JPS6252837B2 - - Google Patents

Info

Publication number
JPS6252837B2
JPS6252837B2 JP55141053A JP14105380A JPS6252837B2 JP S6252837 B2 JPS6252837 B2 JP S6252837B2 JP 55141053 A JP55141053 A JP 55141053A JP 14105380 A JP14105380 A JP 14105380A JP S6252837 B2 JPS6252837 B2 JP S6252837B2
Authority
JP
Japan
Prior art keywords
counting
signal
switch means
circuit
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55141053A
Other languages
Japanese (ja)
Other versions
JPS5764948A (en
Inventor
Takaharu Koba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55141053A priority Critical patent/JPS5764948A/en
Publication of JPS5764948A publication Critical patent/JPS5764948A/en
Publication of JPS6252837B2 publication Critical patent/JPS6252837B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522Test of Sequential circuits
    • G01R31/318527Test of counters

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Description

【発明の詳細な説明】 本発明は複数の計数機能とその試験機能とを有
する集積回路装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an integrated circuit device having multiple counting functions and testing functions thereof.

従来、半導体チツプ上に複数個の計数回路を設
けた、例えば時計用集積回路装置においては、各
計数回路が夫々直列に接続されており、前段の計
数回路の計数終了信号(桁上り信号)を後段の計
数回路の計数入力信号として用いている。特に、
時計用集積回路では各計数回路が夫々秒、分、
時、日、年等に対応する計数手段として割り当て
られている。更に、時計用集積回路には、前記計
数回路の計数動作を試験するための機構が設けら
れており、これは試験用クロツク信号を各計数回
路に独立して供給するようにしたものと、全ての
計数回路に同時に供給するようにしたものとがあ
つた。
Conventionally, in an integrated circuit device for a watch, for example, in which a plurality of counting circuits are provided on a semiconductor chip, each counting circuit is connected in series, and the counting end signal (carry signal) of the preceding counting circuit is transmitted. It is used as a counting input signal for the counting circuit in the subsequent stage. especially,
In a watch integrated circuit, each counting circuit counts seconds, minutes, and
It is assigned as a counting means corresponding to the hour, day, year, etc. Furthermore, the clock integrated circuit is provided with a mechanism for testing the counting operation of the counting circuit, and this includes a mechanism for supplying a test clock signal to each counting circuit independently, and a mechanism for testing the counting operation of the counting circuit. There was one in which the power was supplied to both counting circuits at the same time.

しかしながら、前者においては個々の計数回路
を別々に試験しなければならないため、多大な試
験時間を要するので実用的とはいえなかつた。
又、後者においては計数回路の桁上り信号を確認
することが非常に困難であつた。しかも、LSI技
術を用いて時計機能を1チツプ上に集積化する場
合には、使用端子数の制限も加わり、試験機能の
ハードウエア構成に大きな問題があつた。
However, in the former case, each counting circuit must be tested separately, which requires a large amount of testing time and is therefore not practical.
Moreover, in the latter case, it is very difficult to confirm the carry signal of the counting circuit. Furthermore, when integrating the clock function on a single chip using LSI technology, there was a restriction on the number of terminals that could be used, which caused major problems in the hardware configuration of the test function.

本発明の目的は、容易にかつ単時間で計数回路
の試験が行なえる機構を付加した集積回路装置を
提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an integrated circuit device equipped with a mechanism that allows testing of a counting circuit easily and in a short period of time.

本発明による集積回路は、直列に結合された第
1、第2および第3の計数回路を少なくとも有す
る計数手段の入力と第1の入力信号が供給される
第1の入力端子との間に第1のスイツチ手段を設
けると共に、第1、第2および第3の計数回路の
入力と第2の入力信号が供給される第2の入力端
子との間に第2、第3および第4のスイツチ手段
をそれぞれ設け、第1の動作モードでは第1のス
イツチ手段を導通させ第2乃至第4のスイツチ手
段を遮断させ、第2の動作モードでは第2および
第4のスイツチ手段を導通させ第1および第3の
スイツチ手段を遮断させるかまたは第3のスイツ
チ手段を導通させ第1、第2および第4のスイツ
チ手段を導通させることを特徴としている。
The integrated circuit according to the invention provides a first input signal between the input of the counting means having at least a first, second and third counting circuit coupled in series and a first input terminal to which the first input signal is supplied. 1 switch means, and second, third and fourth switches are provided between the inputs of the first, second and third counting circuits and a second input terminal to which the second input signal is supplied. means are respectively provided, in the first mode of operation the first switch means is made conductive and the second to fourth switch means are cut off, and in the second mode of operation the second and fourth switch means are made conductive and the first switch means are made conductive. and the third switch means is cut off or the third switch means is made conductive and the first, second and fourth switch means are made conductive.

