JPS6236318B2 - - Google Patents

Info

Publication number
JPS6236318B2
JPS6236318B2 JP57226844A JP22684482A JPS6236318B2 JP S6236318 B2 JPS6236318 B2 JP S6236318B2 JP 57226844 A JP57226844 A JP 57226844A JP 22684482 A JP22684482 A JP 22684482A JP S6236318 B2 JPS6236318 B2 JP S6236318B2
Authority
JP
Japan
Prior art keywords
ram
data
register
lsi
read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57226844A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59119595A (ja
Inventor
Tsutomu Sumimoto
Akira Ishama
Yoshio Kamijo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP57226844A priority Critical patent/JPS59119595A/ja
Publication of JPS59119595A publication Critical patent/JPS59119595A/ja
Publication of JPS6236318B2 publication Critical patent/JPS6236318B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP57226844A 1982-12-27 1982-12-27 Ｒａｍ内蔵論理ｌｓｉ Granted JPS59119595A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57226844A JPS59119595A (ja) 1982-12-27 1982-12-27 Ｒａｍ内蔵論理ｌｓｉ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57226844A JPS59119595A (ja) 1982-12-27 1982-12-27 Ｒａｍ内蔵論理ｌｓｉ

Publications (2)

Publication Number Publication Date
JPS59119595A JPS59119595A (ja) 1984-07-10
JPS6236318B2 true JPS6236318B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-08-06

Family

ID=16851450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57226844A Granted JPS59119595A (ja) 1982-12-27 1982-12-27 Ｒａｍ内蔵論理ｌｓｉ

Country Status (1)

Country Link
JP (1) JPS59119595A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1251565B (it) * 1991-09-10 1995-05-17 Sgs Thomson Microelectronics Procedimento di verifica delle memorie di un microcalcolatore programmato, mediante un microprogramma incorporato nello stesso microcalcolatore.

Also Published As

Publication number Publication date
JPS59119595A (ja) 1984-07-10

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