JPS6242157A - イオンビ−ム照射加工装置 - Google Patents
イオンビ−ム照射加工装置Info
- Publication number
- JPS6242157A JPS6242157A JP60182464A JP18246485A JPS6242157A JP S6242157 A JPS6242157 A JP S6242157A JP 60182464 A JP60182464 A JP 60182464A JP 18246485 A JP18246485 A JP 18246485A JP S6242157 A JPS6242157 A JP S6242157A
- Authority
- JP
- Japan
- Prior art keywords
- ion beam
- workpiece
- dot
- beam irradiation
- blank time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60182464A JPS6242157A (ja) | 1985-08-20 | 1985-08-20 | イオンビ−ム照射加工装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60182464A JPS6242157A (ja) | 1985-08-20 | 1985-08-20 | イオンビ−ム照射加工装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6242157A true JPS6242157A (ja) | 1987-02-24 |
| JPH0135340B2 JPH0135340B2 (enExample) | 1989-07-25 |
Family
ID=16118719
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60182464A Granted JPS6242157A (ja) | 1985-08-20 | 1985-08-20 | イオンビ−ム照射加工装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6242157A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63241953A (ja) * | 1987-03-30 | 1988-10-07 | Seiko Instr & Electronics Ltd | イオンビーム加工方法 |
| JPH01130158A (ja) * | 1987-11-16 | 1989-05-23 | Seiko Instr & Electron Ltd | パターン膜修正方法およびその装置 |
| JPH0532289A (ja) * | 1991-01-19 | 1993-02-09 | Basf Magnetics Gmbh | テープカセツト用の平行六面体容器 |
| CN108766877A (zh) * | 2018-04-19 | 2018-11-06 | 中国科学院上海应用物理研究所 | 一种具有周期性的表面电势梯度的材料的制备方法 |
-
1985
- 1985-08-20 JP JP60182464A patent/JPS6242157A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63241953A (ja) * | 1987-03-30 | 1988-10-07 | Seiko Instr & Electronics Ltd | イオンビーム加工方法 |
| JPH01130158A (ja) * | 1987-11-16 | 1989-05-23 | Seiko Instr & Electron Ltd | パターン膜修正方法およびその装置 |
| JPH0532289A (ja) * | 1991-01-19 | 1993-02-09 | Basf Magnetics Gmbh | テープカセツト用の平行六面体容器 |
| CN108766877A (zh) * | 2018-04-19 | 2018-11-06 | 中国科学院上海应用物理研究所 | 一种具有周期性的表面电势梯度的材料的制备方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0135340B2 (enExample) | 1989-07-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS58190028A (ja) | 可変ライン走査を用いる荷電粒子ビ−ム露光装置 | |
| US4393312A (en) | Variable-spot scanning in an electron beam exposure system | |
| US4937458A (en) | Electron beam lithography apparatus including a beam blanking device utilizing a reference comparator | |
| CA1149086A (en) | Variable-spot raster scanning in an electron beam exposure system | |
| US20030089858A1 (en) | Electron beam lithography system and method | |
| JP2714009B2 (ja) | 荷電ビーム装置 | |
| JPH0316775B2 (enExample) | ||
| JPS59208830A (ja) | イオンビ−ム加工方法およびその装置 | |
| US4710640A (en) | Electron beam lithography | |
| JP2946537B2 (ja) | 電子光学鏡筒 | |
| GB2041639A (en) | Electron beam lithography | |
| JPH0135340B2 (enExample) | ||
| US4321468A (en) | Method and apparatus for correcting astigmatism in scanning electron microscopes and similar equipment | |
| JP2000285842A (ja) | 荷電粒子線装置 | |
| JPS6324617Y2 (enExample) | ||
| JPH0382110A (ja) | 集束イオンビーム装置の電荷中和装置 | |
| JPH01295419A (ja) | 電子ビーム露光方法及びその装置 | |
| JPH0587014B2 (enExample) | ||
| JPH081794B2 (ja) | イオンビーム加工方法 | |
| JPS59169133A (ja) | パタ−ン修正装置 | |
| JPH01278725A (ja) | 荷電粒子ビーム露光装置 | |
| JPS5922369B2 (ja) | 電子線描画装置 | |
| JPS60130040A (ja) | 荷電ビ−ム光学鏡筒 | |
| JPS63216342A (ja) | 荷電粒子線描画装置 | |
| JP3578867B2 (ja) | 集束荷電粒子ビーム加工方法およびその装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |