JP6801866B2 - Probe pin for large current - Google Patents

Probe pin for large current Download PDF

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JP6801866B2
JP6801866B2 JP2016207238A JP2016207238A JP6801866B2 JP 6801866 B2 JP6801866 B2 JP 6801866B2 JP 2016207238 A JP2016207238 A JP 2016207238A JP 2016207238 A JP2016207238 A JP 2016207238A JP 6801866 B2 JP6801866 B2 JP 6801866B2
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plunger
diameter portion
hollow
contact
probe pin
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JP2018066711A (en
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荒井 修
修 荒井
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JC ELECTRONICS CO., LTD.
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JC ELECTRONICS CO., LTD.
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Description

この発明は、先端を被検体に一時当接させて通電するためのプローブピンに関し、詳しくは、プランジャ(進退部材)とコイルばね(付勢部材)とをバレル(筒状案内部材)の中空に収めた直棒状のプローブピンに関し、更に詳しくは、大電流の通電にも能う大電流用プローブピンに関する。 The present invention relates to a probe pin for temporarily contacting the tip with a subject to energize. Specifically, the plunger (advancing / retreating member) and the coil spring (biasing member) are hollowed in a barrel (cylindrical guide member). More specifically, the present invention relates to a straight rod-shaped probe pin contained therein, and more particularly, a large current probe pin capable of energizing a large current.

図3は、従来のプローブピン10,20,30やソケット40の構造を示しており、そのうち図3(a)は、筒状案内部材に両端開口のスリーブ13を採用した大電流用プローブピン10の外観図と断面図であり、図3(b)は、筒状案内部材に一端開口で他端閉塞のバレル23を採用した大電流用プローブピン20の外観図であり、図3(c)は、バレル33(筒状案内部材)にプランジャ31(進退部材)とコイルばね32(付勢部材)とを収めたうえでそれらの抜け防止のためバレル33の開口端部33aに「かしめ」加工を施したプローブピン30の外観図と断面図であり、図3(d)は、ルーバー(筒状接触子)を具備したソケット(コネクタ)の外観図等である。 FIG. 3 shows the structures of the conventional probe pins 10, 20, 30 and the socket 40, and FIG. 3A shows the probe pin 10 for a large current in which the sleeve 13 having both ends open is adopted as the tubular guide member. 3 (b) is an external view and a cross-sectional view of the large current probe pin 20 in which a barrel 23 having an opening at one end and a closed end at the other end is used for the tubular guide member. FIG. Is to accommodate the plunger 31 (advance / retreat member) and the coil spring 32 (biasing member) in the barrel 33 (cylindrical guide member), and then "caulking" the open end 33a of the barrel 33 to prevent them from coming off. 3A is an external view and a cross-sectional view of the probe pin 30, and FIG. 3D is an external view of a socket (connector) provided with a louver (cylindrical contactor).

典型的な直棒状の大電流用プローブピン10は(図3(a),特許文献1参照)、真鍮等の金属製で導電性のプランジャ11(進退部材)と、プランジャ11を遊挿しうるコイルばね12(付勢部材)と、プランジャ11を挿通しうる円筒状のスリーブ13(筒状案内部材)とを具えたものであり、プランジャ11が細長い丸棒状に形成され、スリーブ13がプランジャ11と摺動可能かつ軸方向移動可能に嵌合した状態で、コイルばね12がスリーブ13の上端とプランジャ11の上端部とを離隔させるよう押すことで、プランジャ11が上方へ付勢されるようになっている。しかも、この大電流用プローブピン10は、プランジャ11の下端部がスリーブ13から突き出ていて電線端部を接続できるようになっており、コイルばね12がスリーブ13の外に設けられている。 A typical straight rod-shaped probe pin 10 for a large current (see FIG. 3A, Patent Document 1) is a metal conductive plunger 11 (advancing / retreating member) such as brass and a coil into which the plunger 11 can be loosely inserted. It is provided with a spring 12 (a urging member) and a cylindrical sleeve 13 (cylindrical guide member) through which a plunger 11 can be inserted. The plunger 11 is formed in an elongated round bar shape, and the sleeve 13 is formed with the plunger 11. The plunger 11 is urged upward by pushing the coil spring 12 so as to separate the upper end of the sleeve 13 and the upper end of the plunger 11 in a state where the coil spring 12 is fitted so as to be slidable and movable in the axial direction. ing. Moreover, in the probe pin 10 for large current, the lower end portion of the plunger 11 protrudes from the sleeve 13 so that the end portion of the electric wire can be connected, and the coil spring 12 is provided outside the sleeve 13.

また、他の大電流用プローブピン20は(図3(b)参照)、やはり直棒状のものであるが、プランジャ21(進退部材)の概ね下半分と、コイルばね22(付勢部材)の全部とを、バレル23(筒状案内部材)の中空に収めている。
これらの大電流用プローブピン10,20では、プランジャ11,21(進退部材)の上端面(突出端面)に、耐摩耗性に優れた当接部材が取り付けられて、耐久性が高められるとともに、その当接部材の上面の当接部位に、角錐状突起の接触部が多数形成されて、接触性や導電性が高められており、5A〜20Aといった大きな電流を低抵抗で通せるようになっている。
The other probe pin 20 for large current (see FIG. 3B) is also a straight rod, but the lower half of the plunger 21 (advancing / retreating member) and the coil spring 22 (biasing member). All of them are housed in the hollow of the barrel 23 (cylindrical guide member).
In these high current probe pins 10 and 20, a contact member having excellent wear resistance is attached to the upper end surface (protruding end surface) of the plungers 11 and 21 (advancing / retreating member) to improve durability and improve durability. A large number of contact portions of pyramidal protrusions are formed on the contact portion on the upper surface of the contact member to improve the contact property and conductivity, and a large current such as 5A to 20A can be passed with low resistance. ing.

