JP2018066711A - Probe pin for heavy current - Google Patents

Abstract

PROBLEM TO BE SOLVED: To achieve a probe pin for a heavy current which is a falling prevention type in which increase of whole length and construction cost is suppressed, even when a cylindrical contact part which is fitted to a movement/retreat member at proper contact pressure, is introduced into a hollow part of a cylindrical guidance member.SOLUTION: There is provided a probe pin 50 for a heavy current for pressing a conductive plunger 51 (movement/retreat member) whose large diameter part 51b is stored in a hollow part 53b of a barrel 53 (cylindrical guidance member) in a state in which a tip end part of a small diameter part 51a is protruded, toward an opening side of the hollow part 53b by a coil spring 52 (energization member), in which a conductive contact 54 (cylindrical contact piece) having a cylindrical annular stem 54a and branched branch parts 54a which are branched therefrom into plural parts, is pressed into the cylindrical guidance member 53 and is stopped at a position close to the opening and into which the small diameter part 51a of the movement/retreat member is inserted. The branched branch parts 54b of the cylindrical contact piece are elastically deformed and contact the outer peripheral surface of the small diameter part 51a, and the large diameter part 51b of the movement/retreat member contacts an end surface close to the energization member of the cylindrical contact piece 54, for preventing falling of the movement/retreat member 51.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a probe pin for energizing with a tip temporarily contacting a subject. Specifically, a plunger (advancing / retracting member) and a coil spring (biasing member) are hollowed in a barrel (cylindrical guide member). More particularly, the present invention relates to a high-current probe pin that can be used to carry a large current.

  FIG. 3 shows the structure of conventional probe pins 10, 20, 30 and socket 40. FIG. 3 (a) shows a probe pin 10 for large current in which a sleeve 13 having openings at both ends is adopted as a cylindrical guide member. FIG. 3B is an external view of a probe pin 20 for large current in which a cylindrical guide member adopts a barrel 23 whose one end is open and the other end is closed, and FIG. In the barrel 33 (cylindrical guide member), the plunger 31 (advancing / retracting member) and the coil spring 32 (biasing member) are accommodated, and the opening end 33a of the barrel 33 is "caulked" to prevent them from coming off. FIG. 3D is an external view and the like of a socket (connector) having a louver (cylindrical contact).

  A typical straight rod-shaped probe pin 10 for a large current (see FIG. 3A, Patent Document 1) is made of a metal and conductive plunger 11 (advancing / retracting member) such as brass, and a coil into which the plunger 11 can be freely inserted. A spring 12 (biasing member) and a cylindrical sleeve 13 (tubular guide member) through which the plunger 11 can be inserted are provided. The plunger 11 is formed in an elongated round bar shape, and the sleeve 13 is connected to the plunger 11. When the coil spring 12 is pushed so as to separate the upper end of the sleeve 13 and the upper end of the plunger 11 in a state of being slidably and axially movable, the plunger 11 is biased upward. ing. In addition, the probe pin 10 for large current has a lower end portion of the plunger 11 protruding from the sleeve 13 so that the end portion of the electric wire can be connected, and a coil spring 12 is provided outside the sleeve 13.

The other large current probe pin 20 (see FIG. 3B) is also in the form of a straight rod, but the lower half of the plunger 21 (advancing / retracting member) and the coil spring 22 (biasing member) The whole is stored in the hollow of the barrel 23 (cylindrical guide member).
In these high-current probe pins 10 and 20, a contact member having excellent wear resistance is attached to the upper end surfaces (protruding end surfaces) of the plungers 11 and 21 (advancing and retracting members), and durability is enhanced. Many contact portions of pyramidal projections are formed at the contact portion on the upper surface of the contact member, and the contact property and conductivity are enhanced, so that a large current of 5 A to 20 A can be passed with low resistance. ing.

Further, the other straight rod-shaped probe pin 30 (see FIG. 3C) is not intended for a large current but is energized at 2 A or less, and a plunger 31 (advancing and retreating) having a small diameter portion and a large diameter portion. The large-diameter portion of the member) and the entire coil spring 32 (biasing member) are housed in the hollow of the barrel 33 (tubular guide member). Moreover, the probe pin 30 has a crimping process applied to the open end 33a of the barrel 33, the open end 33a is narrowed, and the large diameter portion of the plunger 31 hits it. Since the plunger 31 does not fall off, it can be used in any posture regardless of whether the plunger 31 is upward, downward, or sideways.
In these probe pins 20 and 30, conduction between both ends of the probe pins is ensured by contact between the outer peripheral surfaces of the plungers 21 and 31 and the hollow inner wall surfaces of the barrels 23 and 33.

Furthermore, although it is not a probe pin (refer FIG.3 (d), patent document 2), the louver 42 (cylindrical contactor) was inserted in the hollow of the base | substrate part 41 in the socket 40 of a connector (40,45). There are also things. The louver 42 is formed of a thin conductive cylinder that is open at both ends, and has an intermediate portion that is slightly bent and has a smaller diameter than both ends. In addition, several slits are formed in the bent portion in order to impart the ease of elastic deformation in the radial direction.
For this reason, when the rod-shaped contact 45 of the plug is inserted into the louver 42 (cylindrical contact) of the socket 40, the rod-shaped contact 45 and the louver 42 (cylindrical contact) are fitted with an appropriate contact pressure and stable. The established electrical continuity state is established.

JP 2011-137791 A JP 2003-132975 A

  Among such conventional straight rod-shaped probe pins, the high current probe pins 10 and 20 are equipped with a contact member (see FIGS. 3A and 3B) with respect to the upper end surface of the plunger 11, and the coil spring 12. , 22, and connection of the end of the wire to the lower end of the plunger 11 (see FIG. 3A) or securing a large contact area between the outer peripheral surface of the plunger 21 and the hollow inner wall surface of the barrel 23. Even when the passing current is relatively large, the voltage across the probe pin is kept to a minimum.

  On the other hand, the probe pin 30 in which the caulking process for preventing the hollow articles 31 and 32 from being pulled out is applied to the opening end 33a of the barrel 33 (see FIG. 3C) has a high degree of freedom in posture during use. Since the spring force is rather thin and the contact area between the outer peripheral surface of the plunger 31 and the hollow inner wall surface of the barrel 33 is small, the electric resistance between the plunger 31 and the barrel 33 is high current probe. Since it is larger than the pin 20, if the passing current at the time of measurement is large, the voltage across the probe pin may become excessive. Therefore, it is frequently used for the measurement related to the portion where the passing current is relatively small.

However, in recent years, there has been an increasing demand to use such an easy-to-use probe pin 30 for measurement related to a portion having a larger passing current.
In order to respond to this, it is necessary to reduce the electrical resistance between the plunger 31 and the barrel 33, and in order to realize it without increasing the size of the probe pin 20 for large current, as described above. It is conceivable to introduce a so-called electrical conduction stability establishing member that fits the plunger 31 with an appropriate contact pressure, such as the louver 42 of the socket 40, and interpose it between the plunger 31 and the barrel 33.

However, additional introduction of new members increases not only the member cost but also the construction cost such as assembly and adjustment, and the total length of the probe pin increases as the length of the hollow barrel that accommodates the additional member increases. There is also an inconvenient aspect.
Therefore, it is a high current probe pin that can be applied not only to a small current but also to a large current, such as a louver that fits the plunger (advancing / retracting member) with an appropriate contact pressure (cylindrical contact) It is a technical problem to realize a probe pin for large current that requires only a small increase in construction cost and overall length even if the child is introduced into the hollow of the barrel (tubular guide member).

