JPS6236171B2 - - Google Patents

Info

Publication number
JPS6236171B2
JPS6236171B2 JP54070729A JP7072979A JPS6236171B2 JP S6236171 B2 JPS6236171 B2 JP S6236171B2 JP 54070729 A JP54070729 A JP 54070729A JP 7072979 A JP7072979 A JP 7072979A JP S6236171 B2 JPS6236171 B2 JP S6236171B2
Authority
JP
Japan
Prior art keywords
ray
crystal
sample
axis
spectroscopic crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54070729A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55163444A (en
Inventor
Mutsumi Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON ETSUKUSUSEN KK
Original Assignee
NIPPON ETSUKUSUSEN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON ETSUKUSUSEN KK filed Critical NIPPON ETSUKUSUSEN KK
Priority to JP7072979A priority Critical patent/JPS55163444A/ja
Publication of JPS55163444A publication Critical patent/JPS55163444A/ja
Publication of JPS6236171B2 publication Critical patent/JPS6236171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP7072979A 1979-06-06 1979-06-06 X-ray analyzing device Granted JPS55163444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7072979A JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7072979A JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Publications (2)

Publication Number Publication Date
JPS55163444A JPS55163444A (en) 1980-12-19
JPS6236171B2 true JPS6236171B2 (en, 2012) 1987-08-05

Family

ID=13439907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7072979A Granted JPS55163444A (en) 1979-06-06 1979-06-06 X-ray analyzing device

Country Status (1)

Country Link
JP (1) JPS55163444A (en, 2012)

Also Published As

Publication number Publication date
JPS55163444A (en) 1980-12-19

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