JPS6255687B2 - - Google Patents
Info
- Publication number
- JPS6255687B2 JPS6255687B2 JP55140464A JP14046480A JPS6255687B2 JP S6255687 B2 JPS6255687 B2 JP S6255687B2 JP 55140464 A JP55140464 A JP 55140464A JP 14046480 A JP14046480 A JP 14046480A JP S6255687 B2 JPS6255687 B2 JP S6255687B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- electronic component
- lead frame
- protrusions
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P74/00—
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55140464A JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55140464A JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5764946A JPS5764946A (en) | 1982-04-20 |
| JPS6255687B2 true JPS6255687B2 (cg-RX-API-DMAC10.html) | 1987-11-20 |
Family
ID=15269201
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55140464A Granted JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5764946A (cg-RX-API-DMAC10.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05152388A (ja) * | 1991-11-28 | 1993-06-18 | Sharp Corp | 半導体集積回路装置の検査装置 |
-
1980
- 1980-10-09 JP JP55140464A patent/JPS5764946A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5764946A (en) | 1982-04-20 |
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