  The probe pin for large current of the present invention (Solution means 1) was devised to solve such a problem, and is a conductive cylindrical guide member having a bottomed hollow perforated from one end; A conductive advancing / retracting member in which the large-diameter portion is housed in the hollow with the small-diameter portion and the large-diameter portion in a state in which the tip portion of the small-diameter portion projects from the hollow, and is housed near the bottom of the hollow In the high current probe pin provided with a biasing member that pushes the advance / retreat member toward the hollow opening side, the conductive pin has a cylindrical annular trunk portion and a branch branch portion that branches into a plurality of branches. A cylindrical contact is press-fitted into the hollow of the cylindrical guide member, stops near the hollow opening, and passes through the small-diameter portion of the advance / retreat member, and the branch branch portion of the cylindrical contact is , Both are elastically deformed and the outer peripheral surface of the small diameter portion The advancing / retreating member is prevented from coming off when the large-diameter portion of the advancing / retreating member abuts against an end surface of the cylindrical contact near the biasing member. And

In such a high-current probe pin of the present invention (Solution 1), by introducing a cylindrical contact that is a member for establishing electrical continuity, the electrical connection between the advance / retreat member and the cylindrical guide member is achieved. Since resistance becomes small, it will be able to conduct not only small current but also large current.
Further, since the cylindrical contactor incorporated by press-fitting prevents the advancement / retraction member from being pulled out, the “caulking” process, which requires more labor than press-fitting, is not necessary, and the construction cost is reduced by the difference. Increase is suppressed.

Further, the positioning function for aligning the axis of the advance / retreat member with the axis of the cylindrical guide member is not only exhibited by the fitting between the hollow inner wall surface of the cylindrical guide member and the outer peripheral surface of the large-diameter portion of the advance / retreat member. In addition, since it is also exerted by the contact between the outer peripheral surface of the small diameter portion of the advance / retreat member and the branch branch portion of the cylindrical contact, the large diameter portion of the advance / retreat member can be shortened without any problem.
For this reason, the total length of the shortened portion of the large diameter portion of such advancing and retracting member and the shortened portion of the above-described “caulking” retaining portion is offset and reduced by the increase in length due to the introduction of the cylindrical contact. The increase in the total pin length will be small.

Example 1 of the present invention shows the structure of a probe pin for high current, (a) is an external view, (b) is an external view with the inside shown by a broken line, (c) is a cross-sectional view, and (d) is an unfolded view. (E) is a material diagram of a contact (cylindrical contact), (f) is an external view of the contact as seen from the ring trunk, (f) is an upper part of the contact and a branch branch. FIG. 4B is a cross-sectional view of the probe pin for large current in which the plunger (advancing / retracting member) is pushed in. Example 2 of the present invention shows the structure of a probe pin for high current, (a) is an external view, (b) is an external view with the inside shown by a broken line, (c) is a cross-sectional view, and (d) is an unfolded view. FIG. 4E is a cross-sectional view of the probe pin for large current with the plunger pushed in. The structure of a conventional product is shown, (a) is an external view and cross-sectional view of a probe pin for large current that employs a sleeve having both ends opened on a cylindrical guide member, and (b) is closed at the other end with one end opened on the cylindrical guide member. (C) is an external view and a cross-sectional view of a probe pin in which a barrel is processed for preventing a plunger and the like from being removed, and (d) is a louver (cylindrical contactor). And the like.

About the probe pin for such a large current of this invention, the specific form for implementing this is demonstrated by the following Examples 1-2.
The embodiment 1 shown in FIG. 1 embodies the above-described solution 1 (claim 1 at the beginning of the application), and the embodiment 2 shown in FIG. 2 is a modification thereof.

A specific configuration of the high current probe pin according to the first embodiment of the present invention will be described with reference to the drawings.
FIGS. 1A to 1D show the entire probe pin 50 for a large current in a free state, in which FIG. 1A is an external view, FIG. 1B is an external view showing the inside with a broken line, and FIG. Is a sectional view, and (d) is a developed external view. 1 (e) is a surface view of the plate-shaped material of the contact 54 (cylindrical contactor), FIG. 1 (f) is an external view of the contact 54 viewed from the annular trunk 54a side, FIG. 4G is a cross-sectional view of the probe pin 50 for high current in a use state in which the plunger 51 (advance / retreat member) is pushed in, with the side portion of the contact 54 seen from the branching branch portion 54b side.