以下、図面を参照して本発明の実施例を詳述す
る。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第1図は本発明の一実施例を示し、時計回路に
適用した場合の要部ブロツク図である。水晶発振
器やセラミツク発振器等の発振回路1から発振さ
れた信号は分周回路2に供給され所定の分周比で
分周される。この結果、時計用信号が発生され同
信号は第1の入力信号として第1の入力端子T1
に供給される。計数手段は第1乃至第4の計数回
路3乃至6を有し、それぞれ秒、分、時、日計数
用に割合てられており、秒信号s、分信号m、時
信号h、日信号Dが図示しない表示部にそれぞれ
出力される。計数回路3乃至6の入力側にはOR
ゲート7乃至10がそれぞれ設けられており、こ
のORゲートを介して前段の計数回路からの桁上
げ信号が供給される。第1の入力端子T1と計数
手段の入力との間に第1のスイツチ11が接続さ
れている。
FIG. 1 shows an embodiment of the present invention, and is a block diagram of essential parts when applied to a timepiece circuit. A signal oscillated from an oscillation circuit 1 such as a crystal oscillator or a ceramic oscillator is supplied to a frequency dividing circuit 2 and frequency-divided at a predetermined frequency division ratio. As a result, a clock signal is generated which is applied to the first input terminal T 1 as a first input signal.
is supplied to The counting means has first to fourth counting circuits 3 to 6, each of which is divided into seconds, minutes, hours, and days, and has a second signal s, a minute signal m, an hour signal h, and a day signal D. are respectively output to a display section (not shown). OR on the input side of counting circuits 3 to 6
Gates 7 to 10 are provided respectively, and a carry signal from the counting circuit at the previous stage is supplied through these OR gates. A first switch 11 is connected between the first input terminal T1 and the input of the counting means.

さらに、第2の入力信号としてテストクロツク
TCが第2の入力端子T2に供給される。端子T2
のテストクロツクTCは信号線16を介して第2
乃至第5のスイツチ12乃至15の各々の一端に
供給されている。これらスイツチ12乃至15の
各々の他端はORゲート7乃至10を介して計数
回路3乃至6の入力にそれぞれ接続されている。
In addition, a test clock is provided as a second input signal.
TC is supplied to the second input terminal T2 . The test clock TC to terminal T2 is connected via signal line 16 to the second
It is supplied to one end of each of the fifth switches 12 to 15. The other ends of each of these switches 12 to 15 are connected to the inputs of counting circuits 3 to 6 via OR gates 7 to 10, respectively.

第1乃至第5のスイツチ11乃至15は制御回
路19からの制御信号C0乃至C2によつてそれら
の導通、遮断が制御される。制御回路19は動作
モードに応じて制御信号C0乃至C2を選択的に発
生する。
The first to fifth switches 11 to 15 are controlled to be turned on or off by control signals C 0 to C 2 from a control circuit 19. The control circuit 19 selectively generates control signals C 0 to C 2 depending on the operating mode.

