JPS5764177A - Testing device for service life - Google Patents

Testing device for service life

Info

Publication number
JPS5764177A
JPS5764177A JP55139589A JP13958980A JPS5764177A JP S5764177 A JPS5764177 A JP S5764177A JP 55139589 A JP55139589 A JP 55139589A JP 13958980 A JP13958980 A JP 13958980A JP S5764177 A JPS5764177 A JP S5764177A
Authority
JP
Japan
Prior art keywords
voltage
lamp
test board
tested
semiconductor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55139589A
Other languages
Japanese (ja)
Inventor
Masanobu Yanagiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55139589A priority Critical patent/JPS5764177A/en
Publication of JPS5764177A publication Critical patent/JPS5764177A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/145—Indicating the presence of current or voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To indicate the prescribed voltage is applied and to facilitate the discovery of faults such as insufficient voltage or opened power supply by providing a display lamp on a test board to be set with a semiconductor element to be tested such as IC. CONSTITUTION:A semiconductor element P to be tested is packaged to the socket disposed to a test board T. A display lamp 5 which lights when applied with prescribed voltage is provided to this test board T. The lamp 5 is lighted in a desired voltage range by suitably selecting the characteristics of a Schmitt trigger constituted by inverters INVs 1, 2, resistances R1, R2, and a VR and the Zener voltage of a constant voltage diode ZD2. More specifically, when it is desired to apply voltage within the range of external supply voltage VDC<=VH, and the DC source voltage to be applied to an electrode wire 4 is increased gradually, then when it attains VH, the lamp goes on. When the external supply voltage VDC drops down to VH determined by hysteresis sacrifice on account of certain influence, the lamp is still on and during this time the Zener voltage of the ZD2 is kept applied to the VDD.
JP55139589A 1980-10-06 1980-10-06 Testing device for service life Pending JPS5764177A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55139589A JPS5764177A (en) 1980-10-06 1980-10-06 Testing device for service life

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55139589A JPS5764177A (en) 1980-10-06 1980-10-06 Testing device for service life

Publications (1)

Publication Number Publication Date
JPS5764177A true JPS5764177A (en) 1982-04-19

Family

ID=15248779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55139589A Pending JPS5764177A (en) 1980-10-06 1980-10-06 Testing device for service life

Country Status (1)

Country Link
JP (1) JPS5764177A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6126874A (en) * 1984-07-16 1986-02-06 Mitsubishi Electric Corp Burn-in device for semiconductor device
JPS6257175U (en) * 1985-09-30 1987-04-09
JPH05136230A (en) * 1991-11-14 1993-06-01 Fujitsu Ltd Diagnosis circuit of burn-in device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6126874A (en) * 1984-07-16 1986-02-06 Mitsubishi Electric Corp Burn-in device for semiconductor device
JPS6257175U (en) * 1985-09-30 1987-04-09
JPH051831Y2 (en) * 1985-09-30 1993-01-18
JPH05136230A (en) * 1991-11-14 1993-06-01 Fujitsu Ltd Diagnosis circuit of burn-in device

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