ATE69652T1 - Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten. - Google Patents

Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten.

Info

Publication number
ATE69652T1
ATE69652T1 AT86300471T AT86300471T ATE69652T1 AT E69652 T1 ATE69652 T1 AT E69652T1 AT 86300471 T AT86300471 T AT 86300471T AT 86300471 T AT86300471 T AT 86300471T AT E69652 T1 ATE69652 T1 AT E69652T1
Authority
AT
Austria
Prior art keywords
tester
component
longitudinal axis
mounting surface
components
Prior art date
Application number
AT86300471T
Other languages
English (en)
Inventor
J Dean Weibley
Paul M Overby
Robert R Rohde
Original Assignee
Universal Instruments Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24786964&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE69652(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Universal Instruments Corp filed Critical Universal Instruments Corp
Application granted granted Critical
Publication of ATE69652T1 publication Critical patent/ATE69652T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
AT86300471T 1985-01-23 1986-01-23 Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten. ATE69652T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/693,987 US4721907A (en) 1985-01-23 1985-01-23 Apparatus for automated testing of surface mounted components
EP86300471A EP0192345B2 (de) 1985-01-23 1986-01-23 Vorrichtung zur selbsttätigen Überprüfung von auf Flächen zu montierenden Komponenten

Publications (1)

Publication Number Publication Date
ATE69652T1 true ATE69652T1 (de) 1991-12-15

Family

ID=24786964

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86300471T ATE69652T1 (de) 1985-01-23 1986-01-23 Vorrichtung zur selbsttaetigen ueberpruefung von auf flaechen zu montierenden komponenten.

Country Status (6)

Country Link
US (1) US4721907A (de)
EP (1) EP0192345B2 (de)
JP (1) JPS61221682A (de)
AT (1) ATE69652T1 (de)
CA (1) CA1262885A (de)
DE (1) DE3682513D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4970460A (en) * 1987-10-05 1990-11-13 Aetrium, Inc. Controlled impedance testsite
US4929892A (en) * 1989-02-09 1990-05-29 Hughes Aircraft Company Process for electrically testing a component in transit to assembly and component test chuck
US5040291A (en) * 1990-05-04 1991-08-20 Universal Instruments Corporation Multi-spindle pick and place method and apparatus
CH688294A5 (de) * 1995-04-12 1997-07-15 Sillner Kamilla Vorrichtung zur Verwendung in einer Anlage oder in einem System zur Behandlung von Bauelementen, insbesondere zur Behandlung von elektrischen Halbleiter-Bauelementen.
CH695871A5 (fr) * 2002-11-07 2006-09-29 Ismeca Semiconductor Holding Dispositif et procédé pour le test de composants électroniques.
DE102010043211A1 (de) * 2010-11-02 2012-05-03 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Haltern und Kontaktieren von Wafern
US10551410B2 (en) * 2015-07-15 2020-02-04 Fuji Corporation Inspection device
JP6684794B2 (ja) * 2015-07-15 2020-04-22 株式会社Ｆｕｊｉ 検査装置
CN112424621B (zh) * 2018-07-20 2023-11-14 株式会社富士 测定装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3333274A (en) * 1965-04-21 1967-07-25 Micro Tech Mfg Inc Testing device
US3344900A (en) * 1965-05-27 1967-10-03 Ibm Chip orienting control circuit for a chip positioning machine
US4458412A (en) * 1981-05-06 1984-07-10 Universal Instruments Corporation Leadless chip placement machine for printed circuit boards
US4574235A (en) * 1981-06-05 1986-03-04 Micro Component Technology, Inc. Transmission line connector and contact set assembly for test site
US4590422A (en) * 1981-07-30 1986-05-20 Pacific Western Systems, Inc. Automatic wafer prober having a probe scrub routine
US4420878A (en) * 1982-02-23 1983-12-20 Universal Instruments Corporation Insertion head for dip and dip socket components
NL8201593A (nl) * 1982-04-16 1983-11-16 Philips Nv Inrichting voor het overbrengen van een elektrisch of elektronisch onderdeel naar een montagepaneel.
JPS58210631A (ja) * 1982-05-31 1983-12-07 Toshiba Corp 電子ビ−ムを用いたｉｃテスタ

Also Published As

Publication number Publication date
CA1262885A (en) 1989-11-14
JPS61221682A (ja) 1986-10-02
US4721907A (en) 1988-01-26
EP0192345A1 (de) 1986-08-27
EP0192345B2 (de) 1995-03-29
DE3682513D1 (de) 1992-01-02
EP0192345B1 (de) 1991-11-21

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties