JPS6258170A - Probe contact - Google Patents

Probe contact

Info

Publication number
JPS6258170A
JPS6258170A JP19763085A JP19763085A JPS6258170A JP S6258170 A JPS6258170 A JP S6258170A JP 19763085 A JP19763085 A JP 19763085A JP 19763085 A JP19763085 A JP 19763085A JP S6258170 A JPS6258170 A JP S6258170A
Authority
JP
Japan
Prior art keywords
contact
notch
spring
slide part
slide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19763085A
Other languages
Japanese (ja)
Inventor
Shigeo Kiyota
茂男 清田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
YAMAICHI SEIKO KK
Kiyota Manufacturing Co
Original Assignee
YAMAICHI SEIKO KK
Kiyota Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by YAMAICHI SEIKO KK, Kiyota Manufacturing Co filed Critical YAMAICHI SEIKO KK
Priority to JP19763085A priority Critical patent/JPS6258170A/en
Publication of JPS6258170A publication Critical patent/JPS6258170A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To attain to enhance the test accuracy of a printed wiring board, by forming a notch part to a slide part to impart elasticity to said slide part. CONSTITUTION:A plunger contact 14 is constituted of the leading end 16 contacted with a surface to be measured, the slide part 17 sliding with a body part 12, the notch part 22 formed to the leading end of the slide part 17 and the rubber like elastomer 23 engaged with and fixed to the bottom part of the notch part 22. When the leading end 16 of the plunger contact 14 is contacted with the solder surface 19 of a printed circuit board 18, even if strong force is applied to the slide part 17 from the lateral direction, the slide part 17 is elastically contacted with the body part 12 in a freely slidable manner by the elastic forces of a spring 13 and the elastomer 23 and, therefore, there is no possibility such that the slide part 17 is separated from the body part 12 at all. As a result, a current flows to a probe contact always stably.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明は、プリント配線基板(ベアボード、インサーキ
ット等)の電気回路の断線、シ、−ト等を点検するプリ
ント基板検査用のプローブコンタクトに関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a probe contact for inspecting printed wiring boards (bare boards, in-circuits, etc.) for checking electrical circuit breaks, sheets, etc. It is something.

[従来技術及びその問題点」 プリント基板の回路導通などのテストに使用されるプロ
ーブコンタクトは、第8図に示すようにプリント基板検
査機の取付板1に固定的に装着されるソケット8と、該
ソケット8に嵌合される胴部2と、この胴部2にバネ3
等を介して装着されるプランジャーコンタクト4とから
なり、該プランジャーコンタクト4の先端部8がプリン
ト基板の被測定面5に押し当てられた時に、プランジャ
ーコンタクト4が胴部2に対し相対移動可能に構成され
ている。
[Prior art and its problems] A probe contact used for testing circuit continuity of a printed circuit board, as shown in FIG. A body part 2 fitted into the socket 8, and a spring 3 attached to this body part 2.
When the tip 8 of the plunger contact 4 is pressed against the surface to be measured 5 of the printed circuit board, the plunger contact 4 is attached relative to the body 2. It is configured to be movable.

しかして、前記先端部8が被測定面5に垂直に当接し、
バネ3が真直に押圧される場合はあまり問題はないが、
先端部が被測定面に傾斜して当接した場合または何等か
の理由によって、バネに不均−な力がかかる状態となる
と、胴部2とプランジャーコンタクト4の摺動部7とが
瞬間的に離れ、その結果瞬間的に電流が流れなくなり、
このことが導通試験の障害となっている。プリント基板
の回路導通試験等を行なう場合、プローブコンタクト自
体には常に正常に電流が流れなければならないからであ
る。特に、最近はより精密な試験の必要性が高くなって
きているので、このような欠点のないプローブコンタク
トが強く求められつつある。
Thus, the tip 8 comes into contact with the surface to be measured 5 perpendicularly,
There is not much problem if spring 3 is pressed straight, but
If the tip comes into contact with the surface to be measured at an angle, or if an uneven force is applied to the spring for some reason, the body 2 and the sliding part 7 of the plunger contact 4 will momentarily As a result, the current stops flowing momentarily,
This is an obstacle to continuity testing. This is because when performing a circuit continuity test on a printed circuit board, current must always flow normally through the probe contact itself. In particular, as the need for more precise testing has increased recently, there has been a strong demand for probe contacts that do not have these drawbacks.