また、他の直棒状のプローブピン30は(図3(c)参照)、大電流用でなく、2A以下の通電を想定したものであり、小径部と大径部とからなるプランジャ31(進退部材)の大径部と、コイルばね32(付勢部材)の全部とを、バレル33(筒状案内部材)の中空に収めている。しかも、このプローブピン30は、バレル33の開口端部33aに「かしめ」加工が施されて、開口端部33aが窄まっており、それにプランジャ31の大径部が当たるため、プランジャ31がバレル33から抜け落ちることがないので、プランジャ31が上向きであろうと下向きであろうと横向きであろうと任意の姿勢で使用することができるようになっている。
これらのプローブピン20,30では、プランジャ21,31の外周面とバレル23,33の中空内壁面との接触により、プローブピン両端部の導通が確保される。
Further, the other straight rod-shaped probe pin 30 (see FIG. 3C) is not for a large current, but is assumed to be energized at 2 A or less, and is a plunger 31 (advance / retreat) composed of a small diameter portion and a large diameter portion. The large diameter portion of the member) and the entire coil spring 32 (biasing member) are housed in the hollow of the barrel 33 (cylindrical guide member). Moreover, in this probe pin 30, the open end 33a of the barrel 33 is "caulked" to narrow the open end 33a, and the large diameter portion of the plunger 31 hits the open end 33a, so that the plunger 31 is barreled. Since it does not fall out of 33, the plunger 31 can be used in any posture regardless of whether it is facing upward, downward, or sideways.
In these probe pins 20 and 30, continuity is ensured at both ends of the probe pins by contact between the outer peripheral surfaces of the plungers 21 and 31 and the hollow inner wall surfaces of the barrels 23 and 33.

さらに(図3(d),特許文献2参照)、プローブピンではないが、コネクタ(40,45)のソケット40には、基体部41の中空にルーバー42(筒状接触子)を挿着したものもある。このルーバー42は、両端解放の薄い導電性筒体からなり、中間部分が少し縊れて両端部よりも小径になっている。しかも、その縊れたところに、半径方向の弾性変形容易性を付与するため、幾本かのスリットが形成されている。
そのため、プラグの棒状接触子45をソケット40のルーバー42(筒状接触子)に挿入すると、棒状接触子45とルーバー42(筒状接触子)とが適度な接触圧で嵌合して、安定した電気導通状態が確立される。
Further (see FIG. 3D, Patent Document 2), although not a probe pin, a louver 42 (cylindrical contactor) was inserted into the socket 40 of the connector (40, 45) in the hollow of the base portion 41. Some are. The louver 42 is made of a thin conductive cylinder with both ends open, and the middle portion is slightly twisted to have a smaller diameter than both ends. Moreover, some slits are formed in the entangled part in order to impart easiness of elastic deformation in the radial direction.
Therefore, when the rod-shaped contact 45 of the plug is inserted into the louver 42 (cylindrical contact) of the socket 40, the rod-shaped contact 45 and the louver 42 (cylindrical contact) are fitted with an appropriate contact pressure and are stable. The electrical conduction state is established.

特開2011−137791号公報Japanese Unexamined Patent Publication No. 2011-137791 特開2003−132975号公報Japanese Unexamined Patent Publication No. 2003-132975

このような従来の直棒状プローブピンのうち、大電流用プローブピン10,20では、プランジャ11の上端面に対する当接部材の装備(図3(a),(b)参照)や、コイルばね12,22の強化、さらにはプランジャ11の下端部に対する電線端部の接続(図3(a)参照)あるいはプランジャ21の外周面とバレル23の中空内壁面との大きな接触面積の確保などによって、測定時の通過電流が比較的大きくてもプローブピンの両端間の電圧が極小に保たれるようになっている。 Among such conventional straight rod-shaped probe pins, the large current probe pins 10 and 20 are equipped with a contact member for the upper end surface of the plunger 11 (see FIGS. 3A and 3B) and the coil spring 12 , 22 is strengthened, and the wire end is connected to the lower end of the plunger 11 (see FIG. 3A), or a large contact area between the outer peripheral surface of the plunger 21 and the hollow inner wall surface of the barrel 23 is secured. The voltage between both ends of the probe pin is kept to a minimum even if the passing current is relatively large.

これに対し、中空収容物31,32の抜け防止用かしめ加工をバレル33の開口端部33aに施したプローブピン30は(図3(c)参照)、使用時の姿勢自由度が高いが、わりと細身でバネ力が弱めなうえプランジャ31の外周面とバレル33の中空内壁面との接触面積が少なめであるといったことから、プランジャ31とバレル33との間の電気抵抗が大電流用プローブピン20と比べると大きいので、測定時の通過電流が大きいとプローブピンの両端間の電圧が過大になるおそれがあるため、通過電流の比較的小さい箇所に係る測定に多用されている。 On the other hand, the probe pin 30 in which the hollow inclusions 31 and 32 are caulked to prevent them from coming off at the open end 33a of the barrel 33 (see FIG. 3C) has a high degree of freedom in posture during use. Since it is rather slender and the spring force is weak and the contact area between the outer peripheral surface of the plunger 31 and the hollow inner wall surface of the barrel 33 is small, the electrical resistance between the plunger 31 and the barrel 33 is a probe for a large current. Since it is larger than the pin 20, if the passing current at the time of measurement is large, the voltage between both ends of the probe pin may become excessive. Therefore, it is often used for the measurement at a place where the passing current is relatively small.

ところが、近年、このような使い易いプローブピン30を今までより通過電流の大きい箇所に係る測定にも使用したいという要望が高まってきた。
そして、それに応えるには、プランジャ31とバレル33との間の電気抵抗を小さくすることが必要であり、それを大電流用プローブピン20ほど大形化することなく実現するには、既述したソケット40のルーバー42のように適度な接触圧でプランジャ31と嵌合する謂わば電気導通安定確立部材を導入して、それをプランジャ31とバレル33との間に介在させることが考えられる。
However, in recent years, there has been an increasing demand for using such an easy-to-use probe pin 30 for measurement of a portion having a larger passing current than before.
In order to respond to this, it is necessary to reduce the electrical resistance between the plunger 31 and the barrel 33, and in order to realize this without making it as large as the probe pin 20 for large current, it has already been described. It is conceivable to introduce a so-called electrical conduction stability establishment member that fits with the plunger 31 with an appropriate contact pressure like the louver 42 of the socket 40, and interpose it between the plunger 31 and the barrel 33.

しかしながら、新たな部材の追加導入には、部材費ばかりか組立や調整などの工費まで嵩むうえ、その追加部材を収めるバレル中空の長さが増加するのに伴ってプローブピンの全長が増加する、といった不都合な一面もある。
そこで、小電流にはもとより大電流の通電にも能う抜け防止タイプの大電流用プローブピンであって、プランジャ(進退部材)に対して適度な接触圧で嵌合するルーバー等(筒状接触子)をバレル(筒状案内部材)の中空に導入しても工費や全長の増加が少なくて済む大電流用プローブピンを、実現することが、技術的な課題となる。
However, the introduction of additional members increases not only the cost of the members but also the construction costs such as assembly and adjustment, and the total length of the probe pin increases as the length of the hollow barrel for accommodating the additional members increases. There is also an inconvenient aspect such as.
Therefore, it is a probe pin for large current that can prevent not only small current but also large current, and is a louver or the like (cylindrical contact) that fits into the plunger (advance / retreat member) with an appropriate contact pressure. It is a technical issue to realize a probe pin for a large current in which the construction cost and the increase in the total length are small even if the child) is introduced into the hollow of the barrel (cylindrical guide member).