The probe pin 50 for large current is modified to reduce electrical resistance so that the probe pin 30 described above can be passed through not only small current but also large current of 5 A or more without any inconvenience. 51, a coil spring 52 as an urging member, a barrel 53 as a cylindrical guide member, and a contact 54 as a cylindrical contact.
The plunger 51 (advancing / retracting member) follows the plunger 31 described above, and includes a small-diameter portion 51a and a large-diameter portion 51b made of a good electric conductor, and the diameters of the respective portions 51a and 51b are described above. However, the length of the small-diameter portion 51a is slightly longer than that described above, and the length of the large-diameter portion 51b is slightly shorter than that described above.

  The coil spring 52 (biasing member) may be the same as the above-described coil spring 32 not only in shape but also in spring characteristics, etc., and is housed in the hollow 53b of the barrel 53 and placed near the bottom of the hollow 53b. Then, the plunger 51 is also stored in the hollow 53b of the barrel 53 with the large-diameter portion 51b first, and is brought close to the coil spring 52, so that the plunger 51 protrudes from the hollow portion of the hollow 53b of the barrel 53. In this state, the large-diameter portion 51b is accommodated in the hollow 53b, and the coil spring 52 is accommodated in the hollow 53b of the barrel 53 and pushes the plunger 51 toward the opening side of the hollow 53b.

  The barrel 53 (cylindrical guide member) follows the above-described barrel 33 and is made of a good electric conductor having a stepped round bar-like appearance, but the bottomed hollow 53b extends from the open end 53a to the other end. The shape is drilled to the front. The outer diameter of each step, the diameter of the hollow 53b, and the like are the same as those of the barrel 33 described above, but the opening end portion 33a is not subjected to "caulking" processing, and the depth of the hollow 53b and the barrel 53 The total length is slightly longer than those of the barrel 33 described above.

The contacts 54 (cylindrical contacts) are as if the louver 42 described above was divided into two in the axial direction. The contacts 54 (cylindrical contacts) were divided into a cylindrical annular trunk portion 54a and a plurality (four in the illustrated example) therefrom. It consists of branch branches 54b, ..., 54b called branched wings. This is made by, for example, a molding process in which a flat plate of a good electric conductor punched in a mountain range (see FIG. 1 (e)) is rounded into a cylindrical shape, and a plurality of branch branches 54b are brought close to the axis. .
Then, the annular trunk portion 54a is press-fitted into the hollow 53b of the barrel 53 containing the coil spring 52 and the plunger 51 from the open end 53a, and then the branch branch portion 54b is further pushed into the hollow portion 53b. Fits in.

  In this way, the probe pin 50 for large current is assembled, and in a single free state (see FIGS. 1A to 1C), the coil spring 52 can be expanded and contracted near the bottom in the hollow 53b of the barrel 53. The contact 54 is fixed and held near the opening end 53a, and the large-diameter portion 51b of the plunger 51 is sandwiched between one end of the coil spring 52 and the annular trunk portion 54a of the contact 54, from which the plunger 51 is held. The small-diameter portion 51a passes through the axial center of the contact 54 and also passes through the opening end portion 53a of the barrel 53, and protrudes from the barrel 53 to the outside.

  And in such a free state, while the contact 54 (cylindrical contact) has penetrated the small diameter part 51a of the plunger 51 (advancing / retracting member), all the branch branch parts 54b of the contact 54 are elastic. Since it deforms and continues to contact the outer peripheral surface of the small-diameter portion 51a, the electrical resistance between the plunger 51 and the contact 54 and thus the electrical resistance between the plunger 51 and the barrel 53 are kept to a minimum, and the small-diameter portion 51a of the plunger 51 is Since the centripetal force approaching the center of the hollow 53b of the barrel 53 works, the large-diameter portion 51b of the plunger 51 can be shortened. Moreover, the frictional force between the plunger 51 and the contact 54 due to the contact is moderately reduced and relaxed by the elastic deformation due to the fact that the branching branch 54b is formed like a cantilever. Therefore, the forward / backward movement of the plunger 51 due to the elastic force of the coil spring 52 is not hindered.

