JPS6223495B2 - - Google Patents

Info

Publication number
JPS6223495B2
JPS6223495B2 JP54050788A JP5078879A JPS6223495B2 JP S6223495 B2 JPS6223495 B2 JP S6223495B2 JP 54050788 A JP54050788 A JP 54050788A JP 5078879 A JP5078879 A JP 5078879A JP S6223495 B2 JPS6223495 B2 JP S6223495B2
Authority
JP
Japan
Prior art keywords
clock
delay
period
programmable
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54050788A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54142963A (en
Inventor
Hooru Sento Kureaa Richaado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne Inc
Original Assignee
Teledyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teledyne Inc filed Critical Teledyne Inc
Publication of JPS54142963A publication Critical patent/JPS54142963A/ja
Publication of JPS6223495B2 publication Critical patent/JPS6223495B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K23/00—Pulse counters comprising counting chains; Frequency dividers comprising counting chains
    • H03K23/64—Pulse counters comprising counting chains; Frequency dividers comprising counting chains with a base or radix other than a power of two
    • H03K23/66—Pulse counters comprising counting chains; Frequency dividers comprising counting chains with a base or radix other than a power of two with a variable counting base, e.g. by presetting or by adding or suppressing pulses
    • H03K23/665—Pulse counters comprising counting chains; Frequency dividers comprising counting chains with a base or radix other than a power of two with a variable counting base, e.g. by presetting or by adding or suppressing pulses by presetting
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/64—Generators producing trains of pulses, i.e. finite sequences of pulses
    • H03K3/72—Generators producing trains of pulses, i.e. finite sequences of pulses with means for varying repetition rate of trains
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Pulse Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
JP5078879A 1978-04-26 1979-04-24 Signal generator Granted JPS54142963A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/900,189 US4231104A (en) 1978-04-26 1978-04-26 Generating timing signals

Publications (2)

Publication Number Publication Date
JPS54142963A JPS54142963A (en) 1979-11-07
JPS6223495B2 true JPS6223495B2 (US20100268047A1-20101021-C00003.png) 1987-05-23

Family

ID=25412102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5078879A Granted JPS54142963A (en) 1978-04-26 1979-04-24 Signal generator

Country Status (6)

Country Link
US (1) US4231104A (US20100268047A1-20101021-C00003.png)
JP (1) JPS54142963A (US20100268047A1-20101021-C00003.png)
CA (1) CA1129504A (US20100268047A1-20101021-C00003.png)
DE (1) DE2917017C2 (US20100268047A1-20101021-C00003.png)
FR (1) FR2424671A1 (US20100268047A1-20101021-C00003.png)
GB (1) GB2020072B (US20100268047A1-20101021-C00003.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0224851U (US20100268047A1-20101021-C00003.png) * 1988-07-30 1990-02-19
JPH034074Y2 (US20100268047A1-20101021-C00003.png) * 1987-12-18 1991-02-01
WO1996032654A1 (fr) * 1995-04-13 1996-10-17 Advantest Corporation Generateur de periodes pour dispositif d'essai de semi-conducteurs

Families Citing this family (57)

