JPS6257175U - - Google Patents

Info

Publication number
JPS6257175U
JPS6257175U JP14803485U JP14803485U JPS6257175U JP S6257175 U JPS6257175 U JP S6257175U JP 14803485 U JP14803485 U JP 14803485U JP 14803485 U JP14803485 U JP 14803485U JP S6257175 U JPS6257175 U JP S6257175U
Authority
JP
Japan
Prior art keywords
burn
board
semiconductor device
inspection
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14803485U
Other languages
English (en)
Japanese (ja)
Other versions
JPH051831Y2 (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985148034U priority Critical patent/JPH051831Y2/ja
Publication of JPS6257175U publication Critical patent/JPS6257175U/ja
Application granted granted Critical
Publication of JPH051831Y2 publication Critical patent/JPH051831Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985148034U 1985-09-30 1985-09-30 Expired - Lifetime JPH051831Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985148034U JPH051831Y2 (enrdf_load_html_response) 1985-09-30 1985-09-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985148034U JPH051831Y2 (enrdf_load_html_response) 1985-09-30 1985-09-30

Publications (2)

Publication Number Publication Date
JPS6257175U true JPS6257175U (enrdf_load_html_response) 1987-04-09
JPH051831Y2 JPH051831Y2 (enrdf_load_html_response) 1993-01-18

Family

ID=31061935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985148034U Expired - Lifetime JPH051831Y2 (enrdf_load_html_response) 1985-09-30 1985-09-30

Country Status (1)

Country Link
JP (1) JPH051831Y2 (enrdf_load_html_response)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5764177A (en) * 1980-10-06 1982-04-19 Nec Corp Testing device for service life

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5764177A (en) * 1980-10-06 1982-04-19 Nec Corp Testing device for service life

Also Published As

Publication number Publication date
JPH051831Y2 (enrdf_load_html_response) 1993-01-18

Similar Documents

Publication Publication Date Title
ES2064095T3 (es) Conector electrico para banco de prueba.
JPS6257175U (enrdf_load_html_response)
ATE69652T1 (de) Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten.
JP2000074991A (ja) 半導体チップ用パッケージの良否検査方法及びその装置とこれに用いるプローブピン構造
JPS62177460A (ja) コネクタ接続装置
JPS57122368A (en) Inspecting apparatus for printed circuit board
JPS6313493Y2 (enrdf_load_html_response)
JPS6344443U (enrdf_load_html_response)
JPH0310675Y2 (enrdf_load_html_response)
JPS63185572U (enrdf_load_html_response)
JPH03245068A (ja) 端子の検査方法
JPH0138531Y2 (enrdf_load_html_response)
JPH0815361A (ja) プリント配線板の検査方法
JPS6230969A (ja) 検査装置
KR0134906Y1 (ko) 반도체 테스트 프로브 카드 장치
JPH0237683A (ja) 半導体装置測定用ソケット
JPS61161684U (enrdf_load_html_response)
JPS6284762U (enrdf_load_html_response)
JPS5834063U (ja) インサ−キツトテスタ用万能接続治具
JPS62108877U (enrdf_load_html_response)
JPH02103283U (enrdf_load_html_response)
JPS61258441A (ja) 半導体検査方法
JPS60216474A (ja) ピンソケツトの半田付け方法及び装置
JPS60152970U (ja) プリント基板検査装置
JPS61135489U (enrdf_load_html_response)