  In the free state, the large-diameter portion 51b of the plunger 51 (advancing / retracting member) contacts the end surface of the contact 54 (cylindrical contact) near the coil spring 52 (biasing member), so that the contact 54 is in the barrel 53. Since it is prevented from falling out from the hollow 53b of the (cylindrical guide member), “caulking” of the open end portion 33a in the probe pin 30 described above is unnecessary. Further, the additional introduction of the contacts 54 increases the overall length of the barrel 53 and hence the high-current probe pin 50 from the above-described barrel 33 and thus the overall length of the probe pin 30, but the increase is larger than the overall length of the contact 54. Small, the thickness of the “caulking” of the barrel 33 described above and the shortened length from the large diameter portion of the plunger 31 to the large diameter portion 51 b of the plunger 51 are subtracted from the total length of the contact 54. Stay in length.

  The use mode and operation of the high current probe pin 50 of the first embodiment will be described. The probe pin 50 for large current is used in the same manner as the probe pins 10 and 30 described above in that the tip of the small-diameter portion 51a of the plunger 51 (advancing / retracting member) is temporarily brought into contact with the subject during measurement. However, for the wiring to the other end prior to the measurement, an electric wire is connected to the tip of the barrel 53 (tubular guide member) in the same manner as the lower end of the plunger 11 (advance / retreat member) of the probe pin 10 for large current. The tip of the barrel 53 (cylindrical guide member) may be densely implanted in the wiring portion of the printed circuit board in the same manner as the tip of the barrel 33 (cylindrical guide member) of the probe pin 30 or the socket described above. It is easy to use because it can be connected even if it is inserted into 40 holes.

  When the tip of the small-diameter portion 51a of the plunger 51 is pressed against the subject at the time of measurement, the plunger 53 (advancing / retracting member) pushes and shrinks the coil spring 52 (biasing member) while the hollow of the barrel 53 (cylindrical guide member). 53b (see FIG. 1 (g)), and when pushed away from the subject, it is pushed by the elastic force of the coil spring 52 that overcomes the frictional force between the small diameter part 51a of the plunger 51 and the branching branch part 54b of the contact 54. The plunger 51 moves forward (see FIGS. 1A to 1C). At this time, the large diameter portion 51b of the plunger 51 is guided by the inner peripheral wall of the hollow 53b and is closer to the tip of the small diameter portion 51a of the plunger 51. Is guided by the plurality of branch branches 54 b of the contact 54 (cylindrical contact), so that the plunger 51 smoothly advances and retreats along the axis of the barrel 53.

Thus, like the probe pin 30, the high current probe pin 50 is used easily and operates without inconvenience.
Moreover, the energization allowable range expanded from the probe pin 30 by introducing the contact 54 (cylindrical contact) extends from a small current of 2 A or less to a large current of 5 A or more.

  A specific configuration of the high current probe pin according to the second embodiment of the present invention will be described with reference to the drawings. FIGS. 2A to 2D show the entire probe pin 60 for a large current in a free state, where FIG. 2A is an external view, FIG. 2B is an external view showing the inside with a broken line, and FIG. Is a cross-sectional view, and FIG. FIG. 2E is a cross-sectional view of the high-current probe pin 60 in a used state in which the plunger 61 (advance / retreat member) is pushed.