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US4355365A (en) * 1980-04-28 1982-10-19 Otis Engineering Corporation Electronic intermitter
US4482983A (en) * 1980-06-23 1984-11-13 Sperry Corporation Variable speed cycle time for synchronous machines
DE3023699A1 (de) * 1980-06-25 1982-01-14 Ibm Deutschland Gmbh, 7000 Stuttgart Verfahren und anordnung zur erzeugung von impulsen vorgegebener zeitrelation innerhalb vorgegebener impulsintervalle mit hoher zeitlicher aufloesung
EP0080970B1 (de) * 1981-11-26 1985-12-18 Deutsche ITT Industries GmbH Auf nichtganze Teilungszahlen einstellbarer Frequenzteiler
JPS5977659A (ja) * 1982-10-25 1984-05-04 Sony Corp 回転体の基準信号形成回路
DE3302744A1 (de) * 1983-01-27 1984-08-02 Siemens AG, 1000 Berlin und 8000 München Taktgesteuerter impulsgenerator
US4564953A (en) * 1983-03-28 1986-01-14 Texas Instruments Incorporated Programmable timing system
US4811193A (en) * 1983-05-04 1989-03-07 Fmc Corporation Variable frequency controller
EP0128228B1 (de) * 1983-06-08 1988-01-07 Ibm Deutschland Gmbh Verfahren und Anordnung zur Erzeugung von Impulsen beliebiger Zeitrelation innerhalb unmittelbar aufeinanderfolgender Impulsintervalle mit sehr hoher Genauigkeit und zeitlicher Auflösung
DE3324711C2 (de) * 1983-07-08 1986-07-24 Hewlett-Packard GmbH, 7030 Böblingen Impulsgenerator
US4631702A (en) * 1984-02-28 1986-12-23 Canadian Patents and Deveopment Limited--Societe Canadienne des Brevets et d'Exploitation Limitee Computer speed control
JP2687325B2 (ja) * 1984-12-18 1997-12-08 日本電気株式会社 分周回路
EP0202347B1 (de) * 1985-05-18 1988-05-11 Deutsche ITT Industries GmbH Frequenzteilerschaltung für nichtganze Teilungszahlen nach Art eines Rate-Multipliers
JPS63131616A (ja) * 1986-11-20 1988-06-03 Mitsubishi Electric Corp プログラマブルクロツク分周器
US4779221A (en) * 1987-01-28 1988-10-18 Megatest Corporation Timing signal generator
US4809221A (en) * 1987-01-28 1989-02-28 Megatest Corporation Timing signal generator
CA1281385C (en) * 1987-02-09 1991-03-12 George William Conner Timing generator
USRE36063E (en) * 1987-02-09 1999-01-26 Teradyne, Inc. Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal
US5274796A (en) * 1987-02-09 1993-12-28 Teradyne, Inc. Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal
US4905004A (en) * 1988-04-11 1990-02-27 University of Texas system The Board of Regents Cycle-portion encoder
US5032982A (en) * 1988-05-18 1991-07-16 Zilog, Inc. Device for timing interrupt acknowledge cycles
US4816774A (en) * 1988-06-03 1989-03-28 Motorola, Inc. Frequency synthesizer with spur compensation
US4918403A (en) * 1988-06-03 1990-04-17 Motorola, Inc. Frequency synthesizer with spur compensation
US5193194A (en) * 1988-10-18 1993-03-09 Motorola, Inc. Concurrent arbitration system and method for bus control
US5185880A (en) * 1989-06-05 1993-02-09 Matsushita Electric Industrial Co., Ltd. Stored instructions executing type timing signal generating system
JP2820462B2 (ja) * 1989-10-31 1998-11-05 日本ヒューレット・パッカード株式会社 データ列発生装置
US5077686A (en) * 1990-01-31 1991-12-31 Stardent Computer Clock generator for a computer system
US6751696B2 (en) 1990-04-18 2004-06-15 Rambus Inc. Memory device having a programmable register
IL96808A (en) 1990-04-18 1996-03-31 Rambus Inc Introductory / Origin Circuit Agreed Using High-Performance Brokerage
US6324120B2 (en) 1990-04-18 2001-11-27 Rambus Inc. Memory device having a variable data output length
US5179672A (en) * 1990-06-19 1993-01-12 International Business Machines Corporation Apparatus and method for modeling parallel processing of instructions using sequential execution hardware
US5261081A (en) * 1990-07-26 1993-11-09 Ncr Corporation Sequence control apparatus for producing output signals in synchronous with a consistent delay from rising or falling edge of clock input signal
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5202642A (en) * 1991-05-09 1993-04-13 Iomega Corporation Apparatus and method for fractional frequency division
US5204911A (en) * 1991-05-29 1993-04-20 Nira Schwartz Inspection method using unique templates and histogram analysis
FR2685581A1 (fr) * 1991-12-23 1993-06-25 Thomson Broadcast Cicruit de generation d'impulsions a frequence variable a partir d'impulsions periodiques.
JP3168673B2 (ja) * 1992-03-13 2001-05-21 松下電器産業株式会社 電気掃除機用吸込具
USRE38482E1 (en) 1992-05-28 2004-03-30 Rambus Inc. Delay stage circuitry for a ring oscillator
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
JP2605300Y2 (ja) * 1993-11-01 2000-07-04 株式会社アドバンテスト 半導体試験装置用周期発生器
US5617563A (en) * 1994-11-04 1997-04-01 Sony Corporation Of Japan Duty cycle independent tunable clock
JP2907033B2 (ja) * 1994-11-24 1999-06-21 横河電機株式会社 タイミング信号発生装置
WO1996028745A2 (en) * 1995-03-16 1996-09-19 Teradyne, Inc. Timing generator with multiple coherent synchronized clocks
US5689690A (en) * 1995-09-25 1997-11-18 Credence Systems Corporation Timing signal generator
US5740410A (en) * 1995-12-15 1998-04-14 Cyrix Corporation Static clock generator
US5727021A (en) * 1996-04-03 1998-03-10 Teradyne, Inc. Apparatus and method for providing a programmable delay with low fixed delay
EP1001533B1 (en) * 1998-11-14 2001-09-26 Agilent Technologies Inc. a Delaware Corporation Timing generator
US6360343B1 (en) 1999-02-26 2002-03-19 Advantest Corp. Delta time event based test system
US6816979B1 (en) 2001-02-01 2004-11-09 Cypress Semiconductor Corp. Configurable fast clock detection logic with programmable resolution
US6710622B1 (en) * 2002-04-12 2004-03-23 National Semiconductor Corp Programmable digital one-shot
US7830729B2 (en) 2007-06-15 2010-11-09 Micron Technology, Inc. Digital filters with memory
US8295182B2 (en) * 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
US7863931B1 (en) * 2007-11-14 2011-01-04 Lattice Semiconductor Corporation Flexible delay cell architecture
WO2009088693A1 (en) * 2007-12-31 2009-07-16 Teradyne, Inc. Timing signal generator providing synchronized timing signals at non-integer clock multiples adjustable by more than one period
KR20120041283A (ko) * 2010-08-25 2012-05-02 주식회사 동부하이텍 제어 데이터 생성 장치
US10056890B2 (en) * 2016-06-24 2018-08-21 Exar Corporation Digital controlled oscillator based clock generator for multi-channel design

