JPS62169457U - - Google Patents
Info
- Publication number
- JPS62169457U JPS62169457U JP5743486U JP5743486U JPS62169457U JP S62169457 U JPS62169457 U JP S62169457U JP 5743486 U JP5743486 U JP 5743486U JP 5743486 U JP5743486 U JP 5743486U JP S62169457 U JPS62169457 U JP S62169457U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- storage
- scanning
- charged particle
- electron microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims description 3
- 239000002245 particle Substances 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5743486U JPS62169457U (cs) | 1986-04-18 | 1986-04-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5743486U JPS62169457U (cs) | 1986-04-18 | 1986-04-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62169457U true JPS62169457U (cs) | 1987-10-27 |
Family
ID=30887130
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5743486U Pending JPS62169457U (cs) | 1986-04-18 | 1986-04-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62169457U (cs) |
-
1986
- 1986-04-18 JP JP5743486U patent/JPS62169457U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS62169457U (cs) | ||
| JPH0163063U (cs) | ||
| JPS62169458U (cs) | ||
| GB1421026A (en) | Material and process for the storage of information and a process for the reproduction of the information | |
| JPS61151333U (cs) | ||
| JPS6277856U (cs) | ||
| JPS6188656U (cs) | ||
| JPS5814667U (ja) | 荷電粒子線装置 | |
| JPS58109148U (ja) | 試料視野選択装置 | |
| JPH0166747U (cs) | ||
| JPS55126953A (en) | Scanning electron microscope | |
| JPS6176677U (cs) | ||
| JPS6119774U (ja) | 走査電子顕微鏡を用いた電位測定装置 | |
| GB719078A (en) | Improvements in and relating to apparatus for the electrical storage of digital information | |
| JPH0424252U (cs) | ||
| JPS58144753U (ja) | 走査電子顕微鏡 | |
| JPS5252562A (en) | Electron beam scanning type sample image pick-up device | |
| JPS61194951U (cs) | ||
| JPS61101955U (cs) | ||
| JPH0210670U (cs) | ||
| JPH0181857U (cs) | ||
| JPS6284155U (cs) | ||
| JPS60150761U (ja) | 電子管のカソ−ド取付け構造 | |
| JPS6130956U (ja) | 反射式電子回折用電子線照射装置 | |
| JPS5891851U (ja) | 走査型反射電子回折顕微装置 |