本発明の大電流用プローブピンは(解決手段1)、このような課題を解決するために創案されたものであり、一端から有底の中空が穿孔された導電性の筒状案内部材と、小径部と大径部とを具備しており前記小径部の先端部を前記中空から突き出す状態で前記大径部が前記中空に収められた導電性の進退部材と、前記中空の底部寄りに収められていて前記進退部材を前記中空の開口側へ押す付勢部材とを備えた大電流用プローブピンにおいて、筒状の環状幹部とそこから複数に枝分かれした分岐枝部とを具備した導電性の筒状接触子が、前記筒状案内部材の前記中空に圧入されて前記中空の開口寄りに止まるとともに前記進退部材の前記小径部を挿通させており、前記筒状接触子の前記分岐枝部が、何れも、弾性変形して前記小径部の外周面に接触しており、前記進退部材の前記大径部が前記筒状接触子のうち前記付勢部材寄りの端面に当接することにより前記進退部材の抜けが防止されるようになっていることを特徴とする。 The probe pin for large current of the present invention (Solution 1) was devised to solve such a problem, and includes a conductive tubular guide member having a bottomed hollow bore from one end. It is provided with a small-diameter portion and a large-diameter portion, and the large-diameter portion is housed in a conductive advancing / retreating member in which the large-diameter portion is housed in the hollow while the tip portion of the small-diameter part is projected from the hollow, and is housed near the bottom of the hollow. A conductive probe pin for a large current including an urging member that pushes the advancing / retreating member toward the hollow opening side, and includes a tubular annular trunk portion and a branch branch portion branched from the tubular annular trunk portion. The tubular contact is press-fitted into the hollow of the tubular guide member and stops near the opening of the hollow, and at the same time, the small diameter portion of the advancing / retreating member is inserted through the hollow, and the branch branch portion of the tubular contact is formed. In each case, the small-diameter portion is elastically deformed and is in contact with the outer peripheral surface of the small-diameter portion, and the large-diameter portion of the advance / retreat member is in contact with the end surface of the tubular contactor closer to the urging member. It is characterized in that the member is prevented from coming off.

このような本発明の大電流用プローブピンにあっては(解決手段1)、電気導通安定確立部材である筒状接触子を導入したことにより、進退部材と筒状案内部材との間の電気抵抗が小さくなるので、小電流ばかりか大電流の通電にも能うこととなる。
また、圧入によって組み込まれた筒状接触子によって進退部材の抜けが防止されることから、圧入よりも工費の掛かる「かしめ」加工が不要になるので、その差の分だけ工費が削減される或いは増加が抑制される。
In such a probe pin for a large current of the present invention (solution 1), by introducing a tubular contactor which is a member for establishing stability of electrical conduction, electricity between the advancing / retreating member and the tubular guide member is obtained. Since the resistance becomes smaller, it can be used not only for small currents but also for large currents.
In addition, since the tubular contactor incorporated by press-fitting prevents the advancing / retreating member from coming off, the "caulking" process, which requires more construction cost than press-fitting, is not required, and the construction cost can be reduced by the difference. The increase is suppressed.

さらに、進退部材の軸心を筒状案内部材の軸心に合わせる位置決め機能が、筒状案内部材の中空内壁面と進退部材の大径部の外周面との嵌合によって発揮されるだけでなく、それに加えて、進退部材の小径部の外周面と筒状接触子の分岐枝部との接触によっても発揮されることから、進退部材の大径部を多少なら問題なく短縮することができる。
そのため、そのような進退部材の大径部の短縮分と上述の「かしめ」取り止め部の短縮分との合計長だけ、筒状接触子の導入による増加長が、相殺・減殺されるので、プローブピン全長の増加が少なくて済むことになる。
Further, the positioning function of aligning the axial center of the advancing / retreating member with the axial center of the tubular guide member is not only exerted by fitting the hollow inner wall surface of the tubular guide member with the outer peripheral surface of the large diameter portion of the advancing / retreating member. In addition to that, since it is also exhibited by the contact between the outer peripheral surface of the small diameter portion of the advancing / retreating member and the branch branch portion of the tubular contactor, the large diameter portion of the advancing / retreating member can be shortened without any problem.
Therefore, the increase length due to the introduction of the tubular contactor is offset or diminished by the total length of the shortened portion of the large diameter portion of the advancing / retreating member and the shortened portion of the above-mentioned "caulking" retaining portion. The increase in the total length of the pin is small.

本発明の実施例1について、大電流用プローブピンの構造を示し、(a)が外観図、(b)が内部を破線で示した外観図、(c)が断面図、(d)が展開図、(e)がコンタクト(筒状接触子)の素材図、(f)の上側部分がコンタクトを環状幹部の方から見た外観図、(f)の上側部分がコンタクトを分岐枝部の方から見た外観図、(g)がプランジャ(進退部材)を押し込まれた大電流用プローブピンの断面図である。Regarding Example 1 of the present invention, the structure of a probe pin for a large current is shown, (a) is an external view, (b) is an external view showing the inside with a broken line, (c) is a sectional view, and (d) is developed. The figure, (e) is a material diagram of a contact (cylindrical contact), the upper part of (f) is an external view of the contact as seen from the annular trunk, and the upper part of (f) is the branch branch of the contact. (G) is a cross-sectional view of a probe pin for a large current in which a plunger (advancing / retreating member) is pushed. 本発明の実施例2について、大電流用プローブピンの構造を示し、(a)が外観図、(b)が内部を破線で示した外観図、(c)が断面図、(d)が展開図、(e)がプランジャを押し込まれた大電流用プローブピンの断面図である。Regarding Example 2 of the present invention, the structure of the probe pin for large current is shown, (a) is an external view, (b) is an external view showing the inside with a broken line, (c) is a sectional view, and (d) is developed. FIG. 3 (e) is a cross-sectional view of a probe pin for a large current in which a plunger is pushed. 従来品の構造を示し、(a)が筒状案内部材に両端開口のスリーブを採用した大電流用プローブピンの外観図と断面図、(b)が筒状案内部材に一端開口で他端閉塞のバレルを採用した大電流用プローブピンの外観図、(c)がバレルにプランジャ等の抜け防止用の加工を施したプローブピンの外観図と断面図、(d)がルーバー(筒状接触子)を具備したソケット(コネクタ)の外観図等である。The structure of the conventional product is shown, (a) is an external view and a cross-sectional view of a probe pin for large current that employs a sleeve with both ends open in the tubular guide member, and (b) is a tubular guide member with one end open and the other end closed. (C) is an external view and cross-sectional view of a probe pin with a plunger or the like processed to prevent it from coming off, and (d) is a louver (cylindrical contactor). ) Is an external view of a socket (connector) provided with).

このような本発明の大電流用プローブピンについて、これを実施するための具体的な形態を、以下の実施例1〜2により説明する。
図1に示した実施例1は、上述した解決手段1(出願当初の請求項1)を具現化したものであり、図2に示した実施例2は、その変形例である。
A specific embodiment for carrying out such a probe pin for a large current of the present invention will be described with reference to Examples 1 and 2 below.
The first embodiment shown in FIG. 1 embodies the above-mentioned solution 1 (claim 1 at the time of filing the application), and the second embodiment shown in FIG. 2 is a modified example thereof.

本発明の大電流用プローブピンの実施例1について、その具体的な構成を、図面を引用して説明する。
図1(a)〜(d)は、自由状態の大電流用プローブピン50の全体を示しており、(a)が外観図、(b)が内部を破線で示した外観図、(c)が断面図、(d)が展開外観図である。また、図1のうち(e)は、コンタクト54(筒状接触子)の板状の素材の表面図、(f)は、上側部分がコンタクト54を環状幹部54a側から見た外観図、下側部分がコンタクト54を分岐枝部54b側から見た外観図、(g)は、プランジャ51(進退部材)を押し込まれた使用状態の大電流用プローブピン50の断面図である。
The specific configuration of the first embodiment of the probe pin for large current of the present invention will be described with reference to the drawings.
1 (a) to 1 (d) show the whole probe pin 50 for a large current in a free state, (a) is an external view, (b) is an external view showing the inside with a broken line, (c). Is a cross-sectional view, and (d) is a developed external view. Further, in FIG. 1, (e) is a surface view of a plate-shaped material of the contact 54 (cylindrical contact), and (f) is an external view of the contact 54 viewed from the annular trunk portion 54a side in the upper portion. The side portion is an external view of the contact 54 viewed from the branch branch portion 54b side, and (g) is a cross-sectional view of the probe pin 50 for a large current in a used state in which the plunger 51 (advancing / retreating member) is pushed.

この大電流用プローブピン50は、既述したプローブピン30を小電流だけでなく5A以上の大電流でも不都合なく通せるよう電気抵抗を低減させる改造を施したものであり、進退部材としてのプランジャ51と、付勢部材としてのコイルばね52と、筒状案内部材としてのバレル53と、筒状接触子としてのコンタクト54とを具えている。
プランジャ51(進退部材)は、既述のプランジャ31を踏襲したものであり、電気良導体からなる小径部51aと大径部51bとを具備していることや、各部51a,51bの径は既述のものと同じであるが、小径部51aの長さは既述のものより少し長くなっており、大径部51bの長さは既述のものより少し短くなっている。
The probe pin 50 for a large current is modified to reduce the electrical resistance so that the above-mentioned probe pin 30 can pass through not only a small current but also a large current of 5 A or more without any inconvenience, and is a plunger as an advancing / retreating member. It includes a 51, a coil spring 52 as an urging member, a barrel 53 as a tubular guide member, and a contact 54 as a tubular contactor.
The plunger 51 (advance / retreat member) follows the plunger 31 described above, and includes a small diameter portion 51a and a large diameter portion 51b made of good electric conductors, and the diameters of the respective portions 51a and 51b are described above. However, the length of the small diameter portion 51a is slightly longer than that described above, and the length of the large diameter portion 51b is slightly shorter than that described above.

コイルばね52(付勢部材)は、形状ばかりかバネ特性などまで既述のコイルばね32と同じものでも良く、バレル53の中空53bに収められて中空53bの底部寄りに置かれる。それから、プランジャ51も大径部51bを先にしてバレル53の中空53bに収められ、コイルばね52に寄せられるので、プランジャ51が、小径部51aの先端部をバレル53の中空53bの中空から突き出す状態で大径部51bを中空53bに収めているものになるとともに、コイルばね52が、バレル53の中空53bに収められていてプランジャ51を中空53bの開口側へ押すものとなる。 The coil spring 52 (urging member) may be the same as the coil spring 32 described above not only in shape but also in spring characteristics, and is housed in the hollow 53b of the barrel 53 and placed near the bottom of the hollow 53b. Then, the plunger 51 is also housed in the hollow 53b of the barrel 53 with the large diameter portion 51b first, and is brought close to the coil spring 52, so that the plunger 51 projects the tip of the small diameter portion 51a from the hollow 53b of the barrel 53. In this state, the large diameter portion 51b is housed in the hollow 53b, and the coil spring 52 is housed in the hollow 53b of the barrel 53 to push the plunger 51 toward the opening side of the hollow 53b.

バレル53(筒状案内部材)は、既述のバレル33を踏襲したものであり、段付き丸棒状の外観をした電気良導体からなるが、有底の中空53bが開口端部53aから他端の手前まで穿孔された形状のものとなっている。各段の外径や中空53bの径などは既述のバレル33のものと同じあるが、開口端部33aに「かしめ」加工が施されることは無く、中空53bの深さ及びバレル53の全長が、既述のバレル33のそれらより多少ではあるが長くなっている。 The barrel 53 (cylindrical guide member) follows the barrel 33 described above, and is made of a good electric conductor having a stepped round bar-like appearance, but the bottomed hollow 53b is at the other end from the opening end 53a. It has a shape that is perforated to the front. The outer diameter of each stage and the diameter of the hollow 53b are the same as those of the barrel 33 described above, but the opening end portion 33a is not "caulked", and the depth of the hollow 53b and the barrel 53 The total length is slightly longer than those of the barrel 33 described above.