  The high current probe pin 60 is different from the high current probe pin 50 of the first embodiment described above in that the integral plunger 51 becomes a two-piece plunger 61 + 62 (advancing / retracting member) and contact. When the barrel 53 is inserted into the hollow 53b of the barrel 53, the branch branch 54b is first inserted and the annular trunk 54a is pushed back, and the annular trunk 54a is positioned at the open end 53a of the barrel 53. The branch branch portion 54b is located near the center of the hollow 53b. The plunger 61 + 62 (advance / retreat member) is divided into a plunger main part 61 (small diameter part) obtained by deforming the small diameter part 51a of the plunger 51 and a large diameter part 62 (large diameter part) following the large diameter part 51b of the plunger 51. In the hollow 53b of the barrel 53, both are combined.

  The plunger main part 61 is a single round bar-shaped member made of a good electric conductor, but has several parts with different diameters. Specifically, at the tip 61a that is temporarily brought into contact with the subject at the time of measurement, the subsequent medium diameter portion 61b, the small diameter portion 61c that is substantially the same diameter as the small diameter portion 51a of the plunger 51, and the end portion having a smaller diameter than that. The insertion portion 61d is located on the opposite side of the distal end portion 61a, and the tapered portion 61e is located between the medium diameter portion 61b and the small diameter portion 61c. The portion 61 b, the tapered portion 61 e, and the small diameter portion 61 c are included in the small diameter portion compared with the large diameter portion 62. Such a plunger main part 61 has a tip 61a larger than the tip of the plunger 51, so that pain can be reduced even when repeated contact with the subject or through a large current. Yes.

  The large-diameter portion 62 is made of a slightly thicker disk-like body, but has a through hole formed at the center / axial center thereof. The large-current probe pin 60 is assembled by inserting the plunger main portion 61 after the coil spring 52, the large-diameter portion 62, and the contact 54 are housed in this order in the hollow 53b of the barrel 53. The insertion part 61 d of the plunger main part 61 is inserted into the through hole 62. In this state, even when the plunger main portion 61 is pushed in, the large diameter portion 62 is always pressed against the plunger main portion 61 by the coil spring 52. Therefore, the plunger main portion 61 and the large diameter portion 62 Are moving forward and backward together.

  In this case, the length from the distal end portion 61a to the small diameter portion 61c in the plunger main portion 61 is equal to the length of the small diameter portion 51a of the plunger 51 described above, and the length / thickness of the large diameter portion 62 and the large plunger 51 described above. Since the length and thickness of the diameter portion 51b are equal, the high-current probe pin 60 exhibits high compatibility with the above-described high-current probe pin 50 with respect to mounting and measurement specifications. Of the plungers 61 + 62 (advancing / retracting members), the large-diameter portion 62 is reliably prevented from coming off by contact with the branch branch portion 54b of the contact 54.

  Also, the plunger main part 61 is held so as not to come off with a weak force of the order of its own weight due to friction with the branch branch part 54 b of the contact 54. Therefore, in the normal use state, the high-current probe pin 60 can be used in a free posture as with the above-described high-current probe pin 50. Nevertheless, when the plunger main part 61 is pulled artificially strongly, the plunger main part 61 overcomes the above-mentioned friction and moves to leave the large diameter part 62 between the contact 54 and the coil spring 52 to leave the barrel 53. The plunger main part 61 can be replaced or reattached without removing the contact 54. For this reason, the probe pin 60 for a large current has a barrel 53 in which the plunger main part 61 that is desired to be damaged and replaced, such as when the tip 61a of the plunger main part 61 is damaged by contact with the subject or repeated energization, etc. By simply pulling out the hollow 53b to the opening side (upward in the figure) and then inserting a new plunger main part 61, it is possible to continue using the apparatus by eliminating the troubles by simple replacement.

  Further, in the probe pin 60 for a large current in a free state (see FIGS. 2A to 2C), the distal end portion 61a, the intermediate diameter portion 61b, and a part of the small diameter portion 61c of the plunger main portion 61 are formed in the barrel 53. The plunger 61 + 62 is positioned in the radial direction only by the inner circumferential wall of the hollow 53b of the barrel 53 with respect to the large diameter portion 62 and by the branch branch portion 54b of the contact 54 with respect to the small diameter portion 61c. However, the positioning of the large-diameter portion 62 is steadily performed, but the positioning of the contact 54 with respect to the small-diameter portion 61c by the branching branch portion 54b is difficult to perfectly align, and is very close to the large-diameter portion 62. Therefore, the distal end portion 61a of the plunger main portion 61 is often slightly displaced from the axial center of the barrel 53.

  On the other hand, the plunger main part 61 has an outer diameter of the intermediate diameter part 61b slightly smaller than an inner diameter of the annular trunk part 54a of the contact 54, and the axial center is substantially matched when the intermediate diameter part 61b and the annular trunk part 54a are fitted. Therefore, when the distal end 61a is pushed during measurement and the plunger main part 61 moves backward during measurement, the taper part 61e is first loosely fitted into the annular trunk part 54a, and then the medium diameter part 61b is annular. It fits into the trunk 54a (see FIG. 2 (e)). Then, due to the strong centripetal force due to the fitting, the distal end portion 61a of the plunger main portion 61 is laterally moved in a direction to cancel the eccentricity with respect to the barrel 53, so that the surface of the contact portion of the subject is lightly rubbed. Therefore, since the thin insulating oxide film can be quickly broken even under a low applied voltage and the conductivity with the specimen is increased, improvement in measurement performance can be expected.

[Others]
In the above embodiment, the single large-current probe pins 50 and 60 are illustrated and described. However, a large number of large-current probe pins 50 and 60 may be erected on one support.
Further, the high current probe pins 50 and 60 of the above embodiment can be accurately measured even in a place where a large current of 5 A or more passes, but the present invention is not limited to this, and a small current of 2 A or less. In addition, even where a medium current of 2A to 5A passes, it contributes to accurate measurement.
In the above-described embodiment, the number of the branch branches 54b of the contact 54 is four. However, the number of the branch branches 54b is not limited thereto, and may be another number such as six.

  The high current probe pin of the present invention can be used for electrical inspection and testing of semiconductor devices, printed wiring boards and other circuit boards.

10, 20 ... probe pin for large current, 30 ... probe pin,
11, 21, 31 ... Plunger (advancing / retracting member),
12, 22, 32 ... coil spring (biasing member),
13 ... Sleeve (tubular guide member), 23 ... Barrel (tubular guide member),
33 ... Barrel (tubular guide member), 33a ... Open end (caulking part),
40 ... Socket (connector), 41 ... Base part, 42 ... Louver (cylindrical contact),
50: Probe pin for large current,
51 ... Plunger (advancing / retracting member), 51a ... Small diameter part, 51b ... Large diameter part,
52 ... Coil spring (biasing member),
53 ... Barrel (tubular guide member), 53a ... Open end, 53b ... Hollow,
54 ... contact (cylindrical contact), 54a ... annular trunk, 54b ... branch branch,
60 ... probe pin for high current,
61 + 62 ... Plunger (advance / retreat member), 61 ... Plunger main part,
61a ... tip part (subject contact part), 61b ... medium diameter part,
61c ... small diameter portion, 61d ... insertion portion, 61e ... taper portion, 62 ... large diameter portion

Claims (1)

  A conductive cylindrical guide member having a hollow hole with a bottom from one end, a small diameter portion and a large diameter portion, and the large diameter portion is in a state where the tip of the small diameter portion protrudes from the hollow In a high current probe pin comprising a conductive advance / retreat member housed in a hollow and a biasing member housed near the bottom of the hollow and pushing the advance / retreat member toward the hollow opening side, An electrically conductive cylindrical contact comprising an annular trunk and a branch branch branched into a plurality of branches is pressed into the hollow of the cylindrical guide member and stops near the hollow opening, and the advance / retreat member A small-diameter portion is inserted, all of the branch branches of the cylindrical contact are elastically deformed and contact the outer peripheral surface of the small-diameter portion, and the large-diameter portion of the advance / retreat member is the cylinder Abutting against the end face of the contact member closer to the biasing member Probe pin high current, characterized by being adapted to escape more said reciprocating members is prevented.

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