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3478325A (en) * 1967-01-16 1969-11-11 Ibm Delay line data transfer apparatus
US3581066A (en) * 1968-03-06 1971-05-25 Lear Siegler Inc Programmable counting circuit
FR2073660A5 (US20100268047A1-20101021-C00003.png) * 1969-12-13 1971-10-01 Tokyo Shibaura Electric Co
DE2406923B2 (de) * 1974-02-14 1976-07-22 Licentia Patent-yerwaltungs-GmbH, 6000 Frankfurt Mit digitalen bauelementen aufgebautes monoflop
US3913021A (en) * 1974-04-29 1975-10-14 Ibm High resolution digitally programmable electronic delay for multi-channel operation
US4063308A (en) * 1975-06-27 1977-12-13 International Business Machines Corporation Automatic clock tuning and measuring system for LSI computers
US4053739A (en) * 1976-08-11 1977-10-11 Motorola, Inc. Dual modulus programmable counter
US4084082A (en) * 1976-10-12 1978-04-11 Fairchild Camera And Instrument Corporation Programmable counter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH034074Y2 (US20100268047A1-20101021-C00003.png) * 1987-12-18 1991-02-01
JPH0224851U (US20100268047A1-20101021-C00003.png) * 1988-07-30 1990-02-19
WO1996032654A1 (fr) * 1995-04-13 1996-10-17 Advantest Corporation Generateur de periodes pour dispositif d'essai de semi-conducteurs

Also Published As

Publication number Publication date
DE2917017C2 (de) 1982-06-24
CA1129504A (en) 1982-08-10
FR2424671A1 (fr) 1979-11-23
US4231104A (en) 1980-10-28
FR2424671B1 (US20100268047A1-20101021-C00003.png) 1982-10-29
DE2917017A1 (de) 1979-10-31
GB2020072A (en) 1979-11-07
GB2020072B (en) 1982-06-09
JPS54142963A (en) 1979-11-07

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