すなわち、第1の動作モードである時計動作の
ときは、制御回路19は制御信号C0を発生して
これを信号線20を介して第1のスイツチ11に
供給し、一方、他の制御信号C1,C2を発生しな
い。したがつて、第1のスイツチ11は導通し、
第2乃至第5のスイツチ12乃至15は遮断状態
となる。その結果、端子T1への時計信号はORゲ
ート7を介して計数回路3に供給され、また後段
の計数回路4乃至6はそれぞれ前段の計数回路3
乃至5からの桁上り信号(キヤリー信号)を受け
計数動作を実行する。秒、分、時、日のデータ
s、m、h、Dが表示部(図示せず)に出力され
る。
That is, during clock operation, which is the first operation mode, the control circuit 19 generates a control signal C0 and supplies it to the first switch 11 via the signal line 20, while other control signals Does not generate C 1 or C 2 . Therefore, the first switch 11 is conductive,
The second to fifth switches 12 to 15 are turned off. As a result, the clock signal to the terminal T1 is supplied to the counting circuit 3 via the OR gate 7, and the counting circuits 4 to 6 in the subsequent stage are respectively supplied to the counting circuit 3 in the preceding stage.
It receives the carry signal (carry signal) from 5 to 5 and executes a counting operation. Second, minute, hour, and day data s, m, h, and D are output to a display section (not shown).

次に、第2の動作モードである試験動作では、
各計数回路3乃至6が所定の計数動作を実行し桁
上り信号(キヤリー信号)を出力するか否かのチ
エツクが要求される。この目的のため、制御回路
(コントローラ)19は制御信号C0の発生を停止
して第1のスイツチ11を遮断せしめ、まず制御
信号C1を発生する。この信号C1は信号線17を
介して2および第4のスイツチ12および14に
供給され、これらは導通状態となる。これによつ
て端子T2へのテストクロツクTCは計数回路3お
よび5に供給される。この時、制御信号C2は発
生されていないので、第3および第5のスイツチ
13および15は遮断状態である。したがつて、
計数回路3および5の計数動作と共にその桁上り
信号の出力の有無およびそれを受ける次段の計数
回路4,6への入力状態をチエツクできる。次
に、制御回路9は制御信号C1を停止して信号C2
を発生する。制御信号C0は停止のままである。
したがつて、第3および第5のスイツチ13,1
5は導通し第1、第2および第4のスイツチ1
1,12および14は遮断状態となる。計数回路
4および6にテストクロツクTCが供給され上記
と同様のチエツクが行なわれる。このように、第
2の動作モードである試験動作では、連続する計
数回路のうち隣り合わない計数回路にテストクロ
ツクが与えられる。特に、時計回路の場合には奇
数段同士、偶数段同士を組にする方が望ましい。
Next, in the test operation which is the second operation mode,
A check is required as to whether each of the counting circuits 3 to 6 executes a predetermined counting operation and outputs a carry signal. For this purpose, the control circuit (controller) 19 stops generating the control signal C 0 to shut off the first switch 11 and first generates the control signal C 1 . This signal C1 is supplied to the second and fourth switches 12 and 14 via the signal line 17, and these become conductive. The test clock TC at terminal T2 is thereby supplied to the counting circuits 3 and 5. At this time, since the control signal C2 is not generated, the third and fifth switches 13 and 15 are in the cut-off state. Therefore,
It is possible to check the counting operations of the counting circuits 3 and 5, as well as the presence or absence of the output of the carry signal and the input state to the next stage counting circuits 4 and 6 that receive it. Next, the control circuit 9 stops the control signal C 1 and outputs the signal C 2
occurs. Control signal C 0 remains stopped.
Therefore, the third and fifth switches 13,1
5 is conductive and the first, second and fourth switches 1
1, 12 and 14 are in a cut-off state. A test clock TC is supplied to the counting circuits 4 and 6, and a check similar to that described above is performed. Thus, in the test operation, which is the second operation mode, the test clock is applied to non-adjacent counting circuits among consecutive counting circuits. In particular, in the case of a clock circuit, it is preferable to pair odd-numbered stages and even-numbered stages.