「発明の目的」 本発明は、上記の実状に鑑みてなされたものであり、プ
ランジャーコンタクトの摺動部と胴部とを安定して接触
し得るようにし、その結果試験精度が飛躍的に向上する
プローブコンタクトを提供することを目的としている。
``Object of the Invention'' The present invention has been made in view of the above-mentioned circumstances, and aims to enable stable contact between the sliding part and the body of a plunger contact, thereby dramatically improving test accuracy. The purpose is to provide improved probe contact.

r問題点を解決するための手段」 上記の目的を達成するため、本発明にあっては、胴部に
バネを介して摺動自在に装着されるプランジャーコンタ
クトと、該プランジャーコンタクトの後端に形成された
バネ性を付与する切欠部とを具備してなり、このバネ性
により前記プランジャーコンタクトとfiif記IT4
部とが弾性当接しながら摺動し、胴部とプランジャーコ
ンタクトとを常に確実に接触し得るようにしたことを特
徴とする。
In order to achieve the above object, the present invention includes a plunger contact that is slidably attached to the body via a spring, and a rear part of the plunger contact. and a notch provided at the end to provide springiness, and the springiness allows the plunger contact to
It is characterized in that the body part and the plunger contact slide while being in elastic contact, so that the body part and the plunger contact can always be in reliable contact with each other.

「実施例」 以下に、未発明の望ましい実施例を図面を参照しながら
説明する。
"Embodiments" Below, preferred embodiments of the invention will be described with reference to the drawings.

第1図に示すように、プランジャーコンタクト14は、
被測定面19に接触する先端部16と、胴部12と摺動
する摺動部17と、先端部1Bと摺動部17とを連結す
る連結部20と、摺動部17先端に形成された切欠部2
2と、切欠部22の底部に嵌合固定されたゴムのような
弾性体23とから構成されている。このプランジャーコ
ンタクト14はバネ13を介して胴部12内に装着され
ている。摺動部17は、バネ13の力に抗して胴部12
内に嵌入されて胴部12内を摺動するが、前記弾性体2
3の弾性力と切欠部22に嵌入されたバネの弾性力とに
より、摺動部17は常に胴部12に弾性押圧される。
As shown in FIG. 1, the plunger contact 14 is
A tip portion 16 that contacts the surface to be measured 19, a sliding portion 17 that slides on the body portion 12, a connecting portion 20 that connects the tip portion 1B and the sliding portion 17, and a connecting portion 20 formed at the tip of the sliding portion 17. Notch 2
2, and an elastic body 23 such as rubber that is fitted and fixed to the bottom of the notch 22. This plunger contact 14 is mounted inside the body 12 via a spring 13. The sliding part 17 resists the force of the spring 13 and moves the body part 12.
The elastic body 2 is inserted into the body and slides inside the body 12.
3 and the elastic force of the spring fitted into the notch 22, the sliding portion 17 is always elastically pressed against the body portion 12.

このように、プランジャーコンタクト14を装着した胴
部12は、ソケット18内に嵌め込まれる。ソケット1
8は、プリント基板検査機のテストヘッドと指称される
取付板11を貫通して溶着または接着されている。尚1
図中24は端子であり、この端子には、ハンダ付けなど
によりリード線が接続される。
In this way, the body 12 with the plunger contact 14 mounted thereon is fitted into the socket 18. socket 1
8 is welded or glued through a mounting plate 11, which is referred to as a test head of a printed circuit board inspection machine. Sho 1
In the figure, 24 is a terminal, and a lead wire is connected to this terminal by soldering or the like.

本発明に於いて、プランジャーコンタクト14及び胴部
12は、導電性材料で形成させる必要があるのは勿論で
ある。
In the present invention, it goes without saying that the plunger contact 14 and the body 12 must be made of a conductive material.

第2図は、本発明の他の実施例を示すもので、2個の摺
動部17.17 ′を小径状連結部20で連結し、先端
摺動部17に切欠部22を形成し、切欠部22底部と後
端摺動部17′とにかけて切割した例を示すこの実施例
に於いては、バネ13が切欠部22内に嵌合しているの
で、バネが押圧されると、バネの弾性力により、後端摺
動部17を拡開させ、胴部12を弾性押圧する。そのた
め、摺動中胴部12とプランジャーコンタクト摺動部1
7とは常に確実に接触する。
FIG. 2 shows another embodiment of the present invention, in which two sliding parts 17 and 17' are connected by a small-diameter connecting part 20, a notch 22 is formed in the tip sliding part 17, In this embodiment, which shows an example in which a cut is made between the bottom of the notch 22 and the rear end sliding part 17', the spring 13 is fitted into the notch 22, so when the spring is pressed, the spring Due to the elastic force, the rear end sliding portion 17 is expanded and the body portion 12 is elastically pressed. Therefore, the sliding middle body part 12 and the plunger contact sliding part 1
Always make sure to make contact with 7.

第3図は、本発明の他の実施例を示すもので。FIG. 3 shows another embodiment of the invention.

連結部20が後端摺動部17′のa膏をする以外は第2
図の実施例と同様に構成されている。
The connecting part 20 is the second part except that it covers the rear end sliding part 17'.
The structure is similar to the embodiment shown in the figure.

上記第1図ないし第3図に示す実施例に於いては、切欠
部22は摺動部17の端面の中央部に形成しているが、
これは必ずしもこのようでなくとも、第4図に示すよう
に側部に形成してもよい、このようにしても、切欠部2
2のため摺動部17にはバネ性が付与され、摺動部17
と胴部12とは弾性当接しながら摺動する。しかしなが
ら、この場合にはその弾性力を長期間保持させるため、
切欠部22にはゴムのような弾性体を装着させるのがよ
い。
In the embodiments shown in FIGS. 1 to 3 above, the notch 22 is formed at the center of the end surface of the sliding portion 17.
This is not necessarily necessary, but it may be formed on the side as shown in FIG.
2, the sliding part 17 is given spring properties, and the sliding part 17
The body portion 12 slides while being in elastic contact with the body portion 12. However, in this case, in order to maintain the elasticity for a long time,
It is preferable to attach an elastic body such as rubber to the notch 22.

第5図は本発明の他の実施例を示すもので、摺動部17
を先端に切欠部22を形成した略円錐形状に形成し、円
錐形の先端を外方に向って略水平状様に形成し、プロー
ブコンタクト摺動部17とバネ13とを完全に密着させ
、プローブコンタクト14と胴部12とがバネ13を介
して通電し得るように構成されている。
FIG. 5 shows another embodiment of the present invention, in which the sliding part 17
is formed into a substantially conical shape with a notch 22 formed at the tip, and the conical tip is formed in a substantially horizontal shape facing outward, so that the probe contact sliding portion 17 and the spring 13 are completely brought into close contact with each other. The probe contact 14 and the body portion 12 are configured to be energized via a spring 13.

上記実施例に於いては、バネ13の下端は/\ンダ付げ
により胴部12に固定しているので、摺動部17と胴部
12とはバネ13を介して完全に密着し、そのため摺動
部14と胴部12とのW4間的な導通不良が効果的に防
止される。
In the above embodiment, the lower end of the spring 13 is fixed to the body part 12 by /\\bolding, so the sliding part 17 and the body part 12 are in complete contact with each other through the spring 13. Poor conduction between W4 between the sliding portion 14 and the body portion 12 is effectively prevented.

「作用」 次に、上記のように構成された本発明の作用を第1図に
従って説明する。
"Operation" Next, the operation of the present invention configured as described above will be explained with reference to FIG.

まず、プランジャーコンタクトの先端部1Bを、プリン
ト基板18のハンダ面19に当接させる。この際、摺動
部17に横方向の強い力が加わっても、摺動g617と
胴部12とはバネ13及び弾性体23の弾性力により、
摺動自在に弾性当接しているので、摺動部17と胴部1
2とが離れる恐れは全くない、従って、プローブコンタ
クトには常に安定して電流が流れることになる。
First, the tip 1B of the plunger contact is brought into contact with the solder surface 19 of the printed circuit board 18. At this time, even if a strong lateral force is applied to the sliding part 17, the sliding part g617 and the body part 12 will move due to the elastic force of the spring 13 and the elastic body 23.
Since the sliding part 17 and the body part 1 are in elastic contact so that they can freely slide,
There is no possibility that the probe contacts will separate from each other, so a stable current will always flow through the probe contacts.

「発明の効果」 以上述べた如く本発明によるときは、摺動部に切欠部を
形成することにより、摺動部に弾性力を付与しているの
で、摺動部と胴部とは弾性当接し、そのため通常離れる
ことはないから、プローブコンタクトには安定して電流
が流れ、プリント配線基板の試験精度が飛躍的に向上す
る。
"Effects of the Invention" As described above, according to the present invention, elastic force is imparted to the sliding part by forming a notch in the sliding part, so that the sliding part and the body are in elastic contact. Since the probe contacts are in contact with each other and therefore do not normally separate, a stable current flows through the probe contacts, dramatically improving the accuracy of testing printed wiring boards.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図ないし第5図は、本発明の実施例を示す断面図、 第6図は、従来のプローブコンタクトを示す断面図であ
る。 図中。 12・・・胴部、13・・・バネ、 17・・・摺動部
、14・・・プランジャーコンタクト、22・・・切欠
部、23・・・ゴムのような弾性体 特許出願人   有限会社 清田製作所株式会社 山−
精工 ゝ・t′、倭Vl、、、、i 第1図 第2図    第3図 第4図    第5図 第6図
1 to 5 are cross-sectional views showing embodiments of the present invention, and FIG. 6 is a cross-sectional view showing a conventional probe contact. In the figure. DESCRIPTION OF SYMBOLS 12...Body part, 13...Spring, 17...Sliding part, 14...Plunger contact, 22...Notch part, 23...Rubber-like elastic body Patent Applicant Limited Company Kiyota Seisakusho Co., Ltd. Yama-
Seiko ゜・t'、Wa Vl、、、、i Fig. 1 Fig. 2 Fig. 3 Fig. 4 Fig. 5 Fig. 6

