JPS6229916B2 - - Google Patents
Info
- Publication number
- JPS6229916B2 JPS6229916B2 JP60086358A JP8635885A JPS6229916B2 JP S6229916 B2 JPS6229916 B2 JP S6229916B2 JP 60086358 A JP60086358 A JP 60086358A JP 8635885 A JP8635885 A JP 8635885A JP S6229916 B2 JPS6229916 B2 JP S6229916B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- semiconductor
- junction
- silicon
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 20
- 229910052710 silicon Inorganic materials 0.000 description 20
- 239000010703 silicon Substances 0.000 description 20
- 230000031700 light absorption Effects 0.000 description 14
- 239000013078 crystal Substances 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 8
- 230000035945 sensitivity Effects 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 7
- 230000015556 catabolic process Effects 0.000 description 7
- 229910052732 germanium Inorganic materials 0.000 description 7
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 239000000969 carrier Substances 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 206010034972 Photosensitivity reaction Diseases 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006664 bond formation reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PIN type
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60086358A JPS60258979A (ja) | 1985-04-24 | 1985-04-24 | 半導体光検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60086358A JPS60258979A (ja) | 1985-04-24 | 1985-04-24 | 半導体光検出装置 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51090289A Division JPS5938748B2 (ja) | 1976-07-30 | 1976-07-30 | 半導体光検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60258979A JPS60258979A (ja) | 1985-12-20 |
JPS6229916B2 true JPS6229916B2 (de) | 1987-06-29 |
Family
ID=13884666
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60086358A Granted JPS60258979A (ja) | 1985-04-24 | 1985-04-24 | 半導体光検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60258979A (de) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5051285A (de) * | 1973-09-05 | 1975-05-08 | ||
US3889284A (en) * | 1974-01-15 | 1975-06-10 | Us Army | Avalanche photodiode with varying bandgap |
JPS53120289A (en) * | 1977-03-30 | 1978-10-20 | Toshiba Corp | Manufacture of semiconductor device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5230848Y2 (de) * | 1972-12-12 | 1977-07-14 |
-
1985
- 1985-04-24 JP JP60086358A patent/JPS60258979A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5051285A (de) * | 1973-09-05 | 1975-05-08 | ||
US3889284A (en) * | 1974-01-15 | 1975-06-10 | Us Army | Avalanche photodiode with varying bandgap |
JPS53120289A (en) * | 1977-03-30 | 1978-10-20 | Toshiba Corp | Manufacture of semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS60258979A (ja) | 1985-12-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0473197B1 (de) | Lichtempfindliches Bauelement | |
US3995303A (en) | Growth and operation of a step-graded ternary III-V heterojunction p-n diode photodetector | |
CN113921646B (zh) | 单光子探测器及其制作方法、单光子探测器阵列 | |
EP0473198B1 (de) | Lichtempfindliches Bauelement | |
KR950004550B1 (ko) | 수광소자 | |
JPH0799778B2 (ja) | 広いバンドギヤツプキヤツプ層を有する背面照明形フオトダイオード | |
JPH038117B2 (de) | ||
Olsen | Low-leakage, high-efficiency, reliable VPE InGaAs 1.0-1.7 µm photodiodes | |
JPS5938748B2 (ja) | 半導体光検出装置 | |
JPS6229917B2 (de) | ||
JPS6229916B2 (de) | ||
JP2670289B2 (ja) | 赤外線検出用フオトダイオードおよびその製造方法 | |
JPH057014A (ja) | アバランシエフオトダイオード | |
JPH10233523A (ja) | 光検出器 | |
JPS6259905B2 (de) | ||
JPS61101084A (ja) | 化合物半導体受光素子の製造方法 | |
JPS60198786A (ja) | 半導体受光素子 | |
JPH0494579A (ja) | 半導体受光装置 | |
JPH0231509B2 (de) | ||
Purica et al. | Design and optimization of InGaAs/InP photodetector for coordinate sensitive detection systems | |
JPS6138208Y2 (de) | ||
JPH041740Y2 (de) | ||
JPS6146076B2 (de) | ||
JPH0215680A (ja) | 半導体受光装置 | |
JPS63142683A (ja) | アバランシエホトダイオ−ド |