JPS6217727Y2 - - Google Patents

Info

Publication number
JPS6217727Y2
JPS6217727Y2 JP13731782U JP13731782U JPS6217727Y2 JP S6217727 Y2 JPS6217727 Y2 JP S6217727Y2 JP 13731782 U JP13731782 U JP 13731782U JP 13731782 U JP13731782 U JP 13731782U JP S6217727 Y2 JPS6217727 Y2 JP S6217727Y2
Authority
JP
Japan
Prior art keywords
output
signal
test
input
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13731782U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5941767U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13731782U priority Critical patent/JPS5941767U/ja
Publication of JPS5941767U publication Critical patent/JPS5941767U/ja
Application granted granted Critical
Publication of JPS6217727Y2 publication Critical patent/JPS6217727Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP13731782U 1982-09-10 1982-09-10 試験信号印加判定回路 Granted JPS5941767U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13731782U JPS5941767U (ja) 1982-09-10 1982-09-10 試験信号印加判定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13731782U JPS5941767U (ja) 1982-09-10 1982-09-10 試験信号印加判定回路

Publications (2)

Publication Number Publication Date
JPS5941767U JPS5941767U (ja) 1984-03-17
JPS6217727Y2 true JPS6217727Y2 (US20070244113A1-20071018-C00087.png) 1987-05-07

Family

ID=30308472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13731782U Granted JPS5941767U (ja) 1982-09-10 1982-09-10 試験信号印加判定回路

Country Status (1)

Country Link
JP (1) JPS5941767U (US20070244113A1-20071018-C00087.png)

Also Published As

Publication number Publication date
JPS5941767U (ja) 1984-03-17

Similar Documents

Publication Publication Date Title
US6028443A (en) Test circuit for semiconductor integrated logic circuit using tristate buffers allowing control circuit for tristate to be tested
JPS6217727Y2 (US20070244113A1-20071018-C00087.png)
JP3918344B2 (ja) 半導体試験装置
JPH10240560A (ja) 波形信号処理装置
JP2919147B2 (ja) 半導体集積回路の試験方法
JPS5923676U (ja) 自己診断機能を持つｉｃ試験装置
JP2633692B2 (ja) 半導体試験方法
US6724182B2 (en) Tester and testing method for differential data drivers
JPH0712940Y2 (ja) Ｉｃ試験装置
JP2527623Y2 (ja) Ｉｃ試験装置
JPS631248Y2 (US20070244113A1-20071018-C00087.png)
JPH07109844B2 (ja) 半導体集積回路
JPH0261717B2 (US20070244113A1-20071018-C00087.png)
JPH0540457Y2 (US20070244113A1-20071018-C00087.png)
JPS6134483A (ja) 集積回路装置
JP2836101B2 (ja) プローバのアタッチメントボード
JPH0593763A (ja) 電子回路装置の試験方法及び装置
JPH02128576U (US20070244113A1-20071018-C00087.png)
JPS59172384U (ja) 論理回路試験装置
JPS6342484A (ja) 集積回路装置
JPS5852579A (ja) 半導体集積回路の試験装置
JPS6417476U (US20070244113A1-20071018-C00087.png)
JPH04359173A (ja) 直流特性試験回路
JPH04137643A (ja) ウェハー試験方法
JPH0465144A (ja) 半導体試験装置