 Fujitsu Ltd 半導体ウエハ表面のヘイズ評価法
JPH05203580A (ja) * 1991-09-04 1993-08-10 Internatl Business Mach Corp <Ibm> 検査システム装置
KR100719941B1 (ko) * 2004-12-22 2007-05-18 주식회사 피케이엘 포토마스크 표면의 헤이즈 측정장치 및 그 측정방법
KR100854705B1 (ko) 2005-12-14 2008-08-27 나노전광 주식회사 백색광 주사 간섭계를 이용한 포토마스크 표면의 헤이즈검출장치 및 그 검출방법
US7791721B2 (en) 2006-07-31 2010-09-07 Hitachi High-Technologies Corporation Surface inspection with variable digital filtering
KR100793085B1 (ko) 2006-12-18 2008-01-10 코닉시스템 주식회사 포토 마스크의 헤이즈 발생장치
WO2008075841A1 (en) * 2006-12-18 2008-06-26 Kornic Systems Co. Ltd. Device for generating haze on a photomask
WO2008075840A1 (en) * 2006-12-18 2008-06-26 Kornic Systems Co., Ltd. Device for generating haze on a photomask
US8101935B2 (en) 2007-11-30 2012-01-24 Hitachi High-Technologies Corporation Inspection apparatus and inspection method
JP2009133778A (ja) * 2007-11-30 2009-06-18 Hitachi High-Technologies Corp 検査装置及び検査方法
US8563958B2 (en) 2007-11-30 2013-10-22 Hitachi High-Technologies Corporation Inspection apparatus and inspection method
WO2010097971A1 (ja) * 2009-02-27 2010-09-02 三菱重工業株式会社 薄膜の検査装置及び検査方法
JP2010203813A (ja) * 2009-02-27 2010-09-16 Mitsubishi Heavy Ind Ltd 薄膜の検査装置及び検査方法
US8497991B2 (en) 2009-02-27 2013-07-30 Mitsubishi Heavy Industries, Ltd. Thin-film inspection apparatus and inspection method
JP2010210568A (ja) * 2009-03-12 2010-09-24 Hitachi High-Technologies Corp 欠陥検査装置及び欠陥検査方法
US8958076B2 (en) 2010-12-27 2015-02-17 Hitachi High-Technologies Corporation Surface shape measuring apparatus
JP2013156276A (ja) * 2013-05-08 2013-08-15 Hitachi High-Technologies Corp 試料の状態を評価するための装置及び方法

Also Published As

Publication number Publication date
JPH0317378B2 (enExample) 1991-03-07

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