コンタクト54(筒状接触子)は、既述のルーバー42を軸方向に二分割したかのようなものであり、円筒状の環状幹部54aと、そこから複数(図示の例では4本)に枝分かれした羽と呼ばれる分岐枝部54b,…,54bとからなる。これは、例えば、山脈形に打ち抜いた電気良導体の平板(図1(e)参照)を筒状に丸めるとともに、複数の分岐枝部54bを何れも軸心に寄せる、といった成形加工にて作られる。
そして、コイルばね52とプランジャ51とを収めたバレル53の中空53bに対し、開口端部53aから環状幹部54aを圧入し、それから更に分岐枝部54bを押し込むことで、コンタクト54の全体が中空53bに収まる。
The contact 54 (cylindrical contactor) is as if the above-mentioned louver 42 is divided into two in the axial direction, and is divided into a cylindrical annular trunk portion 54a and a plurality of contacts (four in the illustrated example). It consists of branched branches 54b, ..., 54b called branched wings. This is made by, for example, a molding process in which a flat plate of a good electric conductor punched into a mountain range shape (see FIG. 1 (e)) is rolled into a tubular shape, and a plurality of branch branches 54b are all brought to the axial center. ..
Then, the annular trunk portion 54a is press-fitted from the opening end portion 53a into the hollow 53b of the barrel 53 containing the coil spring 52 and the plunger 51, and then the branch branch portion 54b is further pushed in so that the entire contact 54 is hollow 53b. Fits in.

こうして、大電流用プローブピン50が組み上がり、単体の自由状態では(図1(a)〜(c)参照)、バレル53の中空53b内には、底部寄り部分にコイルばね52が伸縮可能な状態で保持され、開口端部53a寄り部分にコンタクト54が固定保持され、コイルばね52の一端とコンタクト54の環状幹部54aとの間にプランジャ51の大径部51bが挟持され、そこからプランジャ51の小径部51aがコンタクト54の軸心を貫通して更にバレル53の開口端部53aも貫いて、バレル53から外部へ突き出ている。 In this way, the probe pin 50 for large current is assembled, and in the free state of a single unit (see FIGS. 1A to 1C), the coil spring 52 can be expanded and contracted in the hollow 53b of the barrel 53 near the bottom. The contact 54 is fixedly held in a state close to the opening end portion 53a, and the large diameter portion 51b of the plunger 51 is sandwiched between one end of the coil spring 52 and the annular trunk portion 54a of the contact 54, from which the plunger 51 is held. The small diameter portion 51a of the above penetrates the axial center of the contact 54 and further penetrates the open end portion 53a of the barrel 53, and protrudes outward from the barrel 53.

そして、このような自由状態では、コンタクト54(筒状接触子)がプランジャ51(進退部材)の小径部51aを挿通させているとともに、コンタクト54の複数の分岐枝部54bが、何れも、弾性変形して小径部51aの外周面に接触し続けることから、プランジャ51とコンタクト54との電気抵抗ひいてはプランジャ51とバレル53との電気抵抗が極小に保たれるとともに、プランジャ51の小径部51aをバレル53の中空53bの中心に寄せる求心力が働くので、プランジャ51の大径部51bが短くて済むものとなっている。しかも、その接触によるプランジャ51とコンタクト54との摩擦力は、分岐枝部54bが片持ち梁のように形成されている等のことで、弾性変形による弾撥力が適度に軽減緩和されているので、コイルばね52の弾撥力によるプランジャ51の進退運動を妨げないようなっている。 Then, in such a free state, the contact 54 (cylindrical contact) inserts the small diameter portion 51a of the plunger 51 (advancing / retreating member), and the plurality of branch branch portions 54b of the contact 54 are all elastic. Since it is deformed and continues to contact the outer peripheral surface of the small diameter portion 51a, the electric resistance between the plunger 51 and the contact 54, and thus the electric resistance between the plunger 51 and the barrel 53 is kept to a minimum, and the small diameter portion 51a of the plunger 51 is kept to a minimum. Since the centripetal force that approaches the center of the hollow 53b of the barrel 53 acts, the large diameter portion 51b of the plunger 51 can be shortened. Moreover, the frictional force between the plunger 51 and the contact 54 due to the contact is moderately reduced and relaxed due to the elastic deformation of the branch branch portion 54b formed like a cantilever. Therefore, the elastic force of the coil spring 52 does not hinder the advance / retreat movement of the plunger 51.

また、その自由状態では、プランジャ51(進退部材)の大径部51bがコンタクト54(筒状接触子)のコイルばね52(付勢部材)寄りの端面に当接することで、コンタクト54がバレル53(筒状案内部材)の中空53bから抜け落ちることが防止されるので、既述のプローブピン30に有った開口端部33aの「かしめ」が不要なものとなっている。さらに、コンタクト54の追加導入により、バレル53ひいては大電流用プローブピン50の全長が既述のバレル33ひいてはプローブピン30の全長より増加しているが、その増加量は、コンタクト54の全長よりは小さく、コンタクト54の全長から、既述のバレル33の「かしめ」の厚み分と、既述のプランジャ31の大径部からプランジャ51の大径部51bへの長さ短縮分とを、差し引いた長さにとどまる。 Further, in the free state, the large diameter portion 51b of the plunger 51 (advancing / retreating member) comes into contact with the end surface of the contact 54 (cylindrical contactor) near the coil spring 52 (biasing member), so that the contact 54 comes into contact with the barrel 53. Since it is prevented from falling out of the hollow 53b of the (cylindrical guide member), the "caulking" of the opening end portion 33a of the probe pin 30 described above is unnecessary. Further, due to the additional introduction of the contact 54, the total length of the barrel 53 and thus the probe pin 50 for a large current is increased from the total length of the barrel 33 and the probe pin 30 described above, but the amount of increase is larger than the total length of the contact 54. It is small, and the thickness of the "caulking" of the barrel 33 described above and the length reduction from the large diameter portion of the plunger 31 to the large diameter portion 51b of the plunger 51 described above are subtracted from the total length of the contact 54. Stay in length.

この実施例1の大電流用プローブピン50について、その使用態様及び動作を説明する。大電流用プローブピン50は、測定時にプランジャ51(進退部材)の小径部51aの先端を被検体に一時当接させて使用する点で、既述のプローブピン10,30と同様に使用されるが、測定に先立つ他端側への配線については、大電流用プローブピン10のプランジャ11(進退部材)の下端部と同様にしてバレル53(筒状案内部材)の先端部に電線を接続しても良く、プローブピン30のバレル33(筒状案内部材)の先端部と同様にしてバレル53(筒状案内部材)の先端部をプリント基板の配線部に稠密植設したり既述のソケット40孔に挿着したりしても接続できるので、使い易い。 The usage mode and operation of the large current probe pin 50 of Example 1 will be described. The large current probe pin 50 is used in the same manner as the probe pins 10 and 30 described above in that the tip of the small diameter portion 51a of the plunger 51 (advancing / retreating member) is temporarily brought into contact with the subject during measurement. However, for wiring to the other end prior to measurement, an electric wire is connected to the tip of the barrel 53 (cylindrical guide member) in the same manner as the lower end of the plunger 11 (advance / retreat member) of the probe pin 10 for large current. Alternatively, the tip of the barrel 53 (cylindrical guide member) may be densely planted in the wiring portion of the printed circuit board in the same manner as the tip of the barrel 33 (cylindrical guide member) of the probe pin 30, or the socket described above. It is easy to use because it can be connected even if it is inserted into the 40 holes.

