JPS63133694A - 厚膜回路形成における回路不良検出方法 - Google Patents

厚膜回路形成における回路不良検出方法

Info

Publication number
JPS63133694A
JPS63133694A JP61281542A JP28154286A JPS63133694A JP S63133694 A JPS63133694 A JP S63133694A JP 61281542 A JP61281542 A JP 61281542A JP 28154286 A JP28154286 A JP 28154286A JP S63133694 A JPS63133694 A JP S63133694A
Authority
JP
Japan
Prior art keywords
thick film
circuit
film circuit
substrate
nozzle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61281542A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0368552B2 (enrdf_load_stackoverflow
Inventor
田口　克彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Juki Corp
Original Assignee
Juki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Juki Corp filed Critical Juki Corp
Priority to JP61281542A priority Critical patent/JPS63133694A/ja
Publication of JPS63133694A publication Critical patent/JPS63133694A/ja
Publication of JPH0368552B2 publication Critical patent/JPH0368552B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)
JP61281542A 1986-11-26 1986-11-26 厚膜回路形成における回路不良検出方法 Granted JPS63133694A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61281542A JPS63133694A (ja) 1986-11-26 1986-11-26 厚膜回路形成における回路不良検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61281542A JPS63133694A (ja) 1986-11-26 1986-11-26 厚膜回路形成における回路不良検出方法

Publications (2)

Publication Number Publication Date
JPS63133694A true JPS63133694A (ja) 1988-06-06
JPH0368552B2 JPH0368552B2 (enrdf_load_stackoverflow) 1991-10-28

Family

ID=17640628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61281542A Granted JPS63133694A (ja) 1986-11-26 1986-11-26 厚膜回路形成における回路不良検出方法

Country Status (1)

Country Link
JP (1) JPS63133694A (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5969991A (ja) * 1982-10-15 1984-04-20 松下電器産業株式会社 電子回路板の製造方法
JPS59111387A (ja) * 1982-12-16 1984-06-27 松下電器産業株式会社 厚膜回路パタ−ンの形成方法
JPS59192945A (ja) * 1983-04-15 1984-11-01 Hitachi Ltd 配線パターン欠陥検出方法及びその装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5969991A (ja) * 1982-10-15 1984-04-20 松下電器産業株式会社 電子回路板の製造方法
JPS59111387A (ja) * 1982-12-16 1984-06-27 松下電器産業株式会社 厚膜回路パタ−ンの形成方法
JPS59192945A (ja) * 1983-04-15 1984-11-01 Hitachi Ltd 配線パターン欠陥検出方法及びその装置

Also Published As

Publication number Publication date
JPH0368552B2 (enrdf_load_stackoverflow) 1991-10-28

Similar Documents

Publication Publication Date Title
US5124931A (en) Method of inspecting electric characteristics of wafers and apparatus therefor
JPH1075092A (ja) 実装装置及び方法
JPS63133694A (ja) 厚膜回路形成における回路不良検出方法
JP3619819B2 (ja) 基板検査装置及び基板検査方法
US5659483A (en) System and method for analyzing conductor formation processes
JP7174555B2 (ja) 基板検査装置、その位置合せ、及び基板検査方法
JPH0737941A (ja) プローブ装置
JPH0750730B2 (ja) プロ−ブ装置
JPH0349422Y2 (enrdf_load_stackoverflow)
JP2001315297A (ja) スクリーン印刷装置およびスクリーン印刷方法
JP2575013B2 (ja) 液晶表示体検査装置
JP3056943B2 (ja) セラミック基板の配線パターン検査方法
JPS59182516A (ja) ウエハチツプのマ−キング装置
JPH02298095A (ja) 直接描画装置における基板表面計測方法
JPH09113567A (ja) プリント基板のパターンショート・オープン検査装置
KR0139025B1 (ko) 웨이퍼의 전기특성 검사 방법 및 그 장치
JPH08313857A (ja) Ｌｃｄパネルの位置決め機構
JP2590329B2 (ja) 検査装置
JPH02137347A (ja) 位置合わせ方法
JP2575044B2 (ja) プローブ装置
JPH01170864A (ja) テープキャリヤの検査装置
JPS63188272A (ja) 厚膜回路形成におけるパタ−ン認識方法
JPH059000U (ja) 配線基板上の電子部品の検査装置
JPH0343591B2 (enrdf_load_stackoverflow)
JPS6385403A (ja) 厚膜回路形成装置における基板高さ測定装置