JPS5764948A - Integrated circuit device - Google Patents

Integrated circuit device

Info

Publication number
JPS5764948A
JPS5764948A JP55141053A JP14105380A JPS5764948A JP S5764948 A JPS5764948 A JP S5764948A JP 55141053 A JP55141053 A JP 55141053A JP 14105380 A JP14105380 A JP 14105380A JP S5764948 A JPS5764948 A JP S5764948A
Authority
JP
Japan
Prior art keywords
signal
circuits
stage
counter circuits
counter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55141053A
Other languages
English (en)
Other versions
JPS6252837B2 (ja
Inventor
Takaharu Koba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55141053A priority Critical patent/JPS5764948A/ja
Publication of JPS5764948A publication Critical patent/JPS5764948A/ja
Publication of JPS6252837B2 publication Critical patent/JPS6252837B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318527—Test of counters

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP55141053A 1980-10-08 1980-10-08 Integrated circuit device Granted JPS5764948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55141053A JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5764948A true JPS5764948A (en) 1982-04-20
JPS6252837B2 JPS6252837B2 (ja) 1987-11-06

Family

ID=15283150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55141053A Granted JPS5764948A (en) 1980-10-08 1980-10-08 Integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5764948A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
JP2007157944A (ja) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
JP2007157944A (ja) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd 半導体集積回路装置

Also Published As

Publication number Publication date
JPS6252837B2 (ja) 1987-11-06

Similar Documents

Publication Publication Date Title
GB2195185B (en) Testing circuits comprising integrated circuits provided on a carrier
AU580362B2 (en) Improvements in or relating to integrated circuits
EP0148403A3 (en) Linear feedback shift register
GB1019416A (en) Improvements relating to testing equipment
TW346540B (en) Test method of integrated circuit devices by using a dual edge clock technique
DE2615787C2 (ja)
JPS5764948A (en) Integrated circuit device
ES2006764A6 (es) Red contadora multi-modos y metodo de probar su funcionamiento.
DE69430344T2 (de) Synchronizierungsvorrichtung asynchroner Schaltungen für Überprüfungsoperationen
JPS5358270A (en) Electronic time measuring device
JPS6454380A (en) Electronic circuit package with automatic testing function
JPS6479674A (en) Method of testing integrated circuit
JPS5760865A (en) Integrated circuit device
JPS6413478A (en) Test system for integrated circuit
JPS56140448A (en) Logical operation circuit
JPS56144327A (en) Burner automatic controlling device
JPS6480885A (en) Lsi testing circuit
JPS5424555A (en) Function test unit for logic circuit
JPS5393267A (en) Plant waiting system machine checker
JPS53146548A (en) Resetting device for shift register
JPS6472083A (en) Soft imbedded type tester for vlsi circuit
JPS52104968A (en) Circuit for electronic clock
JPS5279969A (en) Circuit for electronic watches
JPS6415675A (en) Circuit for testing integrated circuit
JPS55117973A (en) Period measuring unit