JPS642229B2 - - Google Patents

Info

Publication number
JPS642229B2
JPS642229B2 JP55108662A JP10866280A JPS642229B2 JP S642229 B2 JPS642229 B2 JP S642229B2 JP 55108662 A JP55108662 A JP 55108662A JP 10866280 A JP10866280 A JP 10866280A JP S642229 B2 JPS642229 B2 JP S642229B2
Authority
JP
Japan
Prior art keywords
circuit
input
frequency
signal
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55108662A
Other languages
Japanese (ja)
Other versions
JPS5733381A (en
Inventor
Fumihiko Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP10866280A priority Critical patent/JPS5733381A/en
Publication of JPS5733381A publication Critical patent/JPS5733381A/en
Publication of JPS642229B2 publication Critical patent/JPS642229B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G04HOROLOGY
    • G04DAPPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/002Electrical measuring and testing apparatus
    • G04D7/003Electrical measuring and testing apparatus for electric or electronic clocks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electric Clocks (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【発明の詳細な説明】 本発明は集積回路、特に電子計時用の集積回路
(以下、ICという)に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to integrated circuits, and particularly to integrated circuits (hereinafter referred to as ICs) for electronic timekeeping.

近年、電子時計用ICは、ますますその小型化
に対する要求が増大している。この小型化への必
要条件は、その外部端子をより少なくすることで
ある。
In recent years, there has been an increasing demand for smaller ICs for electronic watches. A prerequisite for this miniaturization is that it has fewer external terminals.

ところで、ICはその製造終了後、内部回路動
作が正常かどうかの試験が行なわれる。しかも、
その試験時間を短縮することが、ひいては原価低
減にも寄与することとなり、そのための試験方法
がいろいろと提案されている。特に、最近の電子
時計は時刻の表示のほかに、年、月、日およびス
トツプウオツチ機能等を有しており、このため、
内部発振回路の発振信号による試験では、すべて
の動作を検査するに膨大な時間を要する。このた
め、所定の計数回路部、例えば「分」に該当する
ところの計数部のみを選択し、これに実際の動作
周波数よりもはるかに高い周波数信号を印加し
て、短時間に試験を終えている。この所定の計数
部の選択は、外部からの入力データによつて指定
すべきデータをつくる制御回路によつて行なつて
いる。
By the way, after an IC is manufactured, it is tested to see if the internal circuit operation is normal. Moreover,
Shortening the test time will also contribute to cost reduction, and various testing methods have been proposed for this purpose. In particular, recent electronic watches have year, month, day, and stopwatch functions in addition to displaying the time.
Testing using an oscillation signal from an internal oscillation circuit requires an enormous amount of time to check all operations. For this reason, a predetermined counting circuit section, for example, only the counter section corresponding to "minutes" is selected, and a frequency signal much higher than the actual operating frequency is applied to it to complete the test in a short time. There is. This selection of a predetermined counting section is performed by a control circuit that generates data to be specified based on input data from the outside.

これを第1図により詳細に説明する。時計用
ICは、周知のごとく、水晶等の圧電振動子を用
いた発振回路1の出力を分周器2で分周し、これ
を計数回路3へ入力して時刻に対応するデータを
得、これを表示駆動回路4を介して表示装置へ供
給している。又、試験時には、発振回路1の発振
信号を入力信号とするのではなく、入力端子6を
介して外部からの入力信号を印加して行なつてい
る。計数回路3は、秒、分、時や月、日にそれぞ
れ対向する計数部をもつており、故に、これらの
計数部がすべて正常かどうかを入力端子6からの
入力信号によつて検査するには膨大な時間を要す
る。
This will be explained in detail with reference to FIG. for watches
As is well known, in an IC, the output of an oscillation circuit 1 using a piezoelectric vibrator such as a crystal is divided by a frequency divider 2, and this is input to a counting circuit 3 to obtain data corresponding to time. It is supplied to the display device via the display drive circuit 4. Further, during testing, an input signal from the outside is applied via the input terminal 6 instead of using the oscillation signal of the oscillation circuit 1 as an input signal. The counting circuit 3 has counting sections facing each other for seconds, minutes, hours, months, and days.Therefore, it is necessary to check whether all of these counters are normal using the input signal from the input terminal 6. takes an enormous amount of time.