そして、測定時にプランジャ51の小径部51aの先端が被検体に押し当てられると、プランジャ51(進退部材)がコイルばね52(付勢部材)を押し縮めながらバレル53(筒状案内部材)の中空53b内に後退し(図1(g)参照)、被検体から離れるとプランジャ51の小径部51aとコンタクト54の分岐枝部54bとの摩擦力に勝るコイルばね52の弾撥力によって押されてプランジャ51が前進するが(図1(a)〜(c)参照)、その際、プランジャ51の大径部51bが中空53bの内周壁によって案内されるとともに、プランジャ51の小径部51aの先端寄りの部分がコンタクト54(筒状接触子)の複数の分岐枝部54bによって案内されるので、プランジャ51は、バレル53の軸心に沿って円滑に進退する。 Then, when the tip of the small diameter portion 51a of the plunger 51 is pressed against the subject during measurement, the plunger 51 (advancing / retreating member) presses and contracts the coil spring 52 (biasing member) while the barrel 53 (cylindrical guide member) is hollow. It recedes into 53b (see FIG. 1 (g)), and when it is separated from the subject, it is pushed by the repulsive force of the coil spring 52 that exceeds the frictional force between the small diameter portion 51a of the plunger 51 and the branch branch portion 54b of the contact 54. The plunger 51 advances (see FIGS. 1 (a) to 1 (c)), but at that time, the large diameter portion 51b of the plunger 51 is guided by the inner peripheral wall of the hollow 53b, and the plunger 51 is closer to the tip of the small diameter portion 51a. Is guided by a plurality of branch branches 54b of the contact 54 (cylindrical contactor), so that the plunger 51 smoothly advances and retreats along the axial center of the barrel 53.

こうして、この大電流用プローブピン50は、プローブピン30と同様、手軽に使用されて、不都合なく動作する。
しかも、コンタクト54(筒状接触子)の導入によってプローブピン30よりも拡大された通電許容範囲は、2A以下の小電流から5A以上の大電流にまで及んでいる。
In this way, the probe pin 50 for large current is easily used and operates without any inconvenience, like the probe pin 30.
Moreover, the energization allowable range expanded beyond the probe pin 30 by the introduction of the contact 54 (cylindrical contact) ranges from a small current of 2 A or less to a large current of 5 A or more.

本発明の大電流用プローブピンの実施例2について、その具体的な構成を、図面を引用して説明する。図2(a)〜(d)は、自由状態の大電流用プローブピン60の全体を示しており、(a)が外観図、(b)が内部を破線で示した外観図、(c)が断面図、(d)が展開図である。また、図2(e)は、プランジャ61(進退部材)を押し込まれた使用状態の大電流用プローブピン60の断面図である。 The specific configuration of the second embodiment of the probe pin for large current of the present invention will be described with reference to the drawings. 2 (a) to 2 (d) show the entire probe pin 60 for a large current in a free state, (a) is an external view, (b) is an external view showing the inside with a broken line, (c). Is a cross-sectional view, and (d) is a developed view. Further, FIG. 2E is a cross-sectional view of the probe pin 60 for a large current in a used state in which the plunger 61 (advancing / retreating member) is pushed.

この大電流用プローブピン60が上述した実施例1の大電流用プローブピン50と相違するのは、一体物だったプランジャ51が二体物のプランジャ61+62(進退部材)になった点と、コンタクト54(筒状接触子)がバレル53の中空53bへの挿着に際し分岐枝部54bを先にし環状幹部54aを後にして圧入されて環状幹部54aがバレル53の開口端部53aの所に位置し分岐枝部54bが中空53bの中央付近に位置している点である。プランジャ61+62(進退部材)は、プランジャ51の小径部51aを変形したプランジャ要部61(小径部)と、プランジャ51の大径部51bを踏襲した大径部62(大径部)とに分かれており、バレル53の中空53bの中で両者を組み合わせるようになっている。 The large current probe pin 60 differs from the large current probe pin 50 of the first embodiment described above in that the one-piece plunger 51 has become a two-body plunger 61 + 62 (advance / retreat member), and the contact. When the 54 (cylindrical contact) is inserted into the hollow 53b of the barrel 53, the branch branch portion 54b is first and the annular trunk 54a is then press-fitted, and the annular trunk 54a is located at the open end 53a of the barrel 53. This is a point where the branch branch portion 54b is located near the center of the hollow 53b. The plunger 61 + 62 (advance / retreat member) is divided into a plunger main part 61 (small diameter part) which is a modification of the small diameter part 51a of the plunger 51 and a large diameter part 62 (large diameter part) which follows the large diameter part 51b of the plunger 51. The two are combined in the hollow 53b of the barrel 53.

プランジャ要部61は、電気良導体からなる一本の丸棒状の部材であるが、径の異なる幾つかの部分を具備している。具体的には、測定時に被検体に一時当接させる先端部61aと、それに続く中径部61bと、プランジャ51の小径部51aとほぼ同径の小径部61cと、それより小径の端部であって先端部61aと反対側の位置する差込部61dと、中径部61bと小径部61cと間に位置するテーパ部61eとを具備しており、それらのうち、先端部61aと中径部61bとテーパ部61eと小径部61cとが、大径部62と対比される小径部に含まれる。このようなプランジャ要部61は、先端部61aがプランジャ51の先端部より大きくなっているので、被検体との当接を繰り返しても、大電流を通しても、痛みが少なくて済むものとなっている。 The plunger main part 61 is a single round bar-shaped member made of a good electric conductor, but includes several parts having different diameters. Specifically, the tip portion 61a that is temporarily brought into contact with the subject at the time of measurement, the subsequent medium diameter portion 61b, the small diameter portion 61c having substantially the same diameter as the small diameter portion 51a of the plunger 51, and the end portion having a smaller diameter. It is provided with an insertion portion 61d located on the opposite side of the tip portion 61a and a tapered portion 61e located between the middle diameter portion 61b and the small diameter portion 61c, of which the tip portion 61a and the middle diameter are provided. The portion 61b, the tapered portion 61e, and the small diameter portion 61c are included in the small diameter portion to be compared with the large diameter portion 62. Since the tip portion 61a of such a plunger main part 61 is larger than the tip portion of the plunger 51, pain can be reduced even if the contact with the subject is repeated or a large current is passed. There is.

