JPS6252837B2 - - Google Patents

Info

Publication number
JPS6252837B2
JPS6252837B2 JP55141053A JP14105380A JPS6252837B2 JP S6252837 B2 JPS6252837 B2 JP S6252837B2 JP 55141053 A JP55141053 A JP 55141053A JP 14105380 A JP14105380 A JP 14105380A JP S6252837 B2 JPS6252837 B2 JP S6252837B2
Authority
JP
Japan
Prior art keywords
counting
signal
switch means
circuit
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55141053A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5764948A (en
Inventor
Takaharu Koba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55141053A priority Critical patent/JPS5764948A/ja
Publication of JPS5764948A publication Critical patent/JPS5764948A/ja
Publication of JPS6252837B2 publication Critical patent/JPS6252837B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318527—Test of counters

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55141053A 1980-10-08 1980-10-08 Integrated circuit device Granted JPS5764948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5764948A JPS5764948A (en) 1982-04-20
JPS6252837B2 true JPS6252837B2 (en, 2012) 1987-11-06

Family

ID=15283150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55141053A Granted JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5764948A (en, 2012)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
JP2007157944A (ja) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置

Also Published As

Publication number Publication date
JPS5764948A (en) 1982-04-20

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