従つて、制御信号C1,C2の切り替えだけで、
全ての計数回路の動作を高速にかつ容易に確認す
ることができる。特に、人間が実際の表示器を見
ながらチエツクする場合には、1桁あるいは2桁
おきに表示部が変化する方が、全部の桁が同時に
変化するよりも見やすいので、この点でも本実施
例の効果は大きい。しかも操作は、連動スイツチ
を1回切替えるだけという簡単な操作で時計の基
本的機能を見ることができる。又、実装状態での
試験では例えば分周器2からの信号をテストクロ
ツクTCとして用いることができるように配線を
行なえばよいし、勿論外部端子を用いて外部クロ
ツク信号を用いるようにしてもよい。
Therefore, just by switching the control signals C 1 and C 2 ,
The operation of all counting circuits can be checked quickly and easily. In particular, when a person checks while looking at the actual display, it is easier to see if the display part changes every 1 or 2 digits than if all digits change at the same time, so this embodiment also has this point. The effect is large. Moreover, the basic functions of the watch can be viewed with a simple operation of just flipping an interlock switch once. Further, in testing in the mounted state, the wiring may be done so that the signal from the frequency divider 2 can be used as the test clock TC, for example, or, of course, an external terminal may be used to use an external clock signal.

尚、各スイツチに関しては集積化の都合上半導
体素子で構成する方が望ましいが、制御信号を受
けて導通、非導通が制御されるような機能を有し
ていさえすれば良い。又、制御信号C1,C2は内
部にプログラム制御のコントローラ19を設けて
いてもよいし、外部から入力するようにしてもよ
い。これらの変更は適宜選択して用いることがで
きることは容易に理解されよう。
Although it is preferable for each switch to be formed of a semiconductor element for reasons of integration, it is sufficient that the switch has a function of being controlled to be conductive or non-conductive in response to a control signal. Furthermore, the control signals C 1 and C 2 may be provided internally with a program-controlled controller 19, or may be input from the outside. It will be easily understood that these changes can be selected and used as appropriate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の集積回路装置を時計回路に適
用した一実施例の要部ブロツク図である。 1……発振器、2……分周器、3〜6……計数
回路、7〜10……ORゲート、11〜15……
スイツチ、16……テストクロツク転送用信号
線、7,18,20……制御信号線、19……コ
ントローラ。
FIG. 1 is a block diagram of essential parts of an embodiment in which the integrated circuit device of the present invention is applied to a timepiece circuit. 1... Oscillator, 2... Frequency divider, 3-6... Counting circuit, 7-10... OR gate, 11-15...
Switch, 16... signal line for test clock transfer, 7, 18, 20... control signal line, 19... controller.

Claims (1)

【特許請求の範囲】[Claims] 1 第1および第2の入力信号がそれぞれ供給さ
れる第1および第2の入力端子と、直列に結合さ
れた第1、第2および第3の計数回路を少なくと
も有する計数手段と、前記第1の入力端子と前記
計数手段の入力との間に設けられた第1のスイツ
チ手段と、前記第2の入力端子と前記第1、第2
および第3の計数回路の入力との間にそれぞれ設
けられた第2、第3および第4のスイツチ手段
と、第1の動作モードでは前記第1のスイツチ手
段を導通せしめると共に前記第2、第3および第
4のスイツチ手段を遮断せしめ、第2の動作モー
ドでは前記第2および第4のスイツチ手段を導通
せしめると共に前記第1および第3のスイツチ手
段を遮断せしめるかまたは前記第3のスイツチ手
段を導通せしめると共に前記第1、第2および第
4のスイツチ手段を遮断せしめる制御手段とを備
えることを特徴とする集積回路装置。
1 counting means having at least first and second input terminals to which first and second input signals are supplied, first, second and third counting circuits coupled in series; a first switch means provided between the input terminal of the counting means and the input of the counting means;
and second, third and fourth switch means respectively provided between the input of the third counting circuit, and in the first operation mode, the first switch means is made conductive and the second, third and fourth 3 and a fourth switch means are cut off, and in a second mode of operation, the second and fourth switch means are made conductive and the first and third switch means are cut off, or the third switch means is turned off. an integrated circuit device characterized by comprising: control means for making the first, second and fourth switch means conductive and cutting off the first, second and fourth switch means.
JP55141053A 1980-10-08 1980-10-08 Integrated circuit device Granted JPS5764948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5764948A JPS5764948A (en) 1982-04-20
JPS6252837B2 true JPS6252837B2 (en) 1987-11-06

Family

ID=15283150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55141053A Granted JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5764948A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6089937A (en) * 1983-10-24 1985-05-20 Nec Corp Integrated circuit device
JP2007157944A (en) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit device

Also Published As

Publication number Publication date
JPS5764948A (en) 1982-04-20

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