大径部62は、少し厚めの円板状体からなるが、その中心・軸心に貫通孔が形成されたものである。バレル53の中空53bにコイルばね52と大径部62とコンタクト54とをその順に収めてからプランジャ要部61を挿入することで大電流用プローブピン60が組み立てられるが、そのとき、大径部62の貫通孔にプランジャ要部61の差込部61dが差し込まれる。そして、その状態で、さらにはプランジャ要部61が押し込まれたときにも、常時、コイルばね52によって大径部62がプランジャ要部61に押しつけられるので、プランジャ要部61と大径部62とが一緒に進退するようになっている。 The large-diameter portion 62 is made of a slightly thick disk-shaped body, and has through holes formed in the center and the axial center thereof. The probe pin 60 for large current is assembled by inserting the coil spring 52, the large diameter portion 62, and the contact 54 in the hollow 53b of the barrel 53 in that order and then inserting the plunger main portion 61. At that time, the large diameter portion The insertion portion 61d of the plunger main part 61 is inserted into the through hole of 62. Then, in that state, even when the plunger main part 61 is pushed in, the large diameter part 62 is always pressed against the plunger main part 61 by the coil spring 52, so that the plunger main part 61 and the large diameter part 62 Are coming back and forth together.

この場合、プランジャ要部61のうち先端部61aから小径部61cまでの長さと上述したプランジャ51の小径部51aの長さとが等しく、大径部62の長さ・厚みと上述したプランジャ51の大径部51bの長さ・厚みとが等しいので、大電流用プローブピン60は取付や測定の仕様に関して上述の大電流用プローブピン50と高い互換性を示す。また、プランジャ61+62(進退部材)のうち、大径部62はコンタクト54の分岐枝部54bとの当接によって確実に抜けが防止される。 In this case, the length from the tip portion 61a to the small diameter portion 61c of the plunger main part 61 is equal to the length of the small diameter portion 51a of the plunger 51 described above, and the length and thickness of the large diameter portion 62 and the large diameter portion 51 described above are large. Since the length and thickness of the diameter portion 51b are equal, the high current probe pin 60 shows high compatibility with the above-mentioned high current probe pin 50 in terms of mounting and measurement specifications. Further, of the plunger 61 + 62 (advancing / retreating member), the large diameter portion 62 is surely prevented from coming off by abutment with the branch branch portion 54b of the contact 54.

また、プランジャ要部61は、コンタクト54の分岐枝部54bとの摩擦によって、自重程度の弱い力では抜けないように保持される。そのため、通常の使用状態であれば、大電流用プローブピン60も上述の大電流用プローブピン50と同様に自由な姿勢で使用することができる。それでいて、プランジャ要部61は、人為的に強く引っ張ると、上記の摩擦に打ち勝って移動して、大径部62をコンタクト54とコイルばね52との間に残したまま、バレル53から離脱するため、コンタクト54を抜き出すことなく、プランジャ要部61の交換や付け直しを行うことができる。そのため、大電流用プローブピン60は、プランジャ要部61の先端部61aが被検体への当接や通電の繰り返し等によって傷んだときなど、傷んで交換したくなったプランジャ要部61をバレル53の中空53bから開口側(図では上方)へ引き抜き、それから新品のプランジャ要部61を差し込むだけ、といった簡便な部品交換による補修で不具合を解消して使い続けることができる。 Further, the plunger main part 61 is held by friction with the branch branch part 54b of the contact 54 so as not to come off with a weak force of about its own weight. Therefore, under normal use conditions, the large current probe pin 60 can be used in a free posture like the above-mentioned large current probe pin 50. Nevertheless, when the plunger main part 61 is artificially pulled strongly, it overcomes the above friction and moves to separate from the barrel 53 while leaving the large diameter part 62 between the contact 54 and the coil spring 52. , The plunger main part 61 can be replaced or reattached without pulling out the contact 54. Therefore, the probe pin 60 for large current is a barrel 53 for the plunger main part 61 which is damaged and wants to be replaced when the tip portion 61a of the plunger main part 61 is damaged due to contact with a subject or repeated energization. By simply pulling out the hollow 53b from the hollow 53b to the opening side (upward in the figure) and then inserting a new plunger main part 61, the problem can be solved and the product can be continued to be used.

さらに、自由状態の大電流用プローブピン60では(図2(a)〜(c)参照)、プランジャ要部61のうち先端部61aと中径部61bと小径部61cの一部とがバレル53の中空53bから進出しているので、プランジャ61+62の径方向位置決めが、大径部62に対するバレル53の中空53bの内周壁によるものと、小径部61cに対するコンタクト54の分岐枝部54bによるものとだけで行われるところ、大径部62の位置決めは堅実になされるが、小径部61cに対するコンタクト54の分岐枝部54bによる位置決めは複数で完璧に揃えるのが困難なうえ大径部62の極近傍でなされるので、プランジャ要部61の先端部61aはバレル53の軸心から僅かであるが偏倚することが多い。 Further, in the probe pin 60 for large current in the free state (see FIGS. 2A to 2C), the tip portion 61a, the medium diameter portion 61b, and a part of the small diameter portion 61c of the plunger main parts 61 are the barrel 53. Since the plunger 61 + 62 is advanced from the hollow 53b, the radial positioning of the plunger 61 + 62 is only due to the inner peripheral wall of the hollow 53b of the barrel 53 with respect to the large diameter portion 62 and the branch branch portion 54b of the contact 54 with respect to the small diameter portion 61c. Although the positioning of the large-diameter portion 62 is steadily performed, it is difficult to perfectly align the positioning of the contact 54 with respect to the small-diameter portion 61c by the branch branch portion 54b, and in the very vicinity of the large-diameter portion 62. Since this is done, the tip portion 61a of the plunger main portion 61 is often slightly deviated from the axial center of the barrel 53.

