JPS6222539U - - Google Patents

Info

Publication number
JPS6222539U
JPS6222539U JP10307686U JP10307686U JPS6222539U JP S6222539 U JPS6222539 U JP S6222539U JP 10307686 U JP10307686 U JP 10307686U JP 10307686 U JP10307686 U JP 10307686U JP S6222539 U JPS6222539 U JP S6222539U
Authority
JP
Japan
Prior art keywords
scattered light
measurement chamber
light measurement
preamplifier
wall
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10307686U
Other languages
English (en)
Other versions
JPH0348521Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19853524119 external-priority patent/DE3524119A1/de
Priority claimed from DE19853524118 external-priority patent/DE3524118A1/de
Application filed filed Critical
Publication of JPS6222539U publication Critical patent/JPS6222539U/ja
Application granted granted Critical
Publication of JPH0348521Y2 publication Critical patent/JPH0348521Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/151—Gas blown

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【図面の簡単な説明】
第１図は測定チヤンバ及び信号伝送部に分割さ
れた塵埃測定装置の概要図である。第２図は電子
回路部のブロツク回路図である。第３図は信号伝
送部及び測定値ドキユメンテーシヨン装置を有す
る塵埃測定装置の概要図である。第４図ないし第
７図は後に接続されている測定ドキユメンテーシ
ヨン及び調節装置用の電子回路部のブロツク回路
図である。第８図は一つの測定チヤンバの断面図
である。第９図は上方に開いた測定チヤンバの断
面図である。第１０図は較正装置の簡単化された
原理図である。 １…粉塵測定装置、２…電圧―周波数変換器、
３…遠方伝送装置、４…前置増幅器、５…ケーブ
ル、６…主増幅器、７…デイジタル部、８…信号
出力部、９…電圧マツチング部、１０…電源部、
１１…制御入力、１２…データ出力、１３…マイ
クロプロセツサ、１５…散乱光測定チヤンバ、１
６…流入、１７…流出、１８…内壁、１９，２０
…環状間隙ノズル、２２…測定領域、２３…孔付
き板、２５…送光器、２６…受光器、２７…光ト
ラツプ、２９…送光器筒、３０…光導波路、３１
…断続器、３２…受光器筒、３３…ドキユメンテ
ーシヨン装置、３４…限界値発信器、３５…信号
―警報装置、３６…インタフエース、３７…電子
式データ処理装置、３８…状態指示部、３９…多
位置測定装置、４０…調節器、４１…操作端、４
２…制御対象、４３…外乱量、４４…操作量。

Claims (1)

    【実用新案登録請求の範囲】
  1. 信号出力部と清浄空気流により内壁を保護する
    清浄状態保持装置とを有する固定型散乱光測定チ
    ヤンバと、測定値を処理する中央装置とを有し、
    坑内の採鉱およびトンネル工事中に散乱光法によ
    り微細粉塵を測定するための装置に於いて、散乱
    光測定チヤンバ１５が筒状又は半筒状に構成され
    ており、また合致して取付けられており流入１６
    及び流出１７側に対応付けられており内壁１８に
    対して平行に向けられている環状間隙ノズル又は
    孔付き板１９，２０，２３を有し、散乱光測定チ
    ヤンバに対応付けられている送光器筒２９及び受
    光器筒３２が一次光を導く一つの光導波路３０を
    介して機械的断続器３１と接続されており、また
    散乱光測定チヤンバの受光器２６に一つの前置増
    幅器４が対応付けられており、この前置増幅器が
    ケーブル５を介して一つの主増幅器６とマイクロ
    プロセツサ１３を有する一つのデイジタル部７と
    に接続されていることを特徴とする散乱光法によ
    る微細粉塵測定装置。
JP1986103076U 1985-07-05 1986-07-04 Expired JPH0348521Y2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19853524119 DE3524119A1 (de) 1985-07-05 1985-07-05 Stationaeres tyndallometer
DE19853524118 DE3524118A1 (de) 1985-07-05 1985-07-05 Stationaeres tyndallometer fuer unter tage

Publications (2)

Publication Number Publication Date
JPS6222539U true JPS6222539U (ja) 1987-02-10
JPH0348521Y2 JPH0348521Y2 (ja) 1991-10-16

Family

ID=25833761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986103076U Expired JPH0348521Y2 (ja) 1985-07-05 1986-07-04

Country Status (2)

Country Link
EP (1) EP0208646B1 (ja)
JP (1) JPH0348521Y2 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4133452A1 (de) * 1990-10-16 1992-04-23 Volkswagen Ag Vorrichtung zur dynamischen messung der partikeldichte in einer gasstroemung
DE102004018534B4 (de) * 2004-04-14 2006-10-26 Enotec Gmbh, Prozess- Und Umweltmesstechnik Optisches System mit Spülgaszufuhr zum Sichtfenster
DE102004028420B3 (de) 2004-06-04 2006-02-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur optischen Detektion von in Abgasen chemischer Prozesse enthaltenen Stoffen
EP2081010B1 (de) 2008-01-16 2014-03-12 SICK Engineering GmbH Modulare Staubmessung

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199943A (en) * 1981-06-03 1982-12-08 Hitachi Ltd Measuring device for wetness of steam
JPS59155741A (ja) * 1983-02-24 1984-09-04 Mitsubishi Heavy Ind Ltd 粒子検出装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1115477B (de) * 1959-08-12 1961-10-19 Lentia Gmbh Ortsfestes, industrielles Aerosolmessgeraet
DE2051546A1 (de) * 1970-10-21 1972-05-04 Bergwerksverband Gmbh, 4300 Essen Gerät zur Bestimmung von Feinstaubkonzentrationen
DE2260313C2 (de) * 1972-12-09 1982-07-29 Bergwerksverband Gmbh, 4300 Essen Verfahren und Gerät zur Bestimmung von Feinstaubkonzentrationen
FR2272387B1 (ja) * 1974-05-20 1976-10-15 Rech Ind Liants Hy Centre Et
DE3425710A1 (de) * 1984-07-12 1986-01-16 Bergwerksverband Gmbh, 4300 Essen Vorrichtung zur bestimmung der feinstaubkonzentration

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199943A (en) * 1981-06-03 1982-12-08 Hitachi Ltd Measuring device for wetness of steam
JPS59155741A (ja) * 1983-02-24 1984-09-04 Mitsubishi Heavy Ind Ltd 粒子検出装置

Also Published As

Publication number Publication date
JPH0348521Y2 (ja) 1991-10-16
EP0208646B1 (de) 1991-01-23
EP0208646A2 (de) 1987-01-14
EP0208646A3 (en) 1988-01-07

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