このため、制御回路5でもつて計数回路3の所
定の計数部を指定すると共に、高速パルス入力端
子8に供給される高速パルスを印加して試験して
いる。制御回路5の指定すべきデータは、これに
試験コード作成用入力端子7からの外部信号入力
データによつて得られる。尚、制御回路5は時計
用ICの中に作り込まれている。
For this reason, the control circuit 5 specifies a predetermined counting section of the counting circuit 3, and tests are performed by applying a high-speed pulse supplied to the high-speed pulse input terminal 8. The data to be specified by the control circuit 5 is obtained by external signal input data from the test code creation input terminal 7. Note that the control circuit 5 is built into a watch IC.

以上のような構成よりその試験時間は短縮され
る。しかし、制御回路5に試験コード作成信号を
得るに必要な外部端子は、計数回路3の動作機能
が多くなればなるほど多くなる。このため、時計
用ICの素子面積が大きくなり、歩留りの悪化お
よび素子価格の上昇という欠点が生じていた。
The above configuration reduces the test time. However, the number of external terminals necessary to obtain a test code generation signal to the control circuit 5 increases as the number of operating functions of the counting circuit 3 increases. For this reason, the element area of the watch IC has increased, resulting in disadvantages such as deterioration in yield and increase in element price.

本発明の目的は、上記の欠点を解消し、試験時
間を長くすることなく外部端子数を低減させて素
子面積を縮少し、もつて歩留りの向上および原価
低減を達成した集積回路を提供することある。
An object of the present invention is to provide an integrated circuit that eliminates the above-mentioned drawbacks, reduces the number of external terminals and reduces the element area without increasing test time, and thereby achieves improved yield and reduced cost. be.

本発明によれば、入力された信号を分周する複
数の分周器で構成された分周回路と、該分周回路
の出力をゲート回路を介して受ける複数の計数器
で構成された計数回路と、制御端子と、外部パル
ス入力端子と該制御端子に制御信号が印加された
時に前記ゲート回路を閉じる手段と前記制御信号
に応答して前記分周回路を構成する少なくとも一
部の前記分周器の各々の出力を入力し、その入力
されたデータに基づいて前記計数回路の所定の前
記計数器に前記外部パルス端子に入力されたパル
スを印加する該制御回路とを有し、該制御信号が
印加されない時に該分周回路の出力を該計数回路
は計数し、該制御信号が印加された時に該入力端
子に入力された信号によつて指定された計数器に
該外部パルス端子に入力されたパルスを印加する
ことを特徴とする集積回路が得られる。
According to the present invention, a frequency divider circuit configured with a plurality of frequency dividers that divides an input signal, and a counter configured with a plurality of counters that receive the output of the frequency divider circuit via a gate circuit. a circuit, a control terminal, an external pulse input terminal, means for closing the gate circuit when a control signal is applied to the control terminal, and at least a portion of the frequency divider configured in response to the control signal; the control circuit which inputs the output of each of the frequency generators and applies the pulse input to the external pulse terminal to a predetermined counter of the counting circuit based on the input data; The counting circuit counts the output of the frequency divider circuit when no signal is applied, and inputs the output to the external pulse terminal into a counter specified by the signal input to the input terminal when the control signal is applied. An integrated circuit is obtained, which is characterized in that the pulses are applied.

以下、図面により本発明の実施例を詳細に説明
する。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図はその一実施例を示すブロツク図であ
り、第1図と同一機能部は同一番号を符してその
説明は省略する。異なるところは、分周回路2と
計数回路3との間にゲート回路9を設け、そして
制御回路5の入力を分周回路2を構成する各段の
分周器の出力で取つている。分周回路2の各分周
器の出力をすべて取り出す必要はなく、所定数取
り出せばよい。さらに、ゲート回路9および制御
回路5は試験モード切替信号線10からの切替信
号によつて動作する。
FIG. 2 is a block diagram showing one embodiment of the present invention, and the same functional parts as in FIG. 1 are denoted by the same numbers, and the explanation thereof will be omitted. The difference is that a gate circuit 9 is provided between the frequency dividing circuit 2 and the counting circuit 3, and the input to the control circuit 5 is taken from the output of the frequency divider at each stage constituting the frequency dividing circuit 2. It is not necessary to take out all the outputs of each frequency divider of the frequency dividing circuit 2, but it is sufficient to take out a predetermined number. Further, the gate circuit 9 and the control circuit 5 are operated by a switching signal from a test mode switching signal line 10.

すなわち、まず入力端子6からの入力発振信号
は分周回路2により分周され、この信号はゲート
回路9を介して計数回路3へ供給される。計数回
路3は時刻表示用の信号を作り出し、表示駆動回
路4へ供給する。これによつて、分周回路が正常
に動作しているかどうかが判定される。
That is, first, the input oscillation signal from the input terminal 6 is frequency-divided by the frequency dividing circuit 2, and this signal is supplied to the counting circuit 3 via the gate circuit 9. The counting circuit 3 generates a time display signal and supplies it to the display drive circuit 4. This determines whether the frequency dividing circuit is operating normally.

次に、試験モード切替信号端子10への切替信
号の入力によりゲート回路9はそのゲートを閉じ
(すなわち、分周回路2の出力の計数回路への伝
達を遮断し)、計数回路3への分周回路2の出力
の供給を停止させる。これと共に、制御回路5は
動作可能状態になる。そして、入力端子6から計
数回路3への指定データを作り出すべく信号を入
力する。これは分周回路2へ入力されるが、分周
回路2は複数の分周器から構成され、それらの
各々の出力は上記の入力データを示している。こ
れを制御回路5は取り込み、それに応じて指定デ
ータを作る。そして、計数回路3の所定の計数部
を指定し、これと共に高速パルス入力端子8から
の高速パルス信号を印加してその計数部を試験す
る。
Next, by inputting the switching signal to the test mode switching signal terminal 10, the gate circuit 9 closes its gate (that is, cuts off the transmission of the output of the frequency dividing circuit 2 to the counting circuit), and The supply of the output of the circuit 2 is stopped. At the same time, the control circuit 5 becomes operational. Then, a signal is input from the input terminal 6 to the counting circuit 3 in order to create designated data. This is input to the frequency dividing circuit 2, which is composed of a plurality of frequency dividers, the output of each of which represents the above input data. The control circuit 5 takes in this and creates designated data accordingly. Then, a predetermined counting section of the counting circuit 3 is specified, and a high-speed pulse signal from the high-speed pulse input terminal 8 is applied thereto to test the counting section.

以上の説明から明らかなように、指定データ作
成用のデータ入力端子は皆無となり、素子面積の
縮少化が達成される。さらに、計数回路3の各計
数部も高速パルスで試験するため、その試験時間
も短かくなる。
As is clear from the above description, there are no data input terminals for creating specified data, and the device area can be reduced. Furthermore, since each counting section of the counting circuit 3 is also tested using high-speed pulses, the testing time is also shortened.

尚、かかる実施例では高速パルスを制御回路5
を介して供給したが、計数回路3へ直接供給させ
るようにしてもよい。
In this embodiment, the high-speed pulse is controlled by the control circuit 5.
Although it is supplied via the counter circuit 3, it may be supplied directly to the counting circuit 3.

以上のように、本発明によればその試験時間を
長くすることなしに外部端子数を低減させて素子
面積を小さくし、歩留りの向上および原価低減を
達成した集積回路を提供できる。
As described above, according to the present invention, it is possible to provide an integrated circuit in which the number of external terminals is reduced and the element area is reduced without increasing the test time, thereby achieving improved yield and reduced cost.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の時計用ICのブロツク図、第2
図は本発明の一実施例を示す時計用ICのブロツ
ク図である。 1……発振回路、2……分周回路、3……計数
回路、4……表示駆動回路、5……制御回路、6
……入力端子、7……指定データ作成用入力端
子、8……高速パルス入力端子、9……ゲート回
路、10……試験モード切替信号端子。
Figure 1 is a block diagram of a conventional watch IC, Figure 2 is a block diagram of a conventional watch IC.
The figure is a block diagram of a watch IC showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Oscillation circuit, 2... Frequency division circuit, 3... Counting circuit, 4... Display drive circuit, 5... Control circuit, 6
...Input terminal, 7...Input terminal for creating designated data, 8...High-speed pulse input terminal, 9...Gate circuit, 10...Test mode switching signal terminal.