一方、プランジャ要部61は、中径部61bの外径がコンタクト54の環状幹部54aの内径より僅かに小さくて、中径部61bと環状幹部54aとが嵌合状態では軸心をほぼ一致させた状態で摺動するようになっているため、測定時に先端部61aが押されてプランジャ要部61が後退すると、先ずテーパ部61eが環状幹部54aに遊嵌され、次いで中径部61bが環状幹部54aに嵌合される(図2(e)参照)。そうすると、その嵌合による強い求心力によって、プランジャ要部61の先端部61aが、バレル53に対する偏心を解消する向きに僅かではあるが横移動することから、被検体の当接部位の表面を軽く擦るため、薄い絶縁性の酸化皮膜が低い印加電圧下でも迅速に破れたりして被検体との導電性が高まるので、測定性能の向上が期待できる。 On the other hand, in the plunger main part 61, the outer diameter of the middle diameter portion 61b is slightly smaller than the inner diameter of the annular trunk portion 54a of the contact 54, and the axial centers of the plunger main portion 61 are substantially aligned when the middle diameter portion 61b and the annular trunk portion 54a are fitted. When the tip portion 61a is pushed and the plunger main portion 61 retracts during measurement, the tapered portion 61e is first loosely fitted to the annular trunk portion 54a, and then the middle diameter portion 61b is annular. It is fitted to the trunk portion 54a (see FIG. 2E). Then, due to the strong centripetal force due to the fitting, the tip portion 61a of the plunger main part 61 moves laterally in a direction for eliminating the eccentricity with respect to the barrel 53, so that the surface of the contact portion of the subject is lightly rubbed. Therefore, the thin insulating oxide film is rapidly torn even under a low applied voltage, and the conductivity with the subject is increased, so that the measurement performance can be expected to be improved.

[その他]
上記実施例では、単体の大電流用プローブピン50,60を図示して説明したが、一つの支持体に多数の大電流用プローブピン50,60を立設して使用しても良い。
また、上記実施例の大電流用プローブピン50,60は、5A以上の大電流が通る所でも的確に測定できるようになったものであるが、それに限られるものでなく、2A以下の小電流や、2A〜5Aの中電流が通る所でも、的確な測定に資するものである。
また、上記実施例では、コンタクト54の分岐枝部54bが4本であったが、分岐枝部54bの本数は、それに限られる訳でなく、例えば6本など、他の本数でも良い。
[Other]
In the above embodiment, the single high current probe pins 50 and 60 have been illustrated and described, but a large number of high current probe pins 50 and 60 may be erected and used on one support.
Further, the probe pins 50 and 60 for large current in the above embodiment can be accurately measured even in a place where a large current of 5 A or more passes, but the present invention is not limited to this, and a small current of 2 A or less is present. It also contributes to accurate measurement even in places where medium currents of 2A to 5A pass.
Further, in the above embodiment, the number of the branch branch portions 54b of the contact 54 is 4, but the number of the branch branch portions 54b is not limited to that, and may be another number such as 6, for example.

本発明の大電流用プローブピンは、半導体デバイスや、プリント配線板その他の回路基板などを対象とした電気的な検査や試験に利用することができる。 The probe pin for large current of the present invention can be used for electrical inspection and testing of semiconductor devices, printed wiring boards and other circuit boards.

10,20…大電流用プローブピン、30…プローブピン、
11,21,31…プランジャ(進退部材)、
12,22,32…コイルばね(付勢部材)、
13…スリーブ(筒状案内部材)、23…バレル(筒状案内部材)、
33…バレル(筒状案内部材)、33a…開口端部(かしめ部)、
40…ソケット(コネクタ)、41…基体部、42…ルーバー(筒状接触子)、
50…大電流用プローブピン、
51…プランジャ(進退部材)、51a…小径部、51b…大径部、
52…コイルばね(付勢部材)、
53…バレル(筒状案内部材)、53a…開口端部、53b…中空、
54…コンタクト(筒状接触子)、54a…環状幹部、54b…分岐枝部、
60…大電流用プローブピン、
61+62…プランジャ(進退部材)、61…プランジャ要部、
61a…先端部(被検体当接部)、61b…中径部、
61c…小径部、61d…差込部、61e…テーパ部、62…大径部
10, 20 ... Large current probe pin, 30 ... Probe pin,
11,2,31 ... Plunger (advance / retreat member),
12, 22, 32 ... Coil spring (urging member),
13 ... Sleeve (cylindrical guide member), 23 ... Barrel (cylindrical guide member),
33 ... Barrel (cylindrical guide member), 33a ... Open end (caulking),
40 ... Socket (connector), 41 ... Base part, 42 ... Louver (cylindrical contactor),
50 ... Probe pin for large current,
51 ... Plunger (advance / retreat member), 51a ... Small diameter part, 51b ... Large diameter part,
52 ... Coil spring (urging member),
53 ... barrel (cylindrical guide member), 53a ... open end, 53b ... hollow,
54 ... contact (cylindrical contactor), 54a ... annular trunk, 54b ... branch branch,
60 ... Probe pin for large current,
61 + 62 ... Plunger (advance / retreat member), 61 ... Plunger main part,
61a ... Tip (subject contact), 61b ... Medium diameter,
61c ... Small diameter part, 61d ... Insert part, 61e ... Tapered part, 62 ... Large diameter part

Claims (1)

一端から有底の中空が穿孔された導電性の筒状案内部材と、小径部と大径部とを具備しており前記小径部の先端部を前記中空から突き出す状態で前記大径部が前記中空に収められた導電性の進退部材と、前記中空の底部寄りに収められていて前記進退部材を前記中空の開口側へ押す付勢部材とを備えた大電流用プローブピンにおいて、筒状の環状幹部とそこから複数に枝分かれした分岐枝部とを具備した導電性の筒状接触子が、前記筒状案内部材の前記中空に圧入されて前記中空の開口寄りに止まるとともに前記進退部材の前記小径部を挿通させており、前記筒状接触子の前記分岐枝部が、何れも、弾性変形して前記小径部の外周面に接触しており、前記進退部材の前記大径部が前記筒状接触子のうち前記付勢部材寄りの端面に当接することにより前記進退部材の抜けが防止されるようになっていることを特徴とする大電流用プローブピン。 A conductive tubular guide member having a bottomed hollow formed from one end, a small diameter portion, and a large diameter portion are provided, and the large diameter portion is in a state where the tip portion of the small diameter portion protrudes from the hollow. A tubular probe pin for a large current including a conductive advancing / retreating member housed in a hollow and an urging member housed near the bottom of the hollow to push the advancing / retreating member toward the opening side of the hollow. A conductive tubular contact having an annular trunk and a branch branch portion branched from the annular trunk portion is press-fitted into the hollow of the tubular guide member and stops near the opening of the hollow, and the advance / retreat member of the advance / retreat member. The small diameter portion is inserted, and the branch branch portion of the tubular contactor is elastically deformed and is in contact with the outer peripheral surface of the small diameter portion, and the large diameter portion of the advancing / retreating member is the cylinder. A probe pin for a large current, characterized in that the advancing / retreating member is prevented from coming off by contacting the end face of the shape contactor near the urging member.
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