Claims (3)

【特許請求の範囲】[Claims] (1)胴部にバネを介して摺動自在に装着されるプラン
ジャーコンタクトと、該プランジャーコンタクトの後端
に形成されたバネ性を付与する切欠部とを具備してなり
、このバネ性により前記プランジャーコンタクトと前記
胴部とが弾性当接しながら摺動することを特徴とするプ
ローブコンタクト。
(1) A plunger contact that is slidably attached to the body via a spring, and a notch formed at the rear end of the plunger contact that imparts spring properties; The probe contact is characterized in that the plunger contact and the body portion slide while being in elastic contact with each other.
(2)前記バネの先端を前記切欠部に嵌入させ、バネが
押圧されることにより切欠部を拡開させる方向の力を付
与する特許請求の範囲第1項記載のプローブコンタクト
(2) The probe contact according to claim 1, wherein the tip of the spring is fitted into the notch, and the spring is pressed to apply a force in a direction to expand the notch.
(3)前記切欠部にゴムのような弾性体を嵌合させ、該
弾性体の弾性力により、切欠部を拡開させる方向の力を
付与してなる特許請求の範囲第1項記載のプローブコン
タクト。
(3) The probe according to claim 1, wherein an elastic body such as rubber is fitted into the notch, and the elastic force of the elastic body applies a force in the direction of expanding the notch. contact.
JP19763085A 1985-09-09 1985-09-09 Probe contact Pending JPS6258170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19763085A JPS6258170A (en) 1985-09-09 1985-09-09 Probe contact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19763085A JPS6258170A (en) 1985-09-09 1985-09-09 Probe contact

Publications (1)

Publication Number Publication Date
JPS6258170A true JPS6258170A (en) 1987-03-13

Family

ID=16377677

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19763085A Pending JPS6258170A (en) 1985-09-09 1985-09-09 Probe contact

Country Status (1)

Country Link
JP (1) JPS6258170A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148306A (en) * 2000-11-07 2002-05-22 Alps Electric Co Ltd Measuring device
JP2007085887A (en) * 2005-09-22 2007-04-05 Hitachi Global Storage Technologies Netherlands Bv Contact probe and method for making the contact probe contact solder terminal
JP2010091436A (en) * 2008-10-08 2010-04-22 Citizen Tohoku Kk Contact probe
JP2010256251A (en) * 2009-04-27 2010-11-11 Yokowo Co Ltd Contact probe and socket
JP2013140059A (en) * 2011-12-29 2013-07-18 Enplas Corp Probe pin and socket for electric component
JP2018066711A (en) * 2016-10-21 2018-04-26 日本コネクト工業株式会社 Probe pin for heavy current

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS597571B2 (en) * 1980-12-13 1984-02-20 ニチアス株式会社 Synthetic resin lining method for elbow pipes
JPS597570B2 (en) * 1975-03-13 1984-02-20 モンサント・カンパニ− Improved temperature control of molded preforms

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS597570B2 (en) * 1975-03-13 1984-02-20 モンサント・カンパニ− Improved temperature control of molded preforms
JPS597571B2 (en) * 1980-12-13 1984-02-20 ニチアス株式会社 Synthetic resin lining method for elbow pipes

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002148306A (en) * 2000-11-07 2002-05-22 Alps Electric Co Ltd Measuring device
JP2007085887A (en) * 2005-09-22 2007-04-05 Hitachi Global Storage Technologies Netherlands Bv Contact probe and method for making the contact probe contact solder terminal
JP2010091436A (en) * 2008-10-08 2010-04-22 Citizen Tohoku Kk Contact probe
JP2010256251A (en) * 2009-04-27 2010-11-11 Yokowo Co Ltd Contact probe and socket
US8519727B2 (en) 2009-04-27 2013-08-27 Yokowo Co., Ltd. Contact probe and socket
JP2013140059A (en) * 2011-12-29 2013-07-18 Enplas Corp Probe pin and socket for electric component
JP2018066711A (en) * 2016-10-21 2018-04-26 日本コネクト工業株式会社 Probe pin for heavy current

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