Claims (1)

【特許請求の範囲】[Claims] 1 入力された信号を分周する複数の分周器で構
成された分周回路と、該分周回路の出力をゲート
回路を介して受ける複数の計数器で構成された時
刻表示用信号を発生する計数回路と、制御端子
と、外部パルス入力端子と該制御端子に制御信号
が印加された時に前記ゲート回路を閉じる手段と
前記制御信号に応答して前記分周回路を構成する
前記分周器の複数からの各々の出力を入力とし、
その入力されたデータに基づいて前記計数回路の
所定の前記計数器に前記外部パルス端子に入力さ
れたパルスを印加する制御回路とを有し、該制御
信号が印加されない時に該分周回路の出力を該計
数回路は計数し、該制御信号が印加された時に該
分周回路における複数の分周器の出力に応じて作
成された指定データによつて指定された計数器に
該外部パルス端子に入力されたパルスを印加する
ことを特徴とする集積回路。
1. Generates a time display signal consisting of a frequency divider circuit consisting of multiple frequency dividers that divides the frequency of the input signal, and multiple counters that receive the output of the frequency divider circuit via a gate circuit. a control terminal, an external pulse input terminal, means for closing the gate circuit when a control signal is applied to the control terminal, and the frequency divider that configures the frequency dividing circuit in response to the control signal. Take each output from multiple as input,
and a control circuit that applies the pulse input to the external pulse terminal to a predetermined counter of the counting circuit based on the input data, and outputs the output of the frequency dividing circuit when the control signal is not applied. The counting circuit counts and sends a signal to the external pulse terminal to a designated counter according to designated data created according to the outputs of a plurality of frequency dividers in the frequency dividing circuit when the control signal is applied. An integrated circuit characterized by applying an input pulse.
JP10866280A 1980-08-07 1980-08-07 Integrated circuit Granted JPS5733381A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10866280A JPS5733381A (en) 1980-08-07 1980-08-07 Integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10866280A JPS5733381A (en) 1980-08-07 1980-08-07 Integrated circuit

Publications (2)

Publication Number Publication Date
JPS5733381A JPS5733381A (en) 1982-02-23
JPS642229B2 true JPS642229B2 (en) 1989-01-17

Family

ID=14490491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10866280A Granted JPS5733381A (en) 1980-08-07 1980-08-07 Integrated circuit

Country Status (1)

Country Link
JP (1) JPS5733381A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020080363A1 (en) * 2018-10-15 2020-04-23 株式会社Uacj Aluminum alloy plate for magnetic disk, method for manufacturing same, and magnetic disk using same
WO2020110544A1 (en) * 2018-11-26 2020-06-04 株式会社Uacj Aluminum alloy substrate for magnetic discs and method for manufacturing same, magnetic disc aluminum alloy base and method for manufacturing same, and magnetic disc and method for manufacturing same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52122161A (en) * 1976-04-07 1977-10-14 Seiko Instr & Electronics Ltd Electronic watch
JPS5524659A (en) * 1978-08-11 1980-02-21 Seiko Instr & Electronics Ltd Inspecting circuit for electronic watch
JPS56162079A (en) * 1980-05-19 1981-12-12 Seiko Epson Corp Circuit for electronic clock

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020080363A1 (en) * 2018-10-15 2020-04-23 株式会社Uacj Aluminum alloy plate for magnetic disk, method for manufacturing same, and magnetic disk using same
WO2020110544A1 (en) * 2018-11-26 2020-06-04 株式会社Uacj Aluminum alloy substrate for magnetic discs and method for manufacturing same, magnetic disc aluminum alloy base and method for manufacturing same, and magnetic disc and method for manufacturing same
US11482251B2 (en) 2018-11-26 2022-10-25 Uacj Corporation Aluminum alloy substrate for magnetic disk and method for manufacturing same, aluminum alloy base disk for magnetic disk and method for manufacturing same, and magnetic disk and method for manufacturing the same

Also Published As

Publication number Publication date
JPS5733381A (